Personal information

Activities

Employment (2)

Deutsches Elektronen-Synchrotron DESY: Hamburg, DE

2018-12 to 2022-12 | PhD student (Photon Science)
Employment
Source: Self-asserted source
Nikolay Ivanov

A.V. Shubnikov Institute of Crystallography: Moscow, RU

2014-12-01 to 2016-11-30 | engineer (Reflectometry and small-angle scattering laboratory)
Employment
Source: Self-asserted source
Nikolay Ivanov

Education and qualifications (2)

Moskovskij gosudarstvennyj universitet imeni M V Lomonosova: Moskva, Moskovskaa oblast', RU

2016-09-01 to 2018-07-31 | Master (Physics)
Education
Source: Self-asserted source
Nikolay Ivanov

Moskovskij gosudarstvennyj universitet imeni M V Lomonosova: Moskva, Moskovskaa oblast', RU

2012-09-01 to 2016-07-31 | Bachelor (Physics)
Education
Source: Self-asserted source
Nikolay Ivanov

Works (7)

Convergent-beam attosecond x-ray crystallography

Structural Dynamics
2025-01-01 | Journal article
Contributors: Henry N. Chapman; Chufeng Li; Saša Bajt; Mansi Butola; J. Lukas Dresselhaus; Dmitry Egorov; Holger Fleckenstein; Nikolay Ivanov; Antonia Kiene; Bjarne Klopprogge et al.
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Crossref

Fast and efficient hard X-ray projection imaging below 10 nm resolution

Optics Express
2024-08-12 | Journal article
Contributors: Wenhui Zhang; J. Lukas Dresselhaus; Holger Fleckenstein; Mauro Prasciolu; Margarita Zakharova; Nikolay Ivanov; Chufeng Li; Oleksandr Yefanov; Tang Li; Dmitry Egorov et al.
Source: check_circle
Crossref

X-ray focusing below 3 nm with aberration-corrected multilayer Laue lenses

Optics Express
2024-04-22 | Journal article
Contributors: J. Lukas Dresselhaus; Margarita Zakharova; Nikolay Ivanov; Holger Fleckenstein; Mauro Prasciolu; Oleksandr Yefanov; Chufeng Li; Wenhui Zhang; Philipp Middendorf; Dmitry Egorov et al.
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Crossref

Hard X-ray projection imaging below 5 nm resolution

2024-04-02 | Preprint
Contributors: Wenhui Zhang; Jan Lukas Dresselhaus; Holger Fleckenstein; Mauro Prasciolu; Margarita Zakharova; Nikolay Ivanov; Chufeng Li; Oleksandr Yefanov; Tang Li; Dmitry Egorov et al.
Source: check_circle
Crossref

Dose-efficient scanning Compton X-ray microscopy

Light: Science & Applications
2023-05-30 | Journal article
Contributors: Tang Li; J. Lukas Dresselhaus; Nikolay Ivanov; Mauro Prasciolu; Holger Fleckenstein; Oleksandr Yefanov; Wenhui Zhang; David Pennicard; Ann-Christin Dippel; Olof Gutowski et al.
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Crossref

Robust ptychographic X-ray speckle tracking with multilayer Laue lenses

Optics Express
2022-07-04 | Journal article
Contributors: Nikolay Ivanov; J. Lukas Dresselhaus; Jerome Carnis; Martin Domaracky; Holger Fleckenstein; Chufeng Li; Tang Li; Mauro Prasciolu; Oleksandr Yefanov; Wenhui Zhang et al.
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Crossref

Precise wavefront characterization of x-ray optical elements using a laboratory source

Review of Scientific Instruments
2022-07-01 | Journal article
Contributors: J. Lukas Dresselhaus; Holger Fleckenstein; Martin Domaracký; Mauro Prasciolu; Nikolay Ivanov; Jerome Carnis; Kevin T. Murray; Andrew J. Morgan; Henry N. Chapman; Saša Bajt
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Crossref