Personal information

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Employment (5)

Korea University: Seoul, KR

2024-09-01 to present | Associate Professor (Department of Computer Science and Engineering)
Employment
Source: Self-asserted source
Dongsun Kim

Kyungpook National University: Daegu, Daegu, KR

2020-09-01 to present | Assistant Professor
Employment
Source: Self-asserted source
Dongsun Kim

Furiosa.ai: Seoul, KR

2019-04-01 to 2020-08-31 | Senior Software Test Engineer
Employment
Source: Self-asserted source
Dongsun Kim

University of Luxembourg: Luxembourg, LU

2013-11-15 to 2018-11-14 | Research Associate (FSTC)
Employment
Source: Self-asserted source
Dongsun Kim

Hong Kong University of Science and Technology: Kowloon, CN

2010-09-10 to 2013-06-30 | Post-Doctoral Fellow (Computer Science and Engineering)
Employment
Source: Self-asserted source
Dongsun Kim

Education and qualifications (1)

Sogang University: Seoul, KR

2005-03-01 to 2010-08-17 | Ph.D. (Computer Science and Engineering)
Education
Source: Self-asserted source
Dongsun Kim

Works (50 of 64)

Items per page:
Page 1 of 2

Android Malware Detection Based on Novel Representations of Apps

2025 | Book chapter
Contributors: Tiezhu Sun; Nadia Daoudi; Kevin Allix; Jordan Samhi; Kisub Kim; Xin Zhou; Abdoul Kader Kabore; Dongsun Kim; David Lo; Tegawendé François Bissyandé et al.
Source: check_circle
Crossref

Improving Fault Localization with External Oracle by Using Counterfactual Execution

ACM Transactions on Software Engineering and Methodology
2025-02-28 | Journal article
Contributors: Jongchan Park; Tae Eun Kim; Dongsun Kim; Kihong Heo
Source: check_circle
Crossref

Finding Safety Violations of AI-Enabled Control Systems through the Lens of Synthesized Proxy Programs

ACM Transactions on Software Engineering and Methodology
2025-01-27 | Journal article
Contributors: Jieke Shi; Zhou Yang; Junda He; Bowen Xu; Dongsun Kim; DongGyun Han; David Lo
Source: check_circle
Crossref

How are We Detecting Inconsistent Method Names? An Empirical Study from Code Review Perspective

ACM Transactions on Software Engineering and Methodology
2025-01-13 | Journal article
Contributors: Kisub Kim; Xin Zhou; Dongsun Kim; Julia Lawall; Kui Liu; Tegawendé F. Bissyandé; Jacques Klein; Jaekwon Lee; David Lo
Source: check_circle
Crossref

Gotcha! This Model Uses My Code! Evaluating Membership Leakage Risks in Code Models

IEEE Transactions on Software Engineering
2024-12 | Journal article
Contributors: Zhou Yang; Zhipeng Zhao; Chenyu Wang; Jieke Shi; Dongsun Kim; DongGyun Han; David Lo
Source: check_circle
Crossref

Outcomes and effectiveness of active surveillance for low-risk papillary thyroid carcinoma: a systematic review and meta-analysis

European Archives of Oto-Rhino-Laryngology
2024-12-12 | Journal article
Contributors: Van Cuong Nguyen; Chang Myeon Song; Yong Bae Ji; Shinje Moon; Jung Hwan Park; Dong Sun Kim; Kyung Tae
Source: check_circle
Crossref

DataRecipe --- How to Cook the Data for CodeLLM?

2024-10-27 | Conference paper
Contributors: Kisub Kim; Jounghoon Kim; Byeongjo Park; Dongsun Kim; Chun Yong Chong; Yuan Wang; Tiezhu Sun; Daniel Tang; Jacques Klein; Tegawende F. Bissyande
Source: check_circle
Crossref

Preserving Reactiveness: Understanding and Improving the Debugging Practice of Blocking-Call Bugs

2024-09-11 | Conference paper
Contributors: Arooba Shahoor; Jooyong Yi; Dongsun Kim
Source: check_circle
Crossref

Unveiling Memorization in Code Models

2024-04-12 | Conference paper
Contributors: Zhou Yang; Zhipeng Zhao; Chenyu Wang; Jieke Shi; Dongsun Kim; Donggyun Han; David Lo
Source: check_circle
Crossref

Poracle: Testing Patches under Preservation Conditions to Combat the Overfitting Problem of Program Repair

ACM Transactions on Software Engineering and Methodology
2024-02-29 | Journal article
Contributors: Elkhan Ismayilzada; Md Mazba Ur Rahman; Dongsun Kim; Jooyong Yi
Source: check_circle
Crossref

Big Code Search: A Bibliography

ACM Computing Surveys
2024-01-31 | Journal article
Contributors: Kisub Kim; Sankalp Ghatpande; Dongsun Kim; Xin Zhou; Kui Liu; Tegawendé F. Bissyandé; Jacques Klein; Yves Le Traon
Source: check_circle
Crossref

A Query-Based Greedy Approach for Authentic Influencer Discovery in SIoT

Computers, Materials and Continua
2023 | Journal article
EID:

2-s2.0-85145350943

Part of ISSN: 15462226 15462218
Contributors: Batool, F.; Rehman, A.; Kim, D.; Abbas, A.; Nawaz, R.; Madni, T.M.
Source: Self-asserted source
Dongsun Kim via Scopus - Elsevier

COVID-19 Outbreak Prediction by Using Machine Learning Algorithms

Computers, Materials and Continua
2023 | Journal article
EID:

2-s2.0-85139742683

Part of ISSN: 15462226 15462218
Contributors: Sher, T.; Rehman, A.; Kim, D.
Source: Self-asserted source
Dongsun Kim via Scopus - Elsevier

Reliable Fix Patterns Inferred from Static Checkers for Automated Program Repair

ACM Transactions on Software Engineering and Methodology
2023-10-31 | Journal article
Contributors: Kui Liu; Jingtang Zhang; Li Li; Anil Koyuncu; Dongsun Kim; Chunpeng Ge; Zhe Liu; Jacques Klein; Tegawendé F. Bissyandé
Source: check_circle
Crossref

DexBERT: Effective, Task-Agnostic and Fine-Grained Representation Learning of Android Bytecode

IEEE Transactions on Software Engineering
2023-10-01 | Journal article
Contributors: Tiezhu Sun; Kevin Allix; Kisub Kim; Xin Zhou; Dongsun Kim; David Lo; Tegawendé F. Bissyandé; Jacques Klein
Source: check_circle
Crossref

A Pre-Trained BERT Model for Android Applications

arXiv
2022 | Other
EID:

2-s2.0-85144751593

Part of ISSN: 23318422
Contributors: Sun, T.; Allix, K.; Kim, K.; Zhou, X.; Kim, D.; Lo, D.; Bissyandé, T.F.; Klein, J.
Source: Self-asserted source
Dongsun Kim via Scopus - Elsevier

DigBug—Pre/post-processing operator selection for accurate bug localization

Journal of Systems and Software
2022 | Journal article
EID:

2-s2.0-85127058392

Part of ISSN: 01641212
Contributors: Kim, K.; Ghatpande, S.; Liu, K.; Koyuncu, A.; Kim, D.; Bissyandé, T.F.; Klein, J.; Traon, Y.L.
Source: Self-asserted source
Dongsun Kim via Scopus - Elsevier

RansomSOC: A More Effective Security Operations Center to Detect and Respond to Ransomware Attacks

Journal of Internet Services and Information Security
2022 | Journal article
EID:

2-s2.0-85138160598

Part of ISSN: 21822077 21822069
Contributors: Lai, A.C.T.; Ke, P.F.; Chan, K.; Yiu, S.M.; Kim, D.; Wong, W.K.; Wang, S.; Muppala, J.; Ho, A.
Source: Self-asserted source
Dongsun Kim via Scopus - Elsevier

A critical review on the evaluation of automated program repair systems

Journal of Systems and Software
2021 | Journal article
EID:

2-s2.0-85090822173

Part of ISSN: 01641212
Contributors: Liu, K.; Li, L.; Koyuncu, A.; Kim, D.; Liu, Z.; Klein, J.; Bissyandé, T.F.
Source: Self-asserted source
Dongsun Kim via Scopus - Elsevier

Revisiting Test Cases to Boost Generate-and-Validate Program Repair

Proceedings - 2021 IEEE International Conference on Software Maintenance and Evolution, ICSME 2021
2021 | Conference paper
EID:

2-s2.0-85123345667

Contributors: Zhang, J.; Liu, K.; Kim, D.; Li, L.; Liu, Z.; Klein, J.; Bissyande, T.F.
Source: Self-asserted source
Dongsun Kim via Scopus - Elsevier

Where were the repair ingredients for Defects4j bugs?: Exploring the impact of repair ingredient retrieval on the performance of 24 program repair systems

Empirical Software Engineering
2021 | Journal article
EID:

2-s2.0-85114744577

Part of ISSN: 15737616 13823256
Contributors: Yang, D.; Liu, K.; Kim, D.; Koyuncu, A.; Kim, K.; Tian, H.; Lei, Y.; Mao, X.; Klein, J.; Bissyandé, T.F.
Source: Self-asserted source
Dongsun Kim via Scopus - Elsevier

Mining Fix Patterns for FindBugs Violations

IEEE Transactions on Software Engineering
2021-01-01 | Journal article
Contributors: Kui Liu; Dongsun Kim; Tegawende F. Bissyande; Shin Yoo; Yves Le Traon
Source: check_circle
Crossref
grade
Preferred source (of 2)‎

FixMiner: Mining relevant fix patterns for automated program repair

Empirical Software Engineering
2020 | Journal article
EID:

2-s2.0-85082651922

Part of ISSN: 15737616 13823256
Contributors: Koyuncu, A.; Liu, K.; Bissyandé, T.F.; Kim, D.; Klein, J.; Monperrus, M.; Le Traon, Y.
Source: Self-asserted source
Dongsun Kim via Scopus - Elsevier

On the efficiency of test suite based program repair a systematic assessment of 16 automated repair systems for java programs

Proceedings - International Conference on Software Engineering
2020 | Conference paper
EID:

2-s2.0-85090848241

Part of ISSN: 02705257
Contributors: Liu, K.; Wang, S.; Koyuncu, A.; Kim, K.; Bissyande, T.F.; Kim, D.; Wu, P.; Klein, J.; Mao, X.; Traon, Y.L.
Source: Self-asserted source
Dongsun Kim via Scopus - Elsevier

On the efficiency of test suite based program repair: A systematic assessment of 16 automated repair systems for java programs

arXiv
2020 | Other
EID:

2-s2.0-85095505506

Part of ISSN: 23318422
Contributors: Liu, K.; Wang, S.; Koyuncu, A.; Kim, K.; Bissyandé, T.F.; Klein, J.; Kim, D.; Mao, X.; Wu, P.; Le Traon, Y.
Source: Self-asserted source
Dongsun Kim via Scopus - Elsevier

AVATAR: Fixing Semantic Bugs with Fix Patterns of Static Analysis Violations

SANER 2019 - Proceedings of the 2019 IEEE 26th International Conference on Software Analysis, Evolution, and Reengineering
2019 | Conference paper
EID:

2-s2.0-85064184157

Contributors: Liu, K.; Koyuncu, A.; Kim, D.; Bissyande, T.F.
Source: Self-asserted source
Dongsun Kim via Scopus - Elsevier

Cost-aware clustering of bug reports by using a genetic algorithm

Journal of Information Science and Engineering
2019 | Journal article
EID:

2-s2.0-85063948890

Part of ISSN: 10162364
Contributors: Lee, J.; Kim, D.; Jung, W.
Source: Self-asserted source
Dongsun Kim via Scopus - Elsevier

D&C: A divide-and-conquer approach to IR-based bug localization

arXiv
2019 | Other
EID:

2-s2.0-85093424389

Part of ISSN: 23318422
Contributors: Koyuncu, A.; Bissyandé, T.F.; Kim, D.; Liu, K.; Klein, J.; Monperrus, M.; Le Traon, Y.
Source: Self-asserted source
Dongsun Kim via Scopus - Elsevier

iFixR: Bug Report driven Program Repair

arXiv
2019 | Other
EID:

2-s2.0-85094694780

Part of ISSN: 23318422
Contributors: Koyuncu, A.; Liu, K.; Bissyandé, T.F.; Kim, D.; Monperrus, M.; Klein, J.; Le Traon, Y.
Source: Self-asserted source
Dongsun Kim via Scopus - Elsevier

IFixR: Bug report driven program repair

ESEC/FSE 2019 - Proceedings of the 2019 27th ACM Joint Meeting European Software Engineering Conference and Symposium on the Foundations of Software Engineering
2019 | Conference paper
EID:

2-s2.0-85070636546

Contributors: Koyuncu, A.; Liu, K.; Bissyandé, T.F.; Kim, D.; Monperrus, M.; Klein, J.; Le Traon, Y.
Source: Self-asserted source
Dongsun Kim via Scopus - Elsevier

Learning to Spot and Refactor Inconsistent Method Names

Proceedings - International Conference on Software Engineering
2019 | Conference paper
EID:

2-s2.0-85064171666

Part of ISSN: 02705257
Contributors: Liu, K.; Kim, D.; Bissyande, T.F.; Kim, T.; Kim, K.; Koyuncu, A.; Kim, S.; Le Traon, Y.
Source: Self-asserted source
Dongsun Kim via Scopus - Elsevier

TBar: Revisiting template-based automated program repair

arXiv
2019 | Other
EID:

2-s2.0-85093126942

Part of ISSN: 23318422
Contributors: Liu, K.; Koyuncu, A.; Kim, D.; Bissyandé, T.F.
Source: Self-asserted source
Dongsun Kim via Scopus - Elsevier

TBAR: Revisiting template-based automated program repair

ISSTA 2019 - Proceedings of the 28th ACM SIGSOFT International Symposium on Software Testing and Analysis
2019 | Conference paper
EID:

2-s2.0-85070617174

Contributors: Liu, K.; Koyuncu, A.; Kim, D.; Bissyandé, T.F.
Source: Self-asserted source
Dongsun Kim via Scopus - Elsevier

You cannot fix what you cannot find! an investigation of fault localization bias in benchmarking automated program repair systems

Proceedings - 2019 IEEE 12th International Conference on Software Testing, Verification and Validation, ICST 2019
2019 | Conference paper
EID:

2-s2.0-85064184355

Contributors: Liu, K.; Koyuncu, A.; Bissyande, T.F.; Kim, D.; Klein, J.; Le Traon, Y.
Source: Self-asserted source
Dongsun Kim via Scopus - Elsevier

Watch out for this commit! A study of influential software changes

Journal of Software: Evolution and Process
2019-12 | Journal article
Contributors: Daoyuan Li; Li Li; Dongsun Kim; Tegawendé F. Bissyandé; David Lo; Yves Le Traon
Source: check_circle
Crossref
grade
Preferred source (of 2)‎

A closer look at real-world patches

Proceedings - 2018 IEEE International Conference on Software Maintenance and Evolution, ICSME 2018
2018 | Conference paper
EID:

2-s2.0-85058333823

Contributors: Liu, K.; Kim, D.; Koyuncu, A.; Li, L.; Bissyande, T.F.; Le Traon, Y.
Source: Self-asserted source
Dongsun Kim via Scopus - Elsevier

Augmenting and structuring user queries to support efficient free-form code search

Empirical Software Engineering
2018 | Journal article
EID:

2-s2.0-85040983742

Part of ISSN: 15737616 13823256
Contributors: Sirres, R.; Bissyandé, T.F.; Kim, D.; Lo, D.; Klein, J.; Kim, K.; Traon, Y.L.
Source: Self-asserted source
Dongsun Kim via Scopus - Elsevier

AVATAR: Fixing Semantic Bugs with Fix Patterns of Static Analysis Violations

arXiv
2018 | Other
EID:

2-s2.0-85095190795

Part of ISSN: 23318422
Contributors: Liu, K.; Koyuncu, A.; Kim, D.; Bissyandé, T.F.
Source: Self-asserted source
Dongsun Kim via Scopus - Elsevier

Bench4BL: Reproducibility study on the performance of IR-based bug localization

ISSTA 2018 - Proceedings of the 27th ACM SIGSOFT International Symposium on Software Testing and Analysis
2018 | Conference paper
EID:

2-s2.0-85051503714

Contributors: Lee, J.; Kim, D.; Bissyandé, T.F.; Jung, W.; Le Traon, Y.
Source: Self-asserted source
Dongsun Kim via Scopus - Elsevier

FACoY: A code-to-code search engine

Proceedings - International Conference on Software Engineering
2018 | Conference paper
EID:

2-s2.0-85049382246

Part of ISSN: 02705257
Contributors: Kim, K.; Kim, D.; Bissyandé, T.F.; Choi, E.; Li, L.; Klein, J.; Traon, Y.L.
Source: Self-asserted source
Dongsun Kim via Scopus - Elsevier

FixMiner: Mining relevant fix patterns for automated program repair

arXiv
2018 | Other
EID:

2-s2.0-85094486714

Part of ISSN: 23318422
Contributors: Koyuncu, A.; Liu, K.; Bissyande, T.F.; Kim, D.; Klein, J.; Monperrus, M.; Traon, Y.L.
Source: Self-asserted source
Dongsun Kim via Scopus - Elsevier

Impact of tool support in patch construction

arXiv
2018 | Other
EID:

2-s2.0-85095252627

Part of ISSN: 23318422
Contributors: Koyuncu, A.; Klein, J.; Bissyandé, T.F.; Monperrus, M.; Kim, D.; Le Traon, Y.
Source: Self-asserted source
Dongsun Kim via Scopus - Elsevier

LSRepair: Live Search of Fix Ingredients for Automated Program Repair

Proceedings - Asia-Pacific Software Engineering Conference, APSEC
2018 | Conference paper
EID:

2-s2.0-85064149331

Part of ISSN: 15301362
Contributors: Liu, K.; Koyuncu, A.; Kim, K.; Kim, D.; Bissyande, T.F.
Source: Self-asserted source
Dongsun Kim via Scopus - Elsevier

You cannot fix what you cannot find: An investigation of fault localization bias in benchmarking automated program repair systems

arXiv
2018 | Other
EID:

2-s2.0-85095141724

Part of ISSN: 23318422
Contributors: Liu, K.; Koyuncu, A.; Bissyandé, T.F.; Kim, D.; Klein, J.; Le Trao, Y.
Source: Self-asserted source
Dongsun Kim via Scopus - Elsevier

Impact of tool support in patch construction

ISSTA 2017 - Proceedings of the 26th ACM SIGSOFT International Symposium on Software Testing and Analysis
2017 | Conference paper
EID:

2-s2.0-85026625753

Contributors: Koyuncu, A.; Bissyandé, T.F.; Kim, D.; Klein, J.; Monperrus, M.; Traon, Y.L.
Source: Self-asserted source
Dongsun Kim via Scopus - Elsevier

Mining fix patterns for findbugs violations

arXiv
2017 | Other
EID:

2-s2.0-85092868042

Part of ISSN: 23318422
Contributors: Liu, K.; Kim, D.; Bissyandé, T.F.; Yoo, S.; Le Traon, Y.
Source: Self-asserted source
Dongsun Kim via Scopus - Elsevier

Automatic identifier inconsistency detection using code dictionary

Empirical Software Engineering
2016 | Journal article
EID:

2-s2.0-84924262028

Part of ISSN: 15737616 13823256
Contributors: Kim, S.; Kim, D.
Source: Self-asserted source
Dongsun Kim via Scopus - Elsevier

“Overloaded! ” — A model-based approach to database stress testing

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
2016 | Book
EID:

2-s2.0-84981273802

Part of ISSN: 16113349 03029743
Contributors: Meira, J.A.; de Almeida, E.C.; Kim, D.; Filho, E.R.L.; Le Traon, Y.
Source: Self-asserted source
Dongsun Kim via Scopus - Elsevier

API document quality for resolving deprecated APIs

Proceedings - Asia-Pacific Software Engineering Conference, APSEC
2014 | Conference paper
EID:

2-s2.0-84951739587

Part of ISSN: 15301362
Contributors: Ko, D.; Ma, K.; Park, S.; Kim, S.; Kim, D.; Traon, Y.L.
Source: Self-asserted source
Dongsun Kim via Scopus - Elsevier

Automatic patch generation learned from human-written patches

Proceedings - International Conference on Software Engineering
2013 | Conference paper
EID:

2-s2.0-84886385527

Part of ISSN: 02705257
Contributors: Kim, D.; Nam, J.; Song, J.; Kim, S.
Source: Self-asserted source
Dongsun Kim via Scopus - Elsevier
Items per page:
Page 1 of 2

Peer review (12 reviews for 4 publications/grants)

Review activity for Automated software engineering. (1)
Review activity for Empirical software engineering. (8)
Review activity for Information and software technology. (1)
Review activity for Science of computer programming. (2)