Personal information

Activities

Works (8)

A Prufer-Sequence Based Representation of Large Graphs for Structural Encoding of Logic Networks

arXiv
2022 | Other
EID:

2-s2.0-85137819464

Part of ISSN: 23318422
Contributors: Pradhan, M.; Bhattacharya, B.B.
Source: Self-asserted source
manjari via Scopus - Elsevier

A survey of digital circuit testing in the light of machine learning

Wiley Interdisciplinary Reviews: Data Mining and Knowledge Discovery
2021 | Journal article
EID:

2-s2.0-85082423424

Part of ISSN: 19424795 19424787
Contributors: Pradhan, M.; Bhattacharya, B.B.
Source: Self-asserted source
manjari via Scopus - Elsevier

A prufer-sequence based representation of large graphs for structural encoding of logic networks

ACM International Conference Proceeding Series
2019 | Conference paper
EID:

2-s2.0-85061157534

Part of ISBN: 9781450362078
Contributors: Pradhan, M.; Bhattacharya, B.B.
Source: Self-asserted source
manjari via Scopus - Elsevier

Fault Coverage of a Test Set on Structure-Preserving Siblings of a Circuit-Under-Test

Proceedings of the Asian Test Symposium
2019 | Conference paper
EID:

2-s2.0-85078349789

Part of ISBN: 9781728126951
Part of ISSN: 10817735
Contributors: Mondal, M.N.; Chowdhury, A.B.; Pradhan, M.; Sur-Kolay, S.; Bhattacharya, B.B.
Source: Self-asserted source
manjari via Scopus - Elsevier

Predicting X-Sensitivity of Circuit-Inputs on Test-Coverage: A Machine-Learning Approach

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
2019 | Journal article
EID:

2-s2.0-85055685053

Part of ISSN: 19374151 02780070
Contributors: Pradhan, M.; Bhattacharya, B.B.; Chakrabarty, K.; Bhattacharya, B.B.
Source: Self-asserted source
manjari via Scopus - Elsevier

COMEDI: Combinatorial Election of Diagnostic Vectors From Detection Test Sets for Logic Circuits

IEEE Transactions on Very Large Scale Integration (VLSI) Systems
2017 | Journal article
EID:

2-s2.0-85009874617

Part of ISSN: 10638210
Contributors: Pradhan, M.; Bhattacharya, B.B.
Source: Self-asserted source
manjari via Scopus - Elsevier

Optimizing test time for core-based 3-d integrated circuits by a technique of bi-partitioning

Proceedings of IEEE East-West Design and Test Symposium, EWDTS 2014
2014 | Conference paper
EID:

2-s2.0-84946686528

Part of ISBN: 9781479976300
Contributors: Pradhan, M.; Das, D.K.; Giri, C.; Rahaman, H.
Source: Self-asserted source
manjari via Scopus - Elsevier

Optimal stacking of SOCs in a 3D-SIC for post-bond testing

2013 IEEE International 3D Systems Integration Conference, 3DIC 2013
2013 | Conference paper
EID:

2-s2.0-84893977049

Part of ISBN: 9781467364843
Contributors: Pradhan, M.; Giri, C.; Rahaman, H.; Das, D.K.
Source: Self-asserted source
manjari via Scopus - Elsevier