Biography

Chadwin D. Young received his B.S. degree in Electrical Engineering from the Univ. of Texas at Austin in 1996 and his M.S. and Ph.D. in EE from the North Carolina State University in 1998 and 2004, respectively. In 2001, he joined SEMATECH where he completed his dissertation research on high-k gate stacks and continued this research at SEMATECH working up to Senior Member of the Technical Staff on electrical characterization and reliability methodologies for the evaluation of high-k gate stacks on current and future device architectures. He joined the Materials Science and Engineering and Electrical Engineering Departments in September 2012 where his research focus is on electrical characterization and reliability methodologies for the evaluation of future materials and devices. He is NSF CAREER Award recipient, and has authored or co-authored 325+ journal, conference and invited papers. He has served: on the management or technical program committees of IIRW, IRPS, SISC, IEDM, WoDiM, SNW; as Guest Editor for IEEE Transactions on Device and Materials Reliability; and as a peer reviewer for several journals. He is currently a Senior Member of IEEE and serves as a Device Reliability Physics Committee Member of the IEEE Electron Device Society.