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Apple (Germany): Munich, DE

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Matthias Eberlein

Works (7)

Time-Controlled and FinFET Compatible Sub-Bandgap References Using Bulk-Diodes

IEEE Transactions on Circuits and Systems II: Express Briefs
2019-10 | Journal article
Contributors: M. Eberlein; H. Pretl; Z. Georgiev
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A No-Trim, Scaling-Friendly Thermal Sensor in 16nm FinFET Using Bulk Diodes as Sensing Elements

IEEE Solid-State Circuits Letters
2019-09 | Journal article
Contributors: M. Eberlein; H. Pretl
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A 40nW, Sub-IV Truly ‘Digital’ Reverse Bandgap Reference Using Bulk-Diodes in 16nm FinFET

2018 IEEE Asian Solid-State Circuits Conference (A-SSCC)
2018-11 | Other
Contributors: Matthias Eberlein; Georgios Panagopoulos; Harald Pretl
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An 8b subthreshold hybrid thermal sensor with ±1.07°C inaccuracy and single-element remote-sensing technique in 22nm FinFET

2018 IEEE International Solid - State Circuits Conference - (ISSCC)
2018-02 | Other
Contributors: Cho-Ying Lu; Surej Ravikumar; Amruta D. Sali; Matthias Eberlein; Hyung-Jin Lee
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A 28nm CMOS ultra-compact thermal sensor in current-mode technique

2016 IEEE Symposium on VLSI Circuits (VLSI-Circuits)
2016-06 | Other
Contributors: Matthias Eberlein; Idan Yahav
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A technology compensated current reference in standard CMOS

2007 7th International Conference on ASIC
2007-10 | Other
Contributors: Matthias Eberlein
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Matthias Eberlein via Crossref Metadata Search

An integrated channel noise-based true random number generator

2007 7th International Conference on ASIC
2007-10 | Other
Contributors: Matthias Eberlein; Rosnany Abu Bakar
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Matthias Eberlein via Crossref Metadata Search