Personal information

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Employment (1)

Statwolf LTD: Dublin, IE

Employment
Source: Self-asserted source
Andrea Schirru

Education and qualifications (1)

Università degli Studi di Pavia: Pavia, Lombardia, IT

PhD in Machine Learning
Education
Source: Self-asserted source
Andrea Schirru

Works (21)

A fraud detection decision support system via human on-line behavior characterization and machine learning

Proceedings - 2018 1st IEEE International Conference on Artificial Intelligence for Industries, AI4I 2018
2019 | Conference paper
EID:

2-s2.0-85064218884

Contributors: Susto, G.A.; Terzi, M.; Masiero, C.; Pampuri, S.; Schirru, A.
Source: Self-asserted source
Andrea Schirru via Scopus - Elsevier

A hidden-Gamma model-based filtering and prediction approach for monotonic health factors in manufacturing

Control Engineering Practice
2018 | Journal article
EID:

2-s2.0-85042863788

Part of ISSN: 09670661
Contributors: Susto, G.A.; Schirru, A.; Pampuri, S.; Beghi, A.; De Nicolao, G.
Source: Self-asserted source
Andrea Schirru via Scopus - Elsevier

Supervised Aggregative Feature Extraction for Big Data Time Series Regression

IEEE Transactions on Industrial Informatics
2016 | Journal article
EID:

2-s2.0-84976263015

Part of ISSN: 15513203
Contributors: Susto, G.A.; Schirru, A.; Pampuri, S.; McLoone, S.
Source: Self-asserted source
Andrea Schirru via Scopus - Elsevier

A sampling decision system for semiconductor manufacturing - Relying on virtual metrology and actual measurements

Proceedings - Winter Simulation Conference
2015 | Conference paper
EID:

2-s2.0-84940481546

Part of ISSN: 08917736
Contributors: Kurz, D.; Pilz, J.; Schirru, A.; Pampuri, S.; De Luca, C.
Source: Self-asserted source
Andrea Schirru via Scopus - Elsevier

Machine learning for predictive maintenance: A multiple classifier approach

IEEE Transactions on Industrial Informatics
2015 | Journal article
EID:

2-s2.0-84937407847

Part of ISSN: 15513203
Contributors: Susto, G.A.; Schirru, A.; Pampuri, S.; McLoone, S.; Beghi, A.
Source: Self-asserted source
Andrea Schirru via Scopus - Elsevier

Multi-step virtual metrology for semiconductor manufacturing: A multilevel and regularization methods-based approach

Computers and Operations Research
2015 | Journal article
EID:

2-s2.0-84912138502

Part of ISSN: 03050548
Contributors: Susto, G.A.; Pampuri, S.; Schirru, A.; Beghi, A.; De Nicolao, G.
Source: Self-asserted source
Andrea Schirru via Scopus - Elsevier

A predictive maintenance system for integral type faults based on support vector machines: An application to ion implantation

IEEE International Conference on Automation Science and Engineering
2013 | Conference paper
EID:

2-s2.0-84891505814

Part of ISSN: 21618070 21618089
Contributors: Susto, G.A.; Schirru, A.; Pampuri, S.; Pagano, D.; McLoone, S.; Beghi, A.
Source: Self-asserted source
Andrea Schirru via Scopus - Elsevier

Prediction of integral type failures in semiconductor manufacturing through classification methods

IEEE International Conference on Emerging Technologies and Factory Automation, ETFA
2013 | Conference paper
EID:

2-s2.0-84890749806

Part of ISSN: 19460740 19460759
Contributors: Susto, G.A.; McLoone, S.; Pagano, D.; Schirru, A.; Pampuri, S.; Beghi, A.
Source: Self-asserted source
Andrea Schirru via Scopus - Elsevier

Virtual sensors for semiconductor manufacturing: A nonparametric approach - Exploiting information theoretic learning and Kernel machines

Lecture Notes in Electrical Engineering
2013 | Book
EID:

2-s2.0-84865497175

Part of ISSN: 18761100 18761119
Contributors: Schirru, A.; Pampuri, S.; De Luca, C.; De Nicolao, G.
Source: Self-asserted source
Andrea Schirru via Scopus - Elsevier

A predictive maintenance system based on regularization methods for ion-implantation

ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings
2012 | Conference paper
EID:

2-s2.0-84863888440

Part of ISSN: 10788743
Contributors: Susto, G.A.; Schirru, A.; Pampuri, S.; Beghi, A.
Source: Self-asserted source
Andrea Schirru via Scopus - Elsevier

An information-theory and Virtual Metrology-based approach to Run-to-Run semiconductor manufacturing control

IEEE International Conference on Automation Science and Engineering
2012 | Conference paper
EID:

2-s2.0-84872531658

Part of ISSN: 21618070 21618089
Contributors: Susto, G.A.; Schirru, A.; Pampuri, S.; De Nicolao, G.; Beghi, A.
Source: Self-asserted source
Andrea Schirru via Scopus - Elsevier

Learning from time series: Supervised Aggregative Feature Extraction

Proceedings of the IEEE Conference on Decision and Control
2012 | Conference paper
EID:

2-s2.0-84874234366

Part of ISSN: 01912216
Contributors: Schirru, A.; Susto, G.A.; Pampuri, S.; McLoone, S.
Source: Self-asserted source
Andrea Schirru via Scopus - Elsevier

MSC-clustering and forward stepwise regression for virtual metrology in highly correlated input spaces

ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings
2012 | Conference paper
EID:

2-s2.0-84863910389

Part of ISSN: 10788743
Contributors: Prakash, P.K.S.; Schirru, A.; Hung, P.; McLoone, S.
Source: Self-asserted source
Andrea Schirru via Scopus - Elsevier

Multistep virtual metrology approaches for semiconductor manufacturing processes

IEEE International Conference on Automation Science and Engineering
2012 | Conference paper
EID:

2-s2.0-84872530718

Part of ISSN: 21618070 21618089
Contributors: Pampuri, S.; Schirru, A.; Susto, G.A.; De Luca, C.; Beghi, A.; De Nicolao, G.
Source: Self-asserted source
Andrea Schirru via Scopus - Elsevier

Optimal tuning of epitaxy pyrometers

ASMC (Advanced Semiconductor Manufacturing Conference) Proceedings
2012 | Conference paper
EID:

2-s2.0-84863921257

Part of ISSN: 10788743
Contributors: Susto, G.A.; Pampuri, S.; Schirru, A.; Beghi, A.
Source: Self-asserted source
Andrea Schirru via Scopus - Elsevier

Multilevel kernel methods for Virtual Metrology in semiconductor manufacturing

IFAC Proceedings Volumes (IFAC-PapersOnline)
2011 | Conference paper
EID:

2-s2.0-84866754326

Part of ISSN: 14746670
Contributors: Schirru, A.; Pampuri, S.; De Luca, C.; De Nicolao, G.
Source: Self-asserted source
Andrea Schirru via Scopus - Elsevier

Multilevel Lasso applied to virtual metrology in semiconductor manufacturing

IEEE International Conference on Automation Science and Engineering
2011 | Conference paper
EID:

2-s2.0-82455219074

Part of ISSN: 21618070 21618089
Contributors: Pampuri, S.; Schirru, A.; Fazio, G.; De Nicolao, G.
Source: Self-asserted source
Andrea Schirru via Scopus - Elsevier

Nonparametric virtual sensors for semiconductor manufacturing: Using information theoretic learning and kernel machines

ICINCO 2011 - Proceedings of the 8th International Conference on Informatics in Control, Automation and Robotics
2011 | Conference paper
EID:

2-s2.0-80052569246

Contributors: Schirru, A.; Pampuri, S.; De Luca, C.; De Nicolao, G.
Source: Self-asserted source
Andrea Schirru via Scopus - Elsevier

Proportional hazard model with ℓ<inf>1</inf> penalization applied to predictive maintenance in semiconductor manufacturing

IEEE International Conference on Automation Science and Engineering
2011 | Conference paper
EID:

2-s2.0-82455219058

Part of ISSN: 21618070 21618089
Contributors: Pampuri, S.; Schirru, A.; De Luca, C.; De Nicolao, G.
Source: Self-asserted source
Andrea Schirru via Scopus - Elsevier

Multilevel statistical process Control of asynchronous multi-stream processes in semiconductor manufacturing

2010 IEEE International Conference on Automation Science and Engineering, CASE 2010
2010 | Conference paper
EID:

2-s2.0-78149424225

Contributors: Schirru, A.; Pampuri, S.; De Nicolao, G.
Source: Self-asserted source
Andrea Schirru via Scopus - Elsevier

Particle filtering of hidden gamma processes for robust Predictive Maintenance in semiconductor manufacturing

2010 IEEE International Conference on Automation Science and Engineering, CASE 2010
2010 | Conference paper
EID:

2-s2.0-78149431713

Contributors: Schirru, A.; Pampuri, S.; De Nicolao, G.
Source: Self-asserted source
Andrea Schirru via Scopus - Elsevier