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Employment (2)

Politecnico di TORINO: Torino, Piemonte, IT

2021-11-01 to 2025-11-01 | Dottorandi (Dipartimento di Automatica e Informatica)
Employment
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Politecnico di Torino - IRIS

Politecnico di TORINO: Torino, Piemonte, IT

2020-12-01 to 2021-11-01 | Assegnisti (Dipartimento di Automatica e Informatica)
Employment
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Politecnico di Torino - IRIS

Education and qualifications (1)

Politecnico di Torino: Torino, Piemonte, IT

Master of Science in Computer Engineering (DAUIN)
Education
Source: Self-asserted source
Francesco Angione

Works (13)

A System-Level Test Methodology for Communication Peripherals in System-on-Chips

2025-01-01 | Journal article
EID:

2-s2.0-85209892743

Source: check_circle
Politecnico di Torino - IRIS
grade
Preferred source (of 2)‎

A Flexible FPGA-based Test Equipment for Enabling Out-of-Production Manufacturing Test Flow of Digital Systems

2024-01-01 | Conference paper
Source: check_circle
Politecnico di Torino - IRIS

Optimizing System-Level Test Program Generation via Genetic Programming

2024-01-01 | Conference paper
EID:

2-s2.0-85197554216

WOSUID:

WOS:001260970400046

Source: check_circle
Politecnico di Torino - IRIS

A guided debugger-based fault injection methodology for assessing functional test programs

2023-01-01 | Conference paper
EID:

2-s2.0-85161861932

WOSUID:

WOS:001011806600036

Source: check_circle
Politecnico di Torino - IRIS

A Low-Cost Burn-In Tester Architecture to supply Effective Electrical Stress

2023-01-01 | Journal article
EID:

2-s2.0-85136893858

WOSUID:

WOS:000965082500018

Source: check_circle
Politecnico di Torino - IRIS
grade
Preferred source (of 3)‎

A Toolchain to Quantify Burn-In Stress Effectiveness on large Automotive System-on-Chips

2023-01-01 | Journal article
EID:

2-s2.0-85173060059

WOSUID:

WOS:001079902900001

Source: check_circle
Politecnico di Torino - IRIS
grade
Preferred source (of 2)‎

On the integration and hardening of Software Test Libraries in Real-Time Operating Systems

2023-01-01 | Conference paper
EID:

2-s2.0-85164709107

WOSUID:

WOS:001017764900014

Source: check_circle
Politecnico di Torino - IRIS

A novel Pattern Selection Algorithm to reduce the Test Cost of large Automotive Systems-on-Chip

2022-01-01 | Conference paper
EID:

2-s2.0-85142846358

WOSUID:

WOS:000903702200015

Source: check_circle
Politecnico di Torino - IRIS
grade
Preferred source (of 2)‎

An innovative Strategy to Quickly Grade Functional Test Programs

2022-01-01 | Conference paper
EID:

2-s2.0-85146143926

WOSUID:

WOS:000918580100040

Source: check_circle
Politecnico di Torino - IRIS
grade
Preferred source (of 2)‎

An Optimized Burn-In Stress Flow targeting Interconnections logic to Embedded Memories in Automotive Systems-on-Chip

2022-01-01 | Conference paper
EID:

2-s2.0-85134253786

WOSUID:

WOS:000853268100015

Source: check_circle
Politecnico di Torino - IRIS
grade
Preferred source (of 2)‎

Online scheduling of concurrent Memory BISTs execution at Real-Time Operating-System level

2022-01-01 | Conference paper
EID:

2-s2.0-85143755067

Source: check_circle
Politecnico di Torino - IRIS
grade
Preferred source (of 2)‎

Test, Reliability and Functional Safety trends for Automotive System-on-Chip

2022-01-01 | Conference abstract
Source: check_circle
Politecnico di Torino - IRIS

Test, Reliability and Functional Safety Trends for Automotive System-on-Chip

2022-01-01 | Conference paper
EID:

2-s2.0-85134232808

WOSUID:

WOS:000853268100012

Source: check_circle
Politecnico di Torino - IRIS
grade
Preferred source (of 2)‎