Personal information
Activities
Employment (3)
2019-04
to
present
|
Senior SerDes Engineer
Employment
Source:
Woorham Bae
2017-03
to
2019-03
|
Postdoctoral researcher
(EECS)
Employment
Source:
Woorham Bae
2016-09-01
to
2017-02-28
Employment
Source:
Woorham Bae
Education and qualifications (2)
2011-03-01
to
2016-08-29
|
Ph.D.
(Department of Electrical and Computer Engineering)
Education
Source:
Woorham Bae
2006-03-01
to
2010-08-27
|
B.S.
(Department of Electrical and Computer Engineering)
Education
Source:
Woorham Bae
Professional activities (3)
2018-11
to
present
|
Associate Editor
(IEEE ACCESS)
Service
Source:
Woorham Bae
2017-10
to
present
|
Editorial Review Board
(IEEE Solid-State Circuits Letters)
Service
Source:
Woorham Bae
2018
Distinction
Source:
Woorham Bae
Works (50)
IEEE Solid-State Circuits Letters
2023
|
Journal article
Contributors:
Gijin Park;
Dongjun Lee;
Jaeduk Han;
Woorham Bae
Source:
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Crossref
Source:
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Crossref
IEEE Transactions on Electron Devices
2022-07
|
Journal article
Contributors:
Woorham Bae;
Jin-Woo Han;
Kyung Jean Yoon
Source:
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Crossref
IEEE Journal of Solid-State Circuits
2022-01
|
Journal article
Contributors:
Colin Schmidt;
John Wright;
Zhongkai Wang;
Eric Chang;
Albert Ou;
Woorham Bae;
Sean Huang;
Vladimir Milovanovic;
Anita Flynn;
Brian Richards
et al.
Source:
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Crossref
Electronics
2021-10-24
|
Journal article
Contributors:
Gijin Park;
Jaeduk Han;
Woorham Bae
Source:
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Crossref
IEEE Transactions on Circuits and Systems I: Regular Papers
2021-03
|
Journal article
Contributors:
Jaeduk Han;
Woorham Bae;
Eric Chang;
Zhongkai Wang;
Borivoje Nikolic;
Elad Alon
Source:
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Crossref
PeerJ Computer Science
2021-03-30
|
Journal article
Contributors:
Woorham Bae
Source:
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Crossref
Electronics
2021-01-02
|
Journal article
Contributors:
Woorham Bae;
Sung-Yong Cho;
Deog-Kyoon Jeong
Source:
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Crossref
grade
Preferred source
(of
2)
IEEE Transactions on Nanotechnology
2020
|
Journal article
Contributors:
Woorham Bae;
Kyung Jean Yoon
Source:
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Crossref
Advanced Electronic Materials
2020-12
|
Journal article
Contributors:
Kyung Jean Yoon;
Jin‐Woo Han;
Woorham Bae
Source:
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Crossref
Source:
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Crossref
grade
Preferred source
(of
2)
Advanced Intelligent Systems
2020-05
|
Journal article
Contributors:
Woorham Bae;
Kyung Jean Yoon
Source:
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Crossref
IEEE Access
2019
|
Journal article
Contributors:
Han-Gon Ko;
Woorham Bae;
Gyu-Seob Jeong;
Deog-Kyoon Jeong
Source:
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Crossref
Journal of Low Power Electronics and Applications
2019-08-20
|
Journal article
Contributors:
Woorham Bae
Source:
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Crossref
grade
Preferred source
(of
2)
IEEE Journal of Solid-State Circuits
2019-07
|
Journal article
Contributors:
Angie Wang;
Woorham Bae;
Jaeduk Han;
Stevo Bailey;
Orhan Ocal;
Paul Rigge;
Zhongkai Wang;
Kannan Ramchandran;
Elad Alon;
Borivoje Nikolic
Source:
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Crossref
IEEE Transactions on Circuits and Systems II: Express Briefs
2018-12
|
Journal article
Contributors:
Woorham Bae;
Kyung Jean Yoon;
Taeksang Song;
Borivoje Nikolic
Source:
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Crossref
IEEE Journal of Solid-State Circuits
2018-10
|
Journal article
Contributors:
Kwanseo Park;
Woorham Bae;
Jinhyung Lee;
Jeongho Hwang;
Deog-Kyoon Jeong
Source:
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Crossref
IEEE Transactions on Circuits and Systems I: Regular Papers
2018-09
|
Journal article
Contributors:
Sung-Yong Cho;
Sungwoo Kim;
Min-Seong Choo;
Han-Gon Ko;
Jinhyung Lee;
Woorham Bae;
Deog-Kyoon Jeong
Source:
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Crossref
IEEE Transactions on Circuits and Systems II: Express Briefs
2018-04
|
Journal article
Contributors:
Jeongho Hwang;
Gyu-Seob Jeong;
Woorham Bae;
Jun-Eun Park;
Chang Soo Yoon;
Jung Min Yoon;
Jiho Joo;
Gyungock Kim;
Deog-Kyoon Jeong
Source:
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Crossref
IEEE Transactions on Circuits and Systems II: Express Briefs
2017-12
|
Journal article
Contributors:
Haram Ju;
Moon-Chul Choi;
Gyu-Seob Jeong;
Woorham Bae;
Deog-Kyoon Jeong
Source:
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Crossref
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
2017-12
|
Journal article
Contributors:
Woorham Bae;
Borivoje Nikolic;
Deog-Kyoon Jeong
Source:
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Crossref
Source:
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Crossref
Source:
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Multidisciplinary Digital Publishing Institute
grade
Preferred source
(of
2)
IEEE Transactions on Electron Devices
2017-04
|
Journal article
Contributors:
Woorham Bae;
Kyung Jean Yoon;
Cheol Seong Hwang;
Deog-Kyoon Jeong
Source:
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Crossref
IEEE Transactions on Circuits and Systems I: Regular Papers
2016
|
Journal article
EID:
2-s2.0-84981727599
Contributors:
Bae, W.;
Jeong, G.;
Park, K.;
Cho, S.;
Kim, Y.;
Jeong, D.
Source:
Woorham Bae
via
Scopus - Elsevier
2015 IEEE Asian Solid-State Circuits Conference, A-SSCC 2015 - Proceedings
2016
|
Conference paper
EID:
2-s2.0-84963829036
Contributors:
Jeong, G.-S.;
Chu, S.-H.;
Kim, Y.;
Jang, S.;
Kim, S.;
Bae, W.;
Cho, S.-Y.;
Ju, H.;
Jeong, D.-K.
Source:
Woorham Bae
via
Scopus - Elsevier
IEEE Journal of Solid-State Circuits
2016
|
Journal article
EID:
2-s2.0-84979085017
Contributors:
Jeong, G.;
Chu, S.;
Kim, Y.;
Jang, S.;
Kim, S.;
Bae, W.;
Cho, S.;
Ju, H.;
Jeong, D.
Source:
Woorham Bae
via
Scopus - Elsevier
2015 IEEE Asian Solid-State Circuits Conference, A-SSCC 2015 - Proceedings
2016
|
Conference paper
EID:
2-s2.0-84963828731
Contributors:
Bae, W.;
Ju, H.;
Park, K.;
Cho, S.-Y.;
Jeong, D.-K.
Source:
Woorham Bae
via
Scopus - Elsevier
IEEE Journal of Solid-State Circuits
2016
|
Journal article
EID:
2-s2.0-84976473524
Contributors:
Bae, W.;
Ju, H.;
Park, K.;
Cho, S.;
Jeong, D.
Source:
Woorham Bae
via
Scopus - Elsevier
Proceedings - IEEE International Symposium on Circuits and Systems
2016
|
Conference paper
EID:
2-s2.0-84983387276
Contributors:
Ju, H.;
Bae, W.;
Jeong, G.-S.;
Jeong, D.-K.
Source:
Woorham Bae
via
Scopus - Elsevier
Nanotechnology
2016
|
Journal article
EID:
2-s2.0-84994887839
Contributors:
Bae, W.;
Yoon, K.J.;
Hwang, C.S.;
Jeong, D.-K.
Source:
Woorham Bae
via
Scopus - Elsevier
Proceedings - IEEE International Symposium on Circuits and Systems
2016
|
Conference paper
EID:
2-s2.0-84983395426
Contributors:
Bae, W.;
Jeong, G.-S.;
Jeong, D.-K.
Source:
Woorham Bae
via
Scopus - Elsevier
Advanced Electronic Materials
2016
|
Journal article
EID:
2-s2.0-84987905519
Contributors:
Yoon, K.J.;
Bae, W.;
Jeong, D.-K.;
Hwang, C.S.
Source:
Woorham Bae
via
Scopus - Elsevier
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
2016
|
Journal article
EID:
2-s2.0-84951335078
Contributors:
Bae, W.;
Jeong, G.-S.;
Kim, Y.;
Chi, H.-K.;
Jeong, D.-K.
Source:
Woorham Bae
via
Scopus - Elsevier
ISOCC 2015 - International SoC Design Conference: SoC for Internet of Everything (IoE)
2016
|
Conference paper
EID:
2-s2.0-84963812781
Contributors:
Hwang, J.;
Jeong, G.-S.;
Bae, W.;
Kim, Y.;
Kim, G.;
Jeong, D.-K.
Source:
Woorham Bae
via
Scopus - Elsevier
IEEE Transactions on Circuits and Systems II: Express Briefs
2016-12
|
Journal article
Contributors:
Woorham Bae;
Gyu-Seob Jeong;
Deog-Kyoon Jeong
Source:
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Crossref
Proceedings - IEEE International Symposium on Circuits and Systems
2015
|
Conference paper
EID:
2-s2.0-84946219397
Contributors:
Park, K.;
Bae, W.;
Ju, H.;
Lee, J.;
Jeong, G.-S.;
Kim, Y.;
Jeong, D.-K.
Source:
Woorham Bae
via
Scopus - Elsevier
IEEE Journal of Solid-State Circuits
2015
|
Journal article
EID:
2-s2.0-84947036783
Contributors:
Chu, S.-H.;
Bae, W.;
Jeong, G.-S.;
Jang, S.;
Kim, S.;
Joo, J.;
Kim, G.;
Jeong, D.-K.
Source:
Woorham Bae
via
Scopus - Elsevier
Proceedings - 2014 IEEE Asian Solid-State Circuits Conference, A-SSCC 2014
2015
|
Conference paper
EID:
2-s2.0-84922551832
Contributors:
Chu, S.-H.;
Bae, W.;
Jeong, G.-S.;
Joo, J.;
Kim, G.;
Jeong, D.-K.
Source:
Woorham Bae
via
Scopus - Elsevier
European Solid-State Circuits Conference
2015
|
Conference paper
EID:
2-s2.0-84958769119
Contributors:
Cho, S.-Y.;
Kim, S.;
Choo, M.-S.;
Lee, J.;
Ko, H.-G.;
Jang, S.;
Chu, S.-H.;
Bae, W.;
Kim, Y.;
Jeong, D.-K.
Source:
Woorham Bae
via
Scopus - Elsevier
Proceedings - IEEE International Symposium on Circuits and Systems
2015
|
Conference paper
EID:
2-s2.0-84946215317
Contributors:
Bae, W.;
Yoon, C.-S.;
Jeong, D.-K.
Source:
Woorham Bae
via
Scopus - Elsevier
International Journal of Circuit Theory and Applications
2015
|
Journal article
EID:
2-s2.0-84957809712
Contributors:
Bae, W.;
Jeong, D.-K.
Source:
Woorham Bae
via
Scopus - Elsevier
European Solid-State Circuits Conference
2014
|
Conference paper
EID:
2-s2.0-84909952253
Contributors:
Bae, W.;
Jeong, G.-S.;
Park, K.;
Cho, S.-Y.;
Kim, Y.;
Jeong, D.-K.
Source:
Woorham Bae
via
Scopus - Elsevier
Proceedings - IEEE International Symposium on Circuits and Systems
2014
|
Conference paper
EID:
2-s2.0-84907398396
Contributors:
Kim, Y.;
Bae, W.;
Jeong, D.-K.
Source:
Woorham Bae
via
Scopus - Elsevier
Proceedings of the 2014 IEEE 17th International Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2014
2014
|
Conference paper
EID:
2-s2.0-84938796697
Contributors:
Bae, W.;
Jeong, D.-K.;
Yoo, B.-J.
Source:
Woorham Bae
via
Scopus - Elsevier
Journal of Semiconductor Technology and Science
2014
|
Journal article
EID:
2-s2.0-84906883466
Contributors:
Kavala, A.;
Bae, W.;
Kim, S.;
Hong, G.-M.;
Chi, H.;
Kim, S.;
Jeong, D.-K.
Source:
Woorham Bae
via
Scopus - Elsevier
13th International Conference on Electronics, Information, and Communication, ICEIC 2014 - Proceedings
2014
|
Conference paper
EID:
2-s2.0-84910051359
Contributors:
Bae, W.;
Jeong, D.-K.
Source:
Woorham Bae
via
Scopus - Elsevier
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
2014
|
Journal article
EID:
2-s2.0-84901589295
Contributors:
Yoo, B.-J.;
Bae, W.-R.;
Han, J.;
Kim, J.;
Jeong, D.-K.
Source:
Woorham Bae
via
Scopus - Elsevier
Journal of Semiconductor Technology and Science
2012
|
Journal article
EID:
2-s2.0-84874606429
Contributors:
Yoo, B.-J.;
Song, H.-Y.;
Chi, H.-K.;
Bae, W.-R.;
Jeong, D.-K.
Source:
Woorham Bae
via
Scopus - Elsevier
ISOCC 2012 - 2012 International SoC Design Conference
2012
|
Conference paper
EID:
2-s2.0-84873954789
Contributors:
Bae, W.;
Yoo, B.-J.;
Jeong, D.-K.
Source:
Woorham Bae
via
Scopus - Elsevier