Personal information
Machine Learning, Signal Processing, Optimization, Fault Detection, Control
Activities
Employment (1)
2019-03-31
to
present
(Electronic Systems)
Employment
Source:
Kamal Jafarian
Works (11)
Applied Soft Computing Journal
2020
|
Journal article
EID:
2-s2.0-85085088141
Contributors:
Jafarian, K.;
Vahdat, V.;
Salehi, S.;
Mobin, M.
Source:
Kamal Jafarian
via
Scopus - Elsevier
Journal of Medical and Biological Engineering
2020
|
Journal article
EID:
2-s2.0-85076501025
Contributors:
Alaodolehei, B.;
Jafarian, K.;
Sheikhani, A.;
Beni, H.M.
Source:
Kamal Jafarian
via
Scopus - Elsevier
Clinical Science
2018
|
Journal article
EID:
2-s2.0-85058740042
Contributors:
Jafarian, K.;
Hassani, K.;
Doyle, D.J.;
Lahiji, M.N.;
Moghaddam, O.M.;
Saket, A.;
Majidi, M.;
Izadi, F.
Source:
Kamal Jafarian
via
Scopus - Elsevier
Measurement: Journal of the International Measurement Confederation
2018
|
Journal article
EID:
2-s2.0-85049907935
Contributors:
Jafarian, K.;
Mobin, M.;
Jafari-Marandi, R.;
Rabiei, E.
Source:
Kamal Jafarian
via
Scopus - Elsevier
Journal of Clinical Monitoring and Computing
2017
|
Journal article
EID:
2-s2.0-84965009964
Contributors:
Atefvahid, P.;
Hassani, K.;
Jafarian, K.;
Doyle, D.J.;
Ahmadi, H.
Source:
Kamal Jafarian
via
Scopus - Elsevier
IFMBE Proceedings
2017
|
Conference paper
EID:
2-s2.0-85018579254
Contributors:
Hassani, K.;
Jafarian, K.;
John Doyle, D.
Source:
Kamal Jafarian
via
Scopus - Elsevier
67th Annual Conference and Expo of the Institute of Industrial Engineers 2017
2017
|
Conference paper
EID:
2-s2.0-85031005051
Contributors:
Jafarian, K.;
Mobin, M.
Source:
Kamal Jafarian
via
Scopus - Elsevier
Journal of Clinical Monitoring and Computing
2016
|
Journal article
EID:
2-s2.0-84957882563
Contributors:
Jafarian, K.;
Amineslami, M.;
Hassani, K.;
Navidbakhsh, M.;
Lahiji, M.N.;
Doyle, D.J.
Source:
Kamal Jafarian
via
Scopus - Elsevier
IFMBE Proceedings
2016
|
Conference paper
EID:
2-s2.0-84968615961
Contributors:
Hassani, K.;
Jafarian, K.
Source:
Kamal Jafarian
via
Scopus - Elsevier
Proceedings of the International Conference on Industrial Engineering and Operations Management
2016
|
Conference paper
EID:
2-s2.0-84992331307
Contributors:
Jafarian, K.;
Mobin, M.;
Honarkar, Z.
Source:
Kamal Jafarian
via
Scopus - Elsevier
2016 4th International Conference on Control, Instrumentation, and Automation, ICCIA 2016
2016
|
Conference paper
EID:
2-s2.0-84978525575
Contributors:
Jafarian, K.;
Darjani, M.;
Honarkar, Z.
Source:
Kamal Jafarian
via
Scopus - Elsevier