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Works (11)
IEEE Transactions on Microwave Theory and Techniques
2019-01
|
Journal article
Contributors:
Piet Bronders;
John Lataire;
Thierry Coppens;
Guillaume Pailloncy;
Sebastian Gustafsson;
Yves Rolain;
Gerd Vandersteen
Source:
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Crossref
IEEE Transactions on Microwave Theory and Techniques
2018-10
|
Journal article
Contributors:
Johan Bremer;
Johan Bergsten;
Lowisa Hanning;
Torbjorn Nilsson;
Niklas Rorsman;
Sebastian Gustafsson;
Axel Martin Eriksson;
Mattias Thorsell
Source:
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Crossref
IEEE Transactions on Electron Devices
2016
|
Journal article
EID:
2-s2.0-84959550101
Contributors:
Axelsson, O.;
Gustafsson, S.;
Hjelmgren, H.;
Rorsman, N.;
Blanck, H.;
Splettstoesser, J.;
Thorpe, J.;
Roedle, T.;
Thorsell, M.
Source:
Sebastian Gustafsson
via
Scopus - Elsevier
Asia-Pacific Microwave Conference Proceedings, APMC
2016
|
Conference paper
EID:
2-s2.0-84979026922
Contributors:
Huang, T.;
Axelsson, O.;
Malmros, A.;
Bergsten, J.;
Gustafsson, S.;
Thorsell, M.;
Rorsman, N.
Source:
Sebastian Gustafsson
via
Scopus - Elsevier
IEEE Transactions on Electron Devices
2016
|
Journal article
EID:
2-s2.0-84959553800
Contributors:
Bergsten, J.;
Chen, J.-T.;
Gustafsson, S.;
Malmros, A.;
Forsberg, U.;
Thorsell, M.;
Janzén, E.;
Rorsman, N.
Source:
Sebastian Gustafsson
via
Scopus - Elsevier
2016 87th ARFTG Microwave Measurement Conference (ARFTG)
2016-05
|
Conference paper
Contributors:
Sebastian Gustafsson;
Christian Fager;
Koen Buisman;
Mattias Thorsell
Source:
Sebastian Gustafsson
via
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IEEE Transactions on Instrumentation and Measurement
2015
|
Journal article
EID:
2-s2.0-84939236357
Contributors:
Gustafsson, S.;
Thorsell, M.;
Stenarson, J.;
Fager, C.
Source:
Sebastian Gustafsson
via
Scopus - Elsevier
IEEE Transactions on Electron Devices
2015
|
Journal article
EID:
2-s2.0-84933498341
Contributors:
Gustafsson, S.;
Chen, J.-T.;
Bergsten, J.;
Forsberg, U.;
Thorsell, M.;
Janzén, E.;
Rorsman, N.
Source:
Sebastian Gustafsson
via
Scopus - Elsevier
IEEE Electron Device Letters
2015
|
Journal article
EID:
2-s2.0-84930504855
Contributors:
Huang, T.;
Malmros, A.;
Bergsten, J.;
Gustafsson, S.;
Axelsson, O.;
Thorsell, M.;
Rorsman, N.
Source:
Sebastian Gustafsson
via
Scopus - Elsevier
IEEE Microwave Magazine
2015
|
Journal article
EID:
2-s2.0-84921387994
Contributors:
Landin, P.N.;
Gustafsson, S.;
Fager, C.;
Eriksson, T.
Source:
Sebastian Gustafsson
via
Scopus - Elsevier
81st ARFTG Microwave Measurement Conference
2013-06
|
Conference paper
Contributors:
Sebastian Gustafsson;
Mattias Thorsell;
Christian Fager
Source:
Sebastian Gustafsson
via
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