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Electron phase contrast imaging, Ptychography, Electron beam shaping, Phase plates, Cryogenic electron microscopy, In situ electron microscopy, Electron beam lithography
Germany

Biography

Penghan Lu is currently working in Prof. Rafal Dunin-Borkowski’s group at the Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons in Research Centre Jülich. His current research activities mostly focus on methodology and instrumentation development in electron microscopy, particularly by applying non-conventional optical setup and custom-designed hardware components to specific applications. This includes, but not limited to, low-dose electron phase contrast imaging (iDPC, ptychography, holography, etc.) for challenging materials and biological specimen characterisation, as well as electron beam shaping using thin film masks and structured electromagnetic fields for aberration correction, phase plate, vortex beam, structured illumination, etc. His research interests also involve cryogenic electron microscopy, in situ electron microscopy, as well as micro- and nano-fabrication using electron beam lithography and focused ion beam.

Activities

Employment (1)

Forschungszentrum Jülich: Jülich, North Rhine-Westphalia, DE

2015-08-01 to present | Doctoral researcher (PGI-5/ER-C 1)
Employment
Source: Self-asserted source
Peng-Han Lu

Education and qualifications (3)

RWTH Aachen University: Aachen, North Rhine-Westphalia, DE

2015-08 to present | Ph.D. (Department of Physics)
Education
Source: Self-asserted source
Peng-Han Lu

Xi'an Jiaotong University: Xi'an, Shaanxi, CN

2012-09 to 2015-06 | M.E. (School of Materials Science and Engineering)
Education
Source: Self-asserted source
Peng-Han Lu

Xi'an Jiaotong University: Xi'an, Shaanxi, CN

2008-09 to 2012-07 | B.E. (School of Energy and Power Engineering)
Education
Source: Self-asserted source
Peng-Han Lu

Works (28)

Continuous illumination picosecond imaging using a delay line detector in a transmission electron microscope

Ultramicroscopy
2022-03 | Journal article
Part of ISSN: 0304-3991
Source: Self-asserted source
Peng-Han Lu

Imaging biological macromolecules in thick specimens: The role of inelastic scattering in cryoEM

Ultramicroscopy
2022-03 | Journal article
Part of ISSN: 0304-3991
Source: Self-asserted source
Peng-Han Lu

Efficient large field of view electron phase imaging using near-field electron ptychography with a diffuser

Ultramicroscopy
2021 | Journal article
EID:

2-s2.0-85103279640

Part of ISSN: 18792723 03043991
Contributors: Allars, F.; Lu, P.-H.; Kruth, M.; Dunin-Borkowski, R.E.; Rodenburg, J.M.; Maiden, A.M.
Source: Self-asserted source
Peng-Han Lu via Scopus - Elsevier

Experimental Demonstration of an Electrostatic Orbital Angular Momentum Sorter for Electron Beams

Physical Review Letters
2021 | Journal article
EID:

2-s2.0-85102183240

Part of ISSN: 10797114 00319007
Contributors: Tavabi, A.H.; Rosi, P.; Rotunno, E.; Roncaglia, A.; Belsito, L.; Frabboni, S.; Pozzi, G.; Gazzadi, G.C.; Lu, P.-H.; Nijland, R. et al.
Source: Self-asserted source
Peng-Han Lu via Scopus - Elsevier

Shaping of Electron Beams Using Sculpted Thin Films

ACS Photonics
2021-12-15 | Journal article
Part of ISSN: 2330-4022
Part of ISSN: 2330-4022
Source: Self-asserted source
Peng-Han Lu

Peristalsis-like migration of carbon-metabolizing catalytic nanoparticles

Extreme Mechanics Letters
2021-11 | Journal article
Part of ISSN: 2352-4316
Source: Self-asserted source
Peng-Han Lu

Experimental realization of a π/2 vortex mode converter for electrons using a spherical aberration corrector

Ultramicroscopy
2021-10 | Journal article
Part of ISSN: 0304-3991
Source: Self-asserted source
Peng-Han Lu

Single-particle cryo-EM: alternative schemes to improve dose efficiency

Journal of Synchrotron Radiation
2021-09-01 | Journal article
Part of ISSN: 1600-5775
Source: Self-asserted source
Peng-Han Lu

How much can inelastically scattered electrons contribute to electron cryotomography of biological specimens?

Microscopy and Microanalysis
2021-08 | Conference abstract
Part of ISSN: 1431-9276
Part of ISSN: 1435-8115
Source: Self-asserted source
Peng-Han Lu

Voltage-controlled three-electron-beam interference by a three-element Boersch phase shifter with top and bottom shielding electrodes

2021 34th International Vacuum Nanoelectronics Conference (IVNC)
2021-07-05 | Conference paper
Source: Self-asserted source
Peng-Han Lu

Corrigendum to “Spherical aberration correction in a scanning transmission electron microscope using a sculpted thin film” [Ultramicroscopy 189 (2018) 46–53] (Ultramicroscopy (2018) 189 (46–53), (S0304399117305259), (10.1016/j.ultramic.2018.03.016))

Ultramicroscopy
2020 | Journal article
EID:

2-s2.0-85084699757

Part of ISSN: 18792723 03043991
Contributors: Shiloh, R.; Remez, R.; Lu, P.-H.; Jin, L.; Lereah, Y.; Tavabi, A.H.; Dunin-Borkowski, R.E.; Arie, A.
Source: Self-asserted source
Peng-Han Lu via Scopus - Elsevier

Demonstration of the voltage-controlled three-beam interference of high-energy coherent electron beam

33rd International Vacuum Nanoelectronics Conference, IVNC 2020
2020 | Conference paper
EID:

2-s2.0-85092720492

Contributors: Thakkar, P.; Guzenko, V.; Abrahams, J.P.; Tsujino, S.; Lu, P.H.; Dunin-Borkowski, R.E.
Source: Self-asserted source
Peng-Han Lu via Scopus - Elsevier

Design of electrostatic phase elements for sorting the orbital angular momentum of electrons

Ultramicroscopy
2020 | Journal article
EID:

2-s2.0-85073987285

Part of ISSN: 18792723 03043991
Contributors: Pozzi, G.; Grillo, V.; Lu, P.-H.; Tavabi, A.H.; Karimi, E.; Dunin-Borkowski, R.E.
Source: Self-asserted source
Peng-Han Lu via Scopus - Elsevier

Fabrication of low aspect ratio three-element Boersch phase shifters for voltage-controlled three electron beam interference

Journal of Applied Physics
2020 | Journal article
EID:

2-s2.0-85092394785

Part of ISSN: 10897550 00218979
Contributors: Thakkar, P.; Guzenko, V.A.; Lu, P.-H.; Dunin-Borkowski, R.E.; Abrahams, J.P.; Tsujino, S.
Source: Self-asserted source
Peng-Han Lu via Scopus - Elsevier

Design, Realization and Challenges of an Orbital Angular Momentum Sorter: A New Instrument for Phase Microscopy

Microscopy and Microanalysis
2020-08 | Conference abstract
Part of ISSN: 1431-9276
Part of ISSN: 1435-8115
Source: Self-asserted source
Peng-Han Lu

Generation of electron vortices using nonexact electric fields

Physical Review Research
2020-02-21 | Journal article
Part of ISSN: 2643-1564
Source: Self-asserted source
Peng-Han Lu

Etching-Assisted Route to Heterophase Au Nanowires with Multiple Types of Active Surface Sites for Silane Oxidation

Nano Letters
2019 | Journal article
EID:

2-s2.0-85070907717

Part of ISSN: 15306992 15306984
Contributors: Wang, C.; Li, X.; Jin, L.; Lu, P.-H.; Dejoie, C.; Zhu, W.; Wang, Z.; Bi, W.; Dunin-Borkowski, R.E.; Chen, K. et al.
Source: Self-asserted source
Peng-Han Lu via Scopus - Elsevier

Electron Ptychography of Single Biological Macromolecules

Microscopy and Microanalysis
2019-08 | Conference abstract
Part of ISSN: 1431-9276
Part of ISSN: 1435-8115
Source: Self-asserted source
Peng-Han Lu

Towards Ptychography with Structured Illumination, and a Derivative-Based Reconstruction Algorithm

Microscopy and Microanalysis
2019-08 | Conference abstract
Part of ISSN: 1431-9276
Part of ISSN: 1435-8115
Source: Self-asserted source
Peng-Han Lu

Nanostructuring of electron beams

Physica Scripta
2019-03-01 | Journal article
Part of ISSN: 0031-8949
Part of ISSN: 1402-4896
Source: Self-asserted source
Peng-Han Lu
grade
Preferred source (of 2)‎

Manipulation of dipolar magnetism in low-dimensional iron oxide nanoparticle assemblies

Physical Chemistry Chemical Physics
2019-02-25 | Journal article
Part of ISSN: 1463-9076
Part of ISSN: 1463-9084
Source: Self-asserted source
Peng-Han Lu
grade
Preferred source (of 2)‎

Spherical aberration correction in a scanning transmission electron microscope using a sculpted thin film

Ultramicroscopy
2018-03-27 | Journal article
Source: Self-asserted source
Peng-Han Lu
grade
Preferred source (of 2)‎

Towards a holographic approach to spherical aberration correction in scanning transmission electron microscopy

Optics Express
2017-08-30 | Journal article
Source: Self-asserted source
Peng-Han Lu
grade
Preferred source (of 2)‎

In-situ Observation of Shape Transformation and Surface Oxidation of Pd Nanocrystals

Microscopy and Microanalysis
2017-07 | Conference abstract
Part of ISSN: 1431-9276
Part of ISSN: 1435-8115
Source: Self-asserted source
Peng-Han Lu

Generation of electron vortex beams using line charges via the electrostatic Aharonov-Bohm effect

Ultramicroscopy
2017-06-02 | Journal article
Source: Self-asserted source
Peng-Han Lu
grade
Preferred source (of 2)‎

Measuring the orbital angular momentum spectrum of an electron beam

Nature Communications
2017-05-24 | Journal article
Source: Self-asserted source
Peng-Han Lu
grade
Preferred source (of 2)‎

Superoscillating electron wave functions with subdiffraction spots

Physical Review A
2017-03-22 | Journal article
Source: Self-asserted source
Peng-Han Lu
grade
Preferred source (of 2)‎

Realization of electron vortices with large orbital angular momentum using miniature holograms fabricated by electron beam lithography

Applied Physics Letters
2017-03-03 | Journal article
Source: Self-asserted source
Peng-Han Lu
grade
Preferred source (of 2)‎