Personal information

Websites & social links

NIST Homepage

Countries

United States

Activities

Collapse all

Employment (3)

National Institute of Standards and Technology: Boulder, CO, US

2018-09-16 to present | Materials Data Scientist (Office of Data and Informatics)
Employment
Source: Self-asserted source
Joshua A. Taillon

National Institute of Standards and Technology: Gaithersburg, MD, US

2016-10-03 to 2018-09-15 | NRC Postdoctoral Research Fellow (Materials Measurement Science Division)
Employment
Source: Self-asserted source
Joshua A. Taillon

University of Maryland: College Park, MD, US

2011-07-15 to 2016-08-16 | Graduate Research Fellow
Employment
Source: Self-asserted source
Joshua A. Taillon

Education and qualifications (3)

University of Maryland: College Park, MD, US

2011-07-16 to 2016-07-08 | Ph.D. (Materials Science and Engineering)
Education
Source: Self-asserted source
Joshua A. Taillon

University of Maryland: College Park, MD, US

2011-07-15 to 2014-05 | M.S. (Materials Science and Engineering)
Education
Source: Self-asserted source
Joshua A. Taillon

Cornell University: Ithaca, NY, US

2007-08 to 2011-05 | B.S. (Materials Science and Engineering)
Education
Source: Self-asserted source
Joshua A. Taillon

Funding (1)

NSF Graduate Research Fellowship

Award
National Science Foundation (VA, US)
Source: Self-asserted source
Joshua A. Taillon

Works (17)

A Roadmap for LIMS at NIST Material Measurement Laboratory

2022 | Report
DOI: 10.6028/NIST.TN.2216
Contributors: Gretchen Greene; Jared Ragland; Zachary Trautt; June W. Lau; Raymond Plante; Joshua Taillon; Adam Abel Creuziger; Chandler A. Becker; Joe Bennett; Niksa Blonder et al.
Source: check_circle
Crossref

NexusLIMS: A Laboratory Information Management System for Shared-Use Electron Microscopy Facilities

Microscopy and Microanalysis
2021-06-28 | Journal article
DOI: 10.1017/S1431927621000222
Contributors: Joshua A. Taillon; Thomas F. Bina; Raymond L. Plante; Marcus W. Newrock; Gretchen R. Greene; June W. Lau
Source: check_circle
Crossref

Characterization of Zinc Carboxylates in an Oil Paint Test Panel

Studies in Conservation
2020-01-02 | Journal article
DOI: 10.1080/00393630.2019.1666467
Contributors: Christine Romano; Thomas Lam; G. Asher Newsome; Joshua A. Taillon; Nicole Little; Jia-sun Tsang
Source: check_circle
Crossref

Analysis of the electronic and chemical structure in boron and phosphorus passivated 4H-SiC/SiO2 interfaces using HRTEM and STEM-EELS

Applied Physics Letters
2018-11-05 | Journal article
DOI: 10.1063/1.5053595
Contributors: Joshua A. Taillon; Christopher J. Klingshirn; Chunkun Jiao; Yongju Zheng; Sarit Dhar; Tsvetanka S. Zheleva; Aivars J. Lelis; Lourdes G. Salamanca-Riba
Source: check_circle
Crossref

Teaching an Old Material New Tricks: Easy and Inexpensive Focused Ion Beam (FIB) Sample Protection Using Conductive Polymers

Microscopy and Microanalysis
2017-08-09 | Journal article
DOI: 10.1017/S143192761700054X
Contributors: Joshua A. Taillon; Valery Ray; Lourdes G. Salamanca-Riba
Source: check_circle
Crossref

Nanoparticles: Near-Field Optical Properties of Fully Alloyed Noble Metal Nanoparticles (Advanced Optical Materials 1/2017)

Advanced Optical Materials
2017-01 | Journal article
DOI: 10.1002/adom.201770001
Contributors: Chen Gong; Mariama Rebello Sousa Dias; Garrett C. Wessler; Joshua A. Taillon; Lourdes G. Salamanca-Riba; Marina S. Leite
Source: Self-asserted source
Joshua A. Taillon via Crossref Metadata Search

Long-Term Cr Poisoning Effect on LSCF-GDC Composite Cathodes Sintered at Different Temperatures

Journal of The Electrochemical Society
2016 | Journal article
DOI: 10.1149/2.0841609jes
Contributors: Chunyan Xiong; Joshua A. Taillon; Christopher Pellegrinelli; Yi-Lin Huang; Lourdes G. Salamanca-Riba; Bo Chi; Li Jian; Jian Pu; Eric D. Wachsman
Source: Self-asserted source
Joshua A. Taillon via Crossref Metadata Search

Boron-doped few-walled carbon nanotubes: novel synthesis and properties

Nanotechnology
2016-09 | Journal article
DOI: 10.1088/0957-4484/27/44/445601
Contributors: Colin Preston; Da Song; Josh Taillon; John Cumings; Liangbing Hu
Source: Self-asserted source
Joshua A. Taillon via Crossref Metadata Search

Near-Field Optical Properties of Fully Alloyed Noble Metal Nanoparticles

Advanced Optical Materials
2016-09 | Journal article
DOI: 10.1002/adom.201600568
Contributors: Chen Gong; Mariama Rebello Sousa Dias; Garrett C. Wessler; Joshua A. Taillon; Lourdes G. Salamanca-Riba; Marina S. Leite
Source: Self-asserted source
Joshua A. Taillon via Crossref Metadata Search

Characterization of the Oxide-Semiconductor Interface in 4H-SiC/SiO2 Structures using TEM and XPS

Microscopy and Microanalysis
2015-08 | Journal article
DOI: 10.1017/s1431927615008466
Contributors: Joshua Taillon; Karen Gaskell; Gang Liu; Leonard Feldman; Sarit Dahr; Tsvetanka Zheleva; Aivars Lelis; Lourdes Salamanca-Riba
Source: Self-asserted source
Joshua A. Taillon via Crossref Metadata Search

Three Dimensional Microstructural Characterization of Cathode Degradation in SOFCs Using FIB/SEM and TEM

Microscopy and Microanalysis
2015-08 | Journal article
DOI: 10.1017/s1431927615011587
Contributors: Joshua Taillon; Christopher Pellegrinelli; Yilin Huang; Eric Wachsman; Lourdes Salamanca-Riba
Source: Self-asserted source
Joshua A. Taillon via Crossref Metadata Search

Investigating the Relationship between Operating Conditions and SOFC Cathode Degradation

ECS Transactions
2015-07 | Journal article
DOI: 10.1149/06801.0773ecst
Contributors: C. Pellegrinelli; Y.-L. Huang; J. A. Taillon; L. G. Salamanca-Riba; E. D. Wachsman
Source: Self-asserted source
Joshua A. Taillon via Crossref Metadata Search

A Study of SOFC Cathode Degradation in H2O Environments

ECS Transactions
2014-08 | Journal article
DOI: 10.1149/06402.0017ecst
Contributors: C. Pellegrinelli; Y.-L. Huang; J. A. Taillon; L. G. Salamanca-Riba; E. D. Wachsman
Source: Self-asserted source
Joshua A. Taillon via Crossref Metadata Search

(Invited) Towards a Fundamental Understanding of the Cathode Degradation Mechanisms

ECS Transactions
2014-03 | Journal article
DOI: 10.1149/06101.0047ecst
Contributors: E. D. Wachsman; Y.-L. Huang; C. Pellegrinelli; J. A. Taillon; L. G. Salamanca-Riba
Source: Self-asserted source
Joshua A. Taillon via Crossref Metadata Search

Three Dimensional Microstructural Characterization of Cathode Degradation in SOFCs Using Focused Ion Beam and SEM

ECS Transactions
2014-03 | Journal article
DOI: 10.1149/06101.0109ecst
Contributors: J. A. Taillon; C. Pellegrinelli; Y. Huang; E. D. Wachsman; L. G. Salamanca-Riba
Source: Self-asserted source
Joshua A. Taillon via Crossref Metadata Search

Systematic structural and chemical characterization of the transition layer at the interface of NO-annealed 4H-SiC/SiO2 metal-oxide-semiconductor field-effect transistors

Journal of Applied Physics
2013-01 | Journal article
DOI: 10.1063/1.4789924
Contributors: Joshua A. Taillon; Joon Hyuk Yang; Claude A. Ahyi; John Rozen; John R. Williams; Leonard C. Feldman; Tsvetanka S. Zheleva; Aivars J. Lelis; Lourdes G. Salamanca-Riba
Source: Self-asserted source
Joshua A. Taillon via Crossref Metadata Search

Ab Initio Discovery of Novel Crystal Structure Stability in Barium and Sodium-Calcium Compounds under Pressure using DFT

arXiv preprint arXiv:1207.3320
2012 | Journal article
Source: Self-asserted source
Joshua A. Taillon
How many people are using ORCID?