Personal information
Activities
Works (22)
Journal of Laser Applications
2025-02-01
|
Journal article
Contributors:
Michael Jarwitz;
Andreas Michalowski
Source:
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Crossref
Lasers in Manufacturing and Materials Processing
2025-02-01
|
Journal article
Contributors:
David Traunecker;
Michael Jarwitz;
Andreas Michalowski
Source:
check_circle
Crossref
Procedia CIRP
2024
|
Conference paper
EID:
2-s2.0-85204337933
Contributors:
Jarwitz, M.;
Michalowski, A.
Source:
Michael Jarwitz
via
Scopus - Elsevier
Procedia CIRP
2024
|
Journal article
Contributors:
David Traunecker;
Michael Jarwitz;
Andreas Michalowski
Source:
Michael Jarwitz
via
Crossref Metadata Search
Procedia CIRP
2024
|
Conference paper
EID:
2-s2.0-85204338626
Contributors:
Kramer, S.;
Jarwitz, M.;
Schulze, V.;
Zanger, F.
Source:
Michael Jarwitz
via
Scopus - Elsevier
Lasers in Manufacturing Conference 2023
2023-09-28
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Conference paper
Contributors:
Michael Jarwitz
Source:
Michael Jarwitz
Procedia CIRP
2022
|
Journal article
Contributors:
Michael Jarwitz
Source:
Michael Jarwitz
grade
Preferred source
(of
2)
Procedia CIRP
2022
|
Journal article
Contributors:
Michael Jarwitz
Source:
Michael Jarwitz
grade
Preferred source
(of
2)
2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA)
2022-09-06
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Conference paper
Contributors:
Michael Jarwitz;
Christian Von Arnim;
Gernot Gessner;
Michael Jarwitz;
Armin Lechler;
Oliver Riedel
Source:
Michael Jarwitz
grade
Preferred source
(of
2)
Lasers in Manufacturing Conference 2019
2019
|
Conference paper
Source:
Michael Jarwitz
Metals
2018
|
Journal article
EID:
2-s2.0-85049740884
Contributors:
Jarwitz, M.;
Fetzer, F.;
Weber, R.;
Graf, T.
Source:
Michael Jarwitz
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Source:
Michael Jarwitz
grade
Preferred source
(of
2)
The Micro-World Observed by Ultra High-Speed Cameras: We See What You Don't See
2017
|
Book chapter
EID:
2-s2.0-85035006965
Contributors:
Freitag, C.;
Arnold, T.;
Boley, M.;
Faas, S.;
Fetzer, F.;
Hagenlocher, C.;
Heider, A.;
Jarwitz, M.;
Weber, R.;
Graf, T.
Source:
Michael Jarwitz
via
Scopus - Elsevier
International Congress on Applications of Lasers & Electro-Optics
2017
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Other
Contributors:
Michael Jarwitz;
Florian Fetzer;
Rudolf Weber;
Thomas Graf
Source:
Michael Jarwitz
via
Crossref Metadata Search
Proceedings of SPIE - The International Society for Optical Engineering
2016
|
Conference paper
EID:
2-s2.0-84974695690
Contributors:
Stritt, P.;
Boley, M.;
Heider, A.;
Fetzer, F.;
Jarwitz, M.;
Weller, D.;
Weber, R.;
Berger, P.;
Graf, T.
Source:
Michael Jarwitz
via
Scopus - Elsevier
Physics Procedia
2016
|
Conference paper
EID:
2-s2.0-84993995149
Contributors:
Fetzer, F.;
Jarwitz, M.;
Stritt, P.;
Weber, R.;
Graf, T.
Source:
Michael Jarwitz
via
Scopus - Elsevier
grade
Preferred source
(of
2)
International Congress on Applications of Lasers & Electro-Optics
2016
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Other
Contributors:
Michael Jarwitz;
Jens B. M. Johannsen;
Peter Stritt;
Rudolf Weber
Source:
Michael Jarwitz
via
Crossref Metadata Search
International Congress on Applications of Lasers & Electro-Optics
2014
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Other
Contributors:
Michael Jarwitz;
Peter Stritt;
Rudolf Weber;
Thomas Graf
Source:
Michael Jarwitz
via
Crossref Metadata Search
International Congress on Applications of Lasers & Electro-Optics
2013
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Other
Contributors:
Michael Jarwitz;
Rudolf Weber;
Thomas Graf
Source:
Michael Jarwitz
via
Crossref Metadata Search
Physics Procedia
2013
|
Conference paper
EID:
2-s2.0-84900474010
Contributors:
Jarwitz, M.;
Onuseit, V.;
Weber, R.;
Graf, T.
Source:
Michael Jarwitz
via
Scopus - Elsevier
grade
Preferred source
(of
2)
ICALEO 2012 - 31st International Congress on Applications of Lasers and Electro-Optics
2012
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Conference paper
EID:
2-s2.0-84893124765
Contributors:
Rominger, V.;
Harrer, T.;
Kebler, S.;
Braun, H.;
Dorsch, F.;
Abt, F.;
Jarwitz, M.;
Heider, A.;
Weber, R.;
Graf, T.
Source:
Michael Jarwitz
via
Scopus - Elsevier
30th International Congress on Applications of Lasers and Electro-Optics, ICALEO 2011
2011
|
Conference paper
EID:
2-s2.0-82655179875
Contributors:
Onuseit, V.;
Jarwitz, M.;
Weber, R.;
Graf, T.
Source:
Michael Jarwitz
via
Scopus - Elsevier
grade
Preferred source
(of
2)