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Biography
Yuhang Sun received his Ph.D in Electrical Engineering from University of Minnesota, Twin Cities, performing in-depth transport mechanism study of metal oxide thin film transistors, and well as interface property of various high-k dielectric materials.
After graduation, Dr. Sun joined Micron Technology and lead the electrical characterization program for a disruptive DRAM prototype, as well as developing the first-in-industry inline high frequency measurement system.
Activities
Employment (2)
2021-01
to
present
Employment
Source:
Yuhang Sun
2016-09
to
2020-12
Employment
Source:
Yuhang Sun
Works (8)
2021 Device Research Conference (DRC)
2021-06-20
|
Conference paper
Contributors:
Neel Chatterjee;
Yuhang Sun;
Sarah L. Swisher
Source:
Yuhang Sun
Advanced Electronic Materials
2021-05
|
Journal article
Contributors:
Yuhang Sun;
Junkyu Kim;
Neel Chatterjee;
Sarah L. Swisher
Source:
check_circle
Crossref
2021 IEEE International Reliability Physics Symposium (IRPS)
2021-03
|
Conference paper
Contributors:
Jifa Hao;
Yuhang Sun;
Amartya Ghosh
Source:
Yuhang Sun
Journal of Materials Chemistry C
2018
|
Journal article
Contributors:
Yuhang Sun;
Preston D. Donaldson;
Javier Garcia-Barriocanal;
Sarah L. Swisher
Source:
check_circle
Crossref
IEEE Sensors Journal
2018-03-15
|
Journal article
Contributors:
Yuhang Sun;
Debao Zhou;
Jing Bai;
Eliah J. Hauser;
Shufang Wang
Source:
Yuhang Sun
grade
Preferred source
(of
2)
2017 IEEE 17th International Conference on Nanotechnology (IEEE-NANO)
2017-07
|
Conference paper
Contributors:
Yuhang Sun;
Jing Bai;
Debao Zhou
Source:
Yuhang Sun
IEEE Sensors Journal
2016-03
|
Journal article
Contributors:
Debao Zhou;
Yuhang Sun;
Jing Bai;
Eliah J. Hauser;
Shufang Wang;
Baoguo Han
Source:
Yuhang Sun
Scientific Reports
2015-11-19
|
Journal article
Contributors:
Zhuo Han;
Zhihong Tang;
Yuhang Sun;
Junhe Yang;
Linjie Zhi
Source:
Yuhang Sun