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Other IDs

Scopus Author ID: 57211012109

Keywords

Silicon Germanium, Total-Ionizing Dose, Single-Event Effects, Cryogenic Electronics, Radiation Effects, RFIC, Millimeter Wave, Reliability

Countries

United States

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Employment (1)

The Aerospace Corporation: El Segundo, US

2024-08 to present | Senior Member of Technical Staff (Microelectronics Reliability and Radiation Effects)
Employment
Source: Self-asserted source
Jeffrey W. Teng

Education and qualifications (2)

Georgia Institute of Technology: Atlanta, US

2019-01 to 2023-05 | Doctor of Philosophy (School of Electrical and Computer Engineering)
Education
Source: Self-asserted source
Jeffrey W. Teng

Georgia Institute of Technology: Atlanta, US

2014 to 2018 | Bachelor of Science (School of Electrical and Computer Engineering)
Education
Source: Self-asserted source
Jeffrey W. Teng

Professional activities (1)

IEEE: New York, NY, US

Membership
Source: Self-asserted source
Jeffrey W. Teng
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