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Employment (1)

Imec: Leuven, BE

Employment
Source: Self-asserted source
Alessio Spessot

Education and qualifications (1)

University of Modena and Reggio Emilia: Modena, IT

2004-01-01 to 2006-12-31 | Solid State Physics PhD
Education
Source: Self-asserted source
Alessio Spessot

Works (5)

Multitimescale Mitigation for Performance Variability Improvement in Time-Critical Systems

IEEE Transactions on Very Large Scale Integration (VLSI) Systems
2022-11 | Journal article
DOI: 10.1109/TVLSI.2022.3177861
Contributors: Ji-Yung Lin; Pieter Weckx; Subrat Mishra; Alessio Spessot; Francky Catthoor
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A Holistic Evaluation of Buried Power Rails and Back-Side Power for Sub-5 nm Technology Nodes

IEEE Transactions on Electron Devices
2022-08 | Journal article
DOI: 10.1109/TED.2022.3186657
Contributors: S. S. Teja Nibhanupudi; Divya Prasad; Shidhartha Das; Odysseas Zografos; Alex Robinson; Anshul Gupta; Alessio Spessot; Peter Debacker; Diederik Verkest; Julien Ryckaert et al.
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Crossref

Stress in Silicon–Germanium Nanowires: Layout Dependence and Imperfect Source/Drain Epitaxial Stressors

IEEE Transactions on Electron Devices
2021-11 | Journal article
DOI: 10.1109/TED.2021.3076754
Contributors: Geert Eneman; Anabela Veloso; Paola Favia; Andriy Hikavyy; Clement Porret; Hiroaki Arimura; An De Keersgieter; Geoffrey Pourtois; Roger Loo; Alessio Spessot et al.
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Crossref

Monte Carlo Comparison of n-Type and p-Type Nanosheets With FinFETs: Effect of the Number of Sheets

IEEE Transactions on Electron Devices
2020-11 | Journal article
DOI: 10.1109/TED.2020.3024267
Contributors: F. M. Bufler; D. Jang; G. Hellings; G. Eneman; P. Matagne; A. Spessot; M. H. Na
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Crossref

1T-1C Dynamic Random Access Memory Status, Challenges, and Prospects

IEEE Transactions on Electron Devices
2020-04 | Journal article
DOI: 10.1109/TED.2020.2963911
Contributors: Alessio Spessot; Hyungrock Oh
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Crossref
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