Personal information
Activities
Works (28)
IEEE Transactions on Electron Devices
2024
|
Journal article
Contributors:
Mehak Ashraf Mir;
Vipin Joshi;
Rajarshi Roy Chaudhuri;
Mohammad Ateeb Munshi;
Rasik Rashid Malik;
Mayank Shrivastava
Source:
check_circle
Crossref
IEEE Transactions on Electron Devices
2024
|
Journal article
Contributors:
Rajarshi Roy Chaudhuri;
Vipin Joshi;
Rasik Rashid Malik;
Mayank Shrivastava
Source:
check_circle
Crossref
IEEE Transactions on Electron Devices
2024-11
|
Journal article
Contributors:
Mohammad Ateeb Munshi;
Mehak Ashraf Mir;
Vipin Joshi;
Rajarshi Roy Chaudhuri;
Rasik Malik;
Mayank Shrivastava
Source:
check_circle
Crossref
IEEE Transactions on Electron Devices
2023
|
Journal article
Contributors:
Vipin Joshi;
Rajarshi Roy Chaudhuri;
Sayak Dutta Gupta;
Mayank Shrivastava
Source:
check_circle
Crossref
IEEE Transactions on Electron Devices
2023
|
Journal article
Contributors:
Vipin Joshi;
Rajarshi Roy Chaudhuri;
Sayak Dutta Gupta;
Mayank Shrivastava
Source:
check_circle
Crossref
IEEE Transactions on Electron Devices
2023
|
Journal article
Contributors:
Rasik Rashid Malik;
Vipin Joshi;
Rajarshi Roy Chaudhuri;
Sayak Dutta Gupta;
Mayank Shrivastava
Source:
check_circle
Crossref
IEEE Transactions on Electron Devices
2023-12
|
Journal article
Contributors:
Rajarshi Roy Chaudhuri;
Amratansh Gupta;
Vipin Joshi;
Rasik Rashid Malik;
Sayak Dutta Gupta;
Mayank Shrivastava
Source:
check_circle
Crossref
IEEE Transactions on Electron Devices
2023-12
|
Journal article
Contributors:
Rajarshi Roy Chaudhuri;
Amratansh Gupta;
Vipin Joshi;
Rasik Rashid Malik;
Sayak Dutta Gupta;
Mayank Shrivastava
Source:
check_circle
Crossref
IEEE Transactions on Electron Devices
2022-12
|
Journal article
Contributors:
Rajarshi Roy Chaudhuri;
Vipin Joshi;
Sayak Dutta Gupta;
Mayank Shrivastava
Source:
check_circle
Crossref
grade
Preferred source
(of
2)
IEEE Transactions on Electron Devices
2022-12
|
Journal article
Contributors:
Sayak Dutta Gupta;
Vipin Joshi;
Rajarshi Roy Chaudhuri;
Mayank Shrivastava
Source:
check_circle
Crossref
grade
Preferred source
(of
2)
IEEE Transactions on Electron Devices
2022-11
|
Journal article
Contributors:
Vipin Joshi;
Sayak Dutta Gupta;
Rajarshi Roy Chaudhuri;
Mayank Shrivastava
Source:
check_circle
Crossref
grade
Preferred source
(of
2)
IEEE Transactions on Electron Devices
2022-03
|
Journal article
Contributors:
Sayak Dutta Gupta;
Vipin Joshi;
Rajarshi Roy Chaudhuri;
Mayank Shrivastava
Source:
check_circle
Crossref
grade
Preferred source
(of
2)
IEEE Transactions on Electron Devices
2021-11
|
Journal article
Contributors:
Sayak Dutta Gupta;
Vipin Joshi;
Rajarshi Roy Chaudhuri;
Mayank Shrivastava
Source:
check_circle
Crossref
grade
Preferred source
(of
2)
IEEE Transactions on Electron Devices
2021-11
|
Journal article
Contributors:
Sayak Dutta Gupta;
Vipin Joshi;
Rajarshi Roy Chaudhuri;
Mayank Shrivastava
Source:
check_circle
Crossref
grade
Preferred source
(of
2)
IEEE Transactions on Electron Devices
2021-10
|
Journal article
Contributors:
Rajarshi Roy Chaudhuri;
Vipin Joshi;
Sayak Dutta Gupta;
Mayank Shrivastava
Source:
check_circle
Crossref
grade
Preferred source
(of
2)
Journal of Applied Physics
2021-07-07
|
Journal article
Contributors:
Sayak Dutta Gupta;
Vipin Joshi;
Rajarshi Roy Chaudhuri;
Mayank Shrivastava
Source:
check_circle
Crossref
grade
Preferred source
(of
2)
IEEE Transactions on Electron Devices
2021-01
|
Journal article
Contributors:
Vipin Joshi;
Sayak Dutta Gupta;
Rajarshi Roy Chaudhuri;
Mayank Shrivastava
Source:
check_circle
Crossref
grade
Preferred source
(of
2)
IEEE Transactions on Electron Devices
2021-01
|
Journal article
Contributors:
Vipin Joshi;
Sayak Dutta Gupta;
Rajarshi Roy Chaudhuri;
Mayank Shrivastava
Source:
check_circle
Crossref
grade
Preferred source
(of
2)
Proceedings of the International Symposium on Power Semiconductor Devices and ICs
2020
|
Conference paper
EID:
2-s2.0-85090553497
Contributors:
Chaudhuri, R.R.;
Joshi, V.;
Gupta, S.D.;
Shrivastava, M.
Source:
Vipin Joshi
via
Scopus - Elsevier
IEEE International Reliability Physics Symposium Proceedings
2020
|
Conference paper
EID:
2-s2.0-85088403084
Contributors:
Gupta, S.D.;
Joshi, V.;
Chaudhuri, R.R.;
Kr Singh, A.;
Guha, S.;
Shrivastava, M.
Source:
Vipin Joshi
via
Scopus - Elsevier
IEEE International Reliability Physics Symposium Proceedings
2019
|
Conference paper
EID:
2-s2.0-85066764388
Contributors:
Dutta Gupta, S.;
Joshi, V.;
Shankar, B.;
Shikha, S.;
Raghavan, S.;
Shrivastava, M.
Source:
Vipin Joshi
via
Scopus - Elsevier
IEEE Transactions on Electron Devices
2019-06
|
Journal article
Contributors:
Sayak Dutta Gupta;
Ankit Soni;
Vipin Joshi;
Jeevesh Kumar;
Rudrarup Sengupta;
Heena Khand;
Bhawani Shankar;
Nagaboopathy Mohan;
Srinivasan Raghavan;
Navakanta Bhat
et al.
Source:
check_circle
Crossref
grade
Preferred source
(of
2)
IEEE Transactions on Electron Devices
2019-01
|
Journal article
Contributors:
Vipin Joshi;
Shree Prakash Tiwari;
Mayank Shrivastava
Source:
check_circle
Crossref
grade
Preferred source
(of
2)
IEEE Transactions on Electron Devices
2019-01
|
Journal article
Contributors:
Vipin Joshi;
Shree Prakash Tiwari;
Mayank Shrivastava
Source:
check_circle
Crossref
grade
Preferred source
(of
2)
Source:
Vipin Joshi
grade
Preferred source
(of
2)
2017-09
|
Conference paper
Source:
Vipin Joshi
grade
Preferred source
(of
2)
Source:
Vipin Joshi
grade
Preferred source
(of
2)
Source:
Vipin Joshi
grade
Preferred source
(of
2)