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Employment (1)

North Eastern Regional Institute of Science and Technology: Nirjuli, Arunachal Pradesh, IN

2006-07-03 to present | Associate Professor (Electronics and Comm Engg)
Employment
Source: Self-asserted source
Ashok Kumar Ray

Education and qualifications (3)

Indian Institute of Technology Guwahati: Guwahati, Assam, IN

PhD (Electronics and ELectrical Engg)
Education
Source: Self-asserted source
Ashok Kumar Ray

Indian Institute of Technology Bombay: Mumbai, Maharashtra, IN

2010-07 to 2012-06 | Masters of Technology in Microelectronics (Electrical Engineering)
Education
Source: Self-asserted source
Ashok Kumar Ray

North Eastern Regional Institute of Science and Technology: Nirjuli, Arunachal Pradesh, IN

1998-07 to 2002-05 | B Tech (Electronics and Comm Engg)
Education
Source: Self-asserted source
Ashok Kumar Ray

Professional activities (1)

IEEE: New York, NY, US

Member
Membership
Source: Self-asserted source
Ashok Kumar Ray

Works (18)

2nd International Conference on Computational Intelligence and Internet of Things (ICCIIoT 2021)

Journal of Physics: Conference Series
2022 | Conference paper
EID:

2-s2.0-85128950391

Part of ISSN: 17426596 17426588
Contributors: Kumar, R.; Ray, A.; Kesswani, N.; Lin, F.; Patel, A.; Trivedi, G.; Kishorjit Singh, N.
Source: Self-asserted source
Ashok Kumar Ray via Scopus - Elsevier

Access Region Stack Engineering for Mitigation of Degradation in AlGaN/GaN HEMTs with Field Plate

IEEE Transactions on Device and Materials Reliability
2022 | Journal article
EID:

2-s2.0-85124755661

Part of ISSN: 15582574 15304388
Contributors: Bordoloi, S.; Ray, A.; Trivedi, G.
Source: Self-asserted source
Ashok Kumar Ray via Scopus - Elsevier

Investigation of Electric Field Profile and associated parameters with Embedded Metal Layer in Field Plate AlGaN/GaN HEMTs

Journal of Physics: Conference Series
2022 | Conference paper
EID:

2-s2.0-85128888546

Part of ISSN: 17426596 17426588
Contributors: Bordoloi, S.; Ray, A.; Barman, P.; Trivedi, G.
Source: Self-asserted source
Ashok Kumar Ray via Scopus - Elsevier

A Numerical Investigation of Heat Suppression in HEMT for Power Electronics Application

Silicon
2021 | Journal article
EID:

2-s2.0-85089739732

Part of ISSN: 18769918 1876990X
Contributors: Arivazhagan, L.; Nirmal, D.; Reddy, P.P.K.; Ajayan, J.; Godfrey, D.; Prajoon, P.; Ray, A.
Source: Self-asserted source
Ashok Kumar Ray via Scopus - Elsevier

Introspection into reliability aspects in AlGaN/GaN HEMTs with gate geometry modification

IEEE Access
2021 | Journal article
EID:

2-s2.0-85110814451

Part of ISSN: 21693536
Contributors: Bordoloi, S.; Ray, A.; Trivedi, G.
Source: Self-asserted source
Ashok Kumar Ray via Scopus - Elsevier

Numerical analysis of the Impact of Gate Geometry variations on the Reliability of AlGaN/GaN HEMT

2021 IEEE 4th International Conference on Computing, Power and Communication Technologies, GUCON 2021
2021 | Conference paper
EID:

2-s2.0-85119098166

Contributors: Bordoloi, S.; Ray, A.; Trivedi, G.
Source: Self-asserted source
Ashok Kumar Ray via Scopus - Elsevier

Numerical Simulation of Enhanced-Reliability Filleted-Gate AlGaN/GaN HEMT

Journal of Electronic Materials
2020 | Journal article
EID:

2-s2.0-85077572483

Part of ISSN: 1543186X 03615235
Contributors: Ray, A.; Bordoloi, S.; Sarkar, B.; Agarwal, P.; Trivedi, G.
Source: Self-asserted source
Ashok Kumar Ray via Scopus - Elsevier

Current collapse reduction technique using N–doped buffer layer into the bulk region of a gate injection transistor

Proceedings - 32nd International Conference on VLSI Design, VLSID 2019 - Held concurrently with 18th International Conference on Embedded Systems, ES 2019
2019 | Conference paper
EID:

2-s2.0-85066912307

Contributors: Bharadwaj, K.; Ray, A.; Bordoloi, S.; Trivedi, G.
Source: Self-asserted source
Ashok Kumar Ray via Scopus - Elsevier

Simulation framework for GaN devices with special mention to reliability concern

VLSI and Post-CMOS Electronics
2019 | Book
EID:

2-s2.0-85118358430

Contributors: Bordoloi, S.; Ray, A.; Trivedi, G.
Source: Self-asserted source
Ashok Kumar Ray via Scopus - Elsevier

Basic CMOS gate design by mixed-mode analysis of step-channel TMDG-MOSFET

Proceedings - 2017 IEEE International Symposium on Nanoelectronic and Information Systems, iNIS 2017
2018 | Conference paper
EID:

2-s2.0-85052365452

Contributors: Kumar, P.; Zaman, S.S.; Sarma, M.P.; Ray, A.; Trivedi, G.
Source: Self-asserted source
Ashok Kumar Ray via Scopus - Elsevier

Design and simulation of SF-FinFET and SD-FinFET and their performance in analog, RF and digital applications

Proceedings - 2017 IEEE International Symposium on Nanoelectronic and Information Systems, iNIS 2017
2018 | Conference paper
EID:

2-s2.0-85052400975

Contributors: Zaman, S.S.; Kumar, P.; Sarma, M.P.; Ray, A.; Trivedi, G.
Source: Self-asserted source
Ashok Kumar Ray via Scopus - Elsevier

Fast Ionization-Front-Induced Anomalous Switching Behavior in Trigger Bipolar Transistors of Marx-Bank Circuits under Base-Drive Conditions

IEEE Transactions on Plasma Science
2018 | Journal article
EID:

2-s2.0-85047639527

Part of ISSN: 00933813
Contributors: Sinha, D.K.; Ansari, M.S.; Ray, A.; Trivedi, G.; Chatterjee, A.; Schrimpf, R.D.
Source: Self-asserted source
Ashok Kumar Ray via Scopus - Elsevier

An FEM based framework to simulate semiconductor devices using streamline upwind Petrov-Galerkin stabilization technique

2017 27th International Conference Radioelektronika, RADIOELEKTRONIKA 2017
2017 | Conference paper
EID:

2-s2.0-85025691112

Contributors: Kumar, G.; Singh, M.; Ray, A.; Trivedi, G.
Source: Self-asserted source
Ashok Kumar Ray via Scopus - Elsevier

FEM based device simulator for high voltage devices

Communications in Computer and Information Science
2017 | Book
EID:

2-s2.0-85039455536

Part of ISSN: 18650929
Contributors: Ray, A.; Kumar, G.; Bordoloi, S.; Sinha, D.K.; Agarwal, P.; Trivedi, G.
Source: Self-asserted source
Ashok Kumar Ray via Scopus - Elsevier

Implementation of Jacobi iterative solver in verilog HDL

2016 2nd International Conference on Control, Instrumentation, Energy and Communication, CIEC 2016
2016 | Conference paper
EID:

2-s2.0-84980004975

Contributors: Tamuli, M.; Debnath, S.; Ray, A.; Majumdar, S.
Source: Self-asserted source
Ashok Kumar Ray via Scopus - Elsevier

A review on accelerating scientific computations using the Conjugate Gradient method

2015 International Conference on Electronic Design, Computer Networks and Automated Verification, EDCAV 2015
2015 | Conference paper
EID:

2-s2.0-84936154194

Contributors: Debnath, S.; Tamuli, M.; Ray, A.; Trivedi, G.
Source: Self-asserted source
Ashok Kumar Ray via Scopus - Elsevier

Multi-purpose auto-programmable reconfigurable embedded system architecture

2015 International Conference on Electronic Design, Computer Networks and Automated Verification, EDCAV 2015
2015 | Conference paper
EID:

2-s2.0-84936158732

Contributors: Ansh; Yadav, R.; Deb, D.; Ray, A.
Source: Self-asserted source
Ashok Kumar Ray via Scopus - Elsevier

Optimization of a plasma immersion ion implantation process for shallow junctions in silicon

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
2014 | Journal article
EID:

2-s2.0-84907888683

Part of ISSN: 15208559 07342101
Contributors: Ray, A.; Nori, R.; Bhatt, P.; Lodha, S.; Pinto, R.; Rao, V.R.; Jomard, F.; Neumann-Spallart, M.
Source: Self-asserted source
Ashok Kumar Ray via Scopus - Elsevier