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Works (26)

PMT Waveform Timing Analysis Using Machine Learning Method

IEEE Transactions on Nuclear Science
2023 | Journal article
DOI: 10.1109/TNS.2023.3242650
WOSUID: WOS:001012981300045
Contributors: Wu, Qi; Ma, Lishuang; Peng, Shuo; Qian, Sen; Wang, Zhigang; Chen, Lingyue; Song, Ruiqiang; Zhu, Yao
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Machine Learning-Based Soft-Error-Rate Evaluation for Large-Scale Integrated Circuits

Electronics
2023-12 | Journal article | Author
DOI: 10.3390/electronics12244978
Contributors: Ruiqiang Song; Jinjin Shao; Yaqing Chi; Bin Liang; Jianjun Chen; Zhenyu
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Multidisciplinary Digital Publishing Institute

Experimental investigation of SEUs Induced by Heavy Ions in 28-nm FDSOI SRAMs

European Conference on Radiation and Its Effects on Components and Systems (RADECS)
2022 | Conference paper
DOI: 10.1109/RADECS47380.2019.9745645
WOSUID: WOS:000848160100029
Contributors: Xu, Jingyan; Guo, Yang; Song, Ruiqiang; Chi, Yaqing; Liang, Bin; Hu, Chunmei; Qu, Wanxia
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TAISAM: A Transistor Array-Based Test Method for Characterizing Heavy Ion-Induced Sensitive Areas in Semiconductor Materials

Electronics
2022-06 | Journal article | Author
DOI: 10.3390/electronics11132043
Contributors: Jinjin Shao; Ruiqiang Song; Yaqing Chi; Bin Liang; Zhenyu
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Multidisciplinary Digital Publishing Institute
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Optimization of a double crystal monochromator

Journal of the Korean Physical Society
2021 | Journal article
DOI: 10.1007/S40042-021-00294-W
WOSUID: WOS:000698584900004
Contributors: Jiang, Zheng; Wang, Eryan; Song, Ruiqiang; Guo, Siming; Wu, Jinjie; Hou, Dongjie; An, Zhenghua; Zhou, Pengyue
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MSIFF: A radiation-hardened flip-flop via interleaving master-slave stage layout topology

IEICE Electronics Express
2020 | Journal article
DOI: 10.1587/ELEX.17.20190708
WOSUID: WOS:000519592600001
Contributors: Song, Ruiqiang; Shao, Jinjin; Liang, Bin; Chi, Yaqing; Chen, Jianjun
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A Single-Event Upset Evaluation Approach Using Ion-Induced Sensitive Area

IEEE International Conference on ASIC (ASICON)
2019 | Conference paper
WOSUID: WOS:000541465700051
Contributors: Song, Ruiqiang; Shao, Jinjin; Liang, Bin; Chi, Yaqing; Chen, Jianjun
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Characterization of P-hit and N-hit single-event transient using heavy ion microbeam

IEICE Electronics Express
2019 | Journal article
DOI: 10.1587/ELEX.16.20190141
WOSUID: WOS:000467391800011
Contributors: Song, Ruiqiang; Shao, Jinjin; Liang, Bin; Chi, Yaqing; Chen, Jianjun
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Circuit-Level Soft Error Rate Evaluation Approach Considering Single-Event Multiple Transient

IEEE International Conference on ASIC (ASICON)
2019 | Conference paper
DOI: 10.1109/ASICON47005.2019.8983536
WOSUID: WOS:000541465700110
Contributors: Zhang, Xiaoyu; Liang, Bin; Song, Ruiqiang
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Reasearch on performance of hard X-ray calibration device in low energy section

Proceedings of Ieee International Conference on Electronic Measurement & Instruments (icemi)
2019 | Journal article
WOSUID: WOS:000584334300231
Contributors: Song Ruiqiang; Wu Jinjie; Lai Wanchang; Guo Siming; Zhou Pengyue
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Supply Voltage and Temperature Dependence of Single-Event Transient in 28-nm FDSOI MOSFETs

Symmetry
2019 | Journal article
DOI: 10.3390/SYM11060793
WOSUID: WOS:000475703000068
Contributors: Xu, Jingyan; Guo, Yang; Song, Ruiqiang; Liang, Bin; Chi, Yaqing
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Analysis of single-event transient sensitivity in fully depleted silicon-on-insulator MOSFETs

Nuclear Science and Techniques
2018 | Journal article
DOI: 10.1007/S41365-018-0391-3
WOSUID: WOS:000429382600004
Contributors: Xu, Jing-Yan; Chen, Shu-Ming; Song, Rui-Qiang; Wu, Zhen-Yu; Chen, Jian-Jun
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Characterization of Single-Event Transient Pulse Broadening Effect in 65 nm Bulk Inverter Chains Using Heavy Ion Microbeam

IEEE Transactions on Nuclear Science
2017 | Journal article
DOI: 10.1109/TNS.2016.2636871
WOSUID: WOS:000396404500018
Contributors: Chi, Yaqing; Song, Ruiqiang; Shi, Shuting; Liu, Biwei; Cai, Li; Hu, Chunmei; Guo, Gang
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Comparison of single-event upset generated by heavy ion and pulsed laser

Science China Information Sciences
2017 | Journal article
DOI: 10.1007/S11432-016-0346-1
WOSUID: WOS:000408082600001
Contributors: Liang, Bin; Song, Ruiqiang; Han, Jianwei; Chi, Yaqing; Chen, Rui; Hu, Chunmei; Chen, Jianjun; Ma, Yingqi; Shangguan, Shipeng
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Experimental characterization of the dominant multiple nodes charge collection mechanism in metal oxide-semiconductor transistors

Applied Physics Letters
2017 | Journal article
DOI: 10.1063/1.4985438
WOSUID: WOS:000403347700016
Contributors: Song, Ruiqiang; Chen, Shuming; Chi, Yaqing; Wu, Zhenyu; Liang, Bin; Chen, Jianjun; Xu, Jingyan; Hao, Peipei; Yu, Junting
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Modeling the impact of process and operation variations on the soft error rate of digital circuits

Science China Information Sciences
2017 | Journal article
DOI: 10.1007/S11432-016-9001-9
WOSUID: WOS:000405778300010
Contributors: Song, Ruiqiang; Chen, Shuming; Liang, Bin; Chi, Yaqing; Chen, Jianjun
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Recoil-Ion-Induced Single Event Upsets in Nanometer CMOS SRAM Under Low-Energy Proton Radiation

IEEE Transactions on Nuclear Science
2017 | Journal article
DOI: 10.1109/TNS.2016.2633405
WOSUID: WOS:000396814100004
Contributors: Wu, Zhenyu; Chen, Shuming; Yu, Junting; Chen, Jianjun; Huang, Pengcheng; Song, Ruiqiang
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The Separation Measurement of P-Hit and N-Hit Charge Sharing With an "S-Like" Inverter Chains Test Structure

IEEE Transactions on Nuclear Science
2017 | Journal article
DOI: 10.1109/TNS.2017.2677904
WOSUID: WOS:000399748600003
Contributors: Huang, Pengcheng; Chen, Shuming; Chen, Jianjun; Liang, Bin; Song, Ruiqiang
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Comparison of Radiation-Induced Charge Sharing Generated by Heavy Ion and Pulsed Laser

European Conference on Radiation and Its Effects on Components and Systems (RADECS)
2016 | Conference paper
DOI: 10.1109/RADECS.2016.8093187
WOSUID: WOS:000450759400091
Contributors: Song Ruiqiang; Chen Shuming; Han Jianwei; Chi Yaqing; Chen Rui; Liang Bin; Huang Pengcheng; Ma Yingqi; Shangguan Shipeng
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Effect of supply voltage and body-biasing on single-event transient pulse quenching in bulk fin field-effect-transistor process

Chinese Physics B
2016 | Journal article
DOI: 10.1088/1674-1056/25/4/049401
WOSUID: WOS:000375662600078
Contributors: Yu, Jun-Ting; Chen, Shu-Ming; Chen, Jian-Jun; Huang, Peng-Cheng; Song, Rui-Qiang
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Flip-flops soft error rate evaluation approach considering internal single-event transient

Science China Information Sciences
2015 | Journal article
DOI: 10.1007/S11432-014-5260-Z
WOSUID: WOS:000356404200013
Contributors: Song RuiQiang; Chen ShuMing; He YiBai; Du YanKang
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PABAM: A Physics-Based Analytical Model to Estimate Bipolar Amplification Effect Induced Collected Charge at Circuit Level

IEEE Transactions on Device and Materials Reliability
2015 | Journal article
DOI: 10.1109/TDMR.2015.2490259
WOSUID: WOS:000366662500017
Contributors: Song Ruiqiang; Chen Shuming; Du Yankang; Huang Pengcheng; Chen Jianjun; Chi Yaqing
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Single event transient propagation in dynamic complementary metal oxide semiconductor cascade circuits

IEICE Electronics Express
2015 | Journal article
DOI: 10.1587/ELEX.12.20150849
WOSUID: WOS:000367807400006
Contributors: Xu, Jingyan; Chen, Shuming; Huang, Pengcheng; Hao, Peipei; Song, Ruiqiang; Hu, Chunmei
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Analyzing and mitigating the internal single-event transient in radiation hardened flip-flops at circuit-level

Science China Technological Sciences
2014 | Journal article
DOI: 10.1007/S11431-014-5595-0
WOSUID: WOS:000341631200018
Contributors: Liang Bin; Song RuiQiang
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Total Ionizing Dose Effect on Low On/Off Switching Ratio TiO2 Memristive Memories

IEEE Transactions on Nuclear Science
2014 | Journal article
DOI: 10.1109/TNS.2014.2318298
WOSUID: WOS:000343928100055
Contributors: Chi, Yaqing; Liu, Rongrong; Tang, Zhensen; Song, Ruiqiang
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Total Ionizing Dose Effect on Low On/Off Switching Ratio TiO2 Memristive Memories

European Conference on Radiation and Its Effects on Components and Systems (RADECS)
2013 | Conference paper
WOSUID: WOS:000349119800007
Contributors: Chi Yaqing; Liu Rongrong; Tang Zhensen; Song Ruiqiang
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Peer review (4 reviews for 1 publication/grant)

Review activity for IEEE transactions on reliability. (4)
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