Personal information
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Employment (2)
Employment
Source:
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IS - Brno University of Technology
2016-09-26
to
present
Employment
Source:
Tomáš Pikálek
Works (19)
Neurophotonics
2024-01-19
|
Journal article
Contributors:
Hana Uhlířová;
Miroslav Stibůrek;
Tomáš Pikálek;
André Gomes;
Sergey Turtaev;
Petra Kolbábková;
Tomáš Čižmár
Source:
Tomáš Pikálek
Nature Communications
2023
|
Journal article
Contributors:
Stiburek, Miroslav;
Ondrackova, Petra;
Tuckova, Tereza;
Turtaev, Sergey;
Siler, Martin;
Pikalek, Tomas;
Jakl, Petr;
Gomes, Andre;
Krejci, Jana;
Kolbabkova, Petra
et al.
Source:
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Web of Science Researcher Profile Sync
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2)
Proceedings of SPIE - The International Society for Optical Engineering
2022
|
Conference paper
Contributors:
Stiburek, Miroslav;
Jakl, Petr;
Pikalek, Tomas;
Ondrackova, Petra;
Cizmar, Tomas
Source:
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Web of Science Researcher Profile Sync
Biomedical Optics Express
2022-02-01
|
Journal article
Contributors:
Tomáš Pikálek;
Miroslav Stibůrek;
Stephen Simpson;
Tomáš Čižmár;
Johanna Trägårdh
Source:
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Crossref
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2)
Source:
Tomáš Pikálek
grade
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3)
Source:
Tomáš Pikálek
grade
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(of
3)
Proceedings of SPIE - The International Society for Optical Engineering
2020
|
Conference paper
Contributors:
Tragardh, Johanna;
Pikalek, Tomas;
Sery, Mojmir;
Akimov, Denis;
Meyer, Tobias;
Popp, Jurgen;
Cizmar, Tomas
Source:
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Web of Science Researcher Profile Sync
Optics Express
2019
|
Journal article
EID:
2-s2.0-85073542251
Part of
ISBN:
10944087
Contributors:
Trägårdh, J.;
Pikálek, T.;
Šerý, M.;
Meyer, T.;
Popp, J.;
Čižmár, T.
Source:
Tomáš Pikálek
via
Scopus - Elsevier
grade
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(of
3)
Progress in Biomedical Optics and Imaging - Proceedings of SPIE
2019
|
Conference paper
EID:
2-s2.0-85066633916
Part of
ISBN:
16057422
Contributors:
Trägårdh, J.;
Pikálek, T.;
Simpson, S.;
Jákl, P.;
Šiler, M.;
Tyc, T.;
Čižmár, T.
Source:
Tomáš Pikálek
via
Scopus - Elsevier
grade
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(of
2)
Optics Express
2019
|
Journal article
EID:
2-s2.0-85072710865
Part of
ISBN:
10944087
Contributors:
Pikálek, T.;
Trägårdh, J.;
Simpson, S.;
Čižmár, T.
Source:
Tomáš Pikálek
via
Scopus - Elsevier
grade
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(of
3)
Source:
Tomáš Pikálek
grade
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(of
4)
Speckle 2018: VII International Conference on Speckle Metrology
2018-09-07
|
Conference paper
Source:
Tomáš Pikálek
grade
Preferred source
(of
3)
METAL 2017 - 26th International Conference on Metallurgy and Materials, Conference Proceedings
2017
|
Conference paper
EID:
2-s2.0-85043373332
Contributors:
Holzer, J.;
Pikálek, T.;
Buchta, Z.;
Lazar, J.;
Tinoco, H.A.;
Chlupová, A.;
Kruml, T.
Source:
Tomáš Pikálek
via
Scopus - Elsevier
International Conference on Metallurgy and Materials (Metal)
2017
|
Journal article
Contributors:
Holzer, Jakub;
Pikalek, Tomas;
Buchta, Zdenek;
Lazar, Josef;
Tinoco Hector, A.;
Chlupova, Alice;
Kruml, Tomas
Source:
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Web of Science Researcher Profile Sync
Proceedings of SPIE - The International Society for Optical Engineering
2017
|
Conference paper
EID:
2-s2.0-85029152818
Contributors:
Pikálek, T.;
Šarbort, M.;
Číp, O.;
Pham, M.T.;
Lešundák, A.;
Pravdová, L.;
Buchta, Z.
Source:
Tomáš Pikálek
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Precision Engineering
2017
|
Journal article
EID:
2-s2.0-85016490864
Contributors:
Buchta, Z.;
Šarbort, M.;
Čížek, M.;
Hucl, V.;
Řeřucha, Š.;
Pikálek, T.;
Dvořáčková, Š.;
Dvořáček, F.;
Kůr, J.;
Konečný, P.
et al.
Source:
Tomáš Pikálek
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Proceedings of SPIE - The International Society for Optical Engineering
2016
|
Conference paper
EID:
2-s2.0-85011672191
Contributors:
Buchta, Z.;
Šarbort, M.;
Čížek, M.;
Hucl, V.;
Šeucha, S.;
Pikálek, T.;
Dvořáčková, S.;
Dvorácek, F.;
Kurd, J.;
Konecný, P.
et al.
Source:
Tomáš Pikálek
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Applied Optics
2015
|
Journal article
EID:
2-s2.0-84942370641
Contributors:
Pikalek, T.;
Buchta, Z.
Source:
Tomáš Pikálek
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Applied Optics
2014
|
Journal article
EID:
2-s2.0-84942368169
Contributors:
Pikálek, T.;
Fořt, T.;
Buchta, Z.
Source:
Tomáš Pikálek
via
Scopus - Elsevier
grade
Preferred source
(of
2)