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V.E. Lashkaryov Institute of Semiconductor Physics NAS of Ukraine: Kyiv, UA

Principal Researcher / Prof. Dr. (Department of Physics of Optoelectronic Devices)
Employment
Source: Self-asserted source
Oleksandr Vlasenko

Works (50 of 100)

Items per page:
Page 1 of 2

Current-voltage characteristic and electroluminescence of UV LEDs 365 nm at liquid nitrogen temperature

Optica Applicata
2019 | Journal article
EID:

2-s2.0-85065822563

Contributors: Veleschuk, V.; Vlasenko, A.; Vlasenko, Z.; Petrenko, I.; Malyi, Y.; Borshch, V.; Borshch, O.; Shefer, A.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

Dependence of the CdTe melting threshold on the pulse duration and wavelength of laser radiation and the parameters of non-equilibrium charge carriers

Ukrainian Journal of Physics
2017 | Journal article
EID:

2-s2.0-85016130775

Contributors: Veleschuk, V.P.; Vlasenko, O.I.; Vlasenko, Z.K.; Gnatyuk, V.A.; Levytskyi, S.N.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

Laser-stimulated enhancement of the reflectance of single-crystalline n-GaAs(100)

Ukrainian Journal of Physics
2017 | Journal article
EID:

2-s2.0-85040526260

Contributors: Gentsar, P.O.; Vlasenko, O.I.; Levytskyi, S.M.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

Visible luminescence of the InGaN/GaN ultraviolet light-emitting diodes 365 nm

Journal of Nano- and Electronic Physics
2017 | Journal article
EID:

2-s2.0-85032703261

Contributors: Veleschuk, V.P.; Vlasenko, A.I.; Vlasenko, Z.K.; Khmil, D.N.; Kamuz, O.M.; Petrenko, I.V.; Tartachnyk, V.P.; Shulga, A.V.; Borshch, V.V.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

Capabilities of laser-induced marks as information carriers created in different materials

Journal of Laser Micro Nanoengineering
2016 | Journal article
EID:

2-s2.0-84994654235

Contributors: Gnatyuk, V.A.; Vlasenko, O.I.; Levytskyi, S.N.; Aoki, T.; Mizeikis, V.; Gagarsky, S.V.; Zelenska, K.S.; Gnatyuk, D.V.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

Characteristics and stability of diode type CdTe-based x-ray and gamma-ray detectors

2014 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2014
2016 | Conference paper
EID:

2-s2.0-84965062468

Contributors: Gnatyuk, V.A.; Vlasenko, O.I.; Aoki, T.; Koike, A.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

Modification of surface state of CdZnTe crystals and contact formation

2015 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2015
2016 | Conference paper
EID:

2-s2.0-84994157771

Contributors: Gnatyuk, V.A.; Vlasenko, O.I.; Levytskyi, S.N.; Aoki, T.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

Nonlinear laser ultrasound formation in silicon

AIP Advances
2016 | Journal article
EID:

2-s2.0-84992193594

Contributors: Voitenko, K.; Veleschuk, V.; Isaiev, M.; Kuzmich, A.; Lyashenko, O.; Vlasenko, O.; Melnychenko, M.; Malyarenko, E.; Zhelnakov, S.; Lysenko, V. et al.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

Acoustic response to the action of nanosecond laser pulses on an In/CdTe thin-film heterostructure

Physics of the Solid State
2015 | Journal article
EID:

2-s2.0-84935827940

Contributors: Vlasenko, A.I.; Veleshchuk, V.P.; Gnatyuk, V.A.; Levitskii, S.N.; Vlasenko, Z.K.; Ivlev, G.D.; Gatskevich, E.I.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

Effect of neutron irradiation on characteristics of power InGaN/GaN light-emitting diodes

Nuclear Physics and Atomic Energy
2015 | Journal article
EID:

2-s2.0-84962549173

Contributors: Vlasenko, A.I.; Veleschuk, V.P.; Vlasenko, Z.K.; Kisselyuk, M.P.; Lytovchenko, P.G.; Petrenko, I.V.; Tartachnyk, V.P.; Pinkovska, M.B.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

Electroluminescence of InGaN/GaN heterostructures at the reverse bias and nitrogen temperature

Optica Applicata
2015 | Journal article
EID:

2-s2.0-84954435903

Contributors: Veleschuk, V.; Vlasenko, A.; Kisselyuk, M.; Vlasenko, Z.; Khmil, D.; Borshch, V.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

Non-destructive control of critical defects and diagnostics of InGaN/GaN heterostructures in power LEDs by using their microplasma characteristics

Materials Research Express
2015 | Journal article
EID:

2-s2.0-84953439075

Contributors: Veleschuk, V.P.; Vlasenko, A.I.; Vlasenko, Z.K.; Kisselyuk, M.P.; Borshch, V.V.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

On the formation of nanostructures on a CdTe surface, stimulated by surface acoustic waves under nanosecond laser irradiation

Semiconductors
2015 | Journal article
EID:

2-s2.0-84923812850

Contributors: Vlasenko, A.I.; Baidullaeva, A.; Veleschuk, V.P.; Mozol, P.E.; Boiko, N.I.; Litvin, O.S.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

On the shift of the electroluminescence spectra of In<inf> x</inf>Ga<inf>1 − x</inf>N/GaN structures with various indium contents and various substrate materials caused by the stark effect and mechanical stresses

Semiconductors
2015 | Journal article
EID:

2-s2.0-84938300179

Contributors: Veleschuk, V.P.; Vlasenko, A.I.; Kisselyuk, M.P.; Vlasenko, Z.K.; Khmil’, D.N.; Borshch, V.V.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

Laser marking in transparent materials and mechanisms of laser-induced defect formation laser-induced marks as information carriers in digital encoding

2014 Fotonica AEIT Italian Conference on Photonics Technologies, Fotonica AEIT 2014
2014 | Conference paper
EID:

2-s2.0-84904497628

Contributors: Gnatyuk, V.A.; Vlasenko, O.I.; Levytskyi, S.N.; Gagarsky, S.V.; Zelenska, K.S.; Poperenko, L.V.; Aoki, T.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

Fabrication of high resolution X/γ-ray detectors using laser-induced doping of CdTe in liquid

IEEE Nuclear Science Symposium Conference Record
2013 | Conference paper
EID:

2-s2.0-84904205706

Contributors: Gnatyuk, V.A.; Vlasenko, O.I.; Aoki, T.; Koike, A.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

Microplasma breakdown of InGaN/GaN heterostructures in high-power light-emitting diodes

Journal of Applied Spectroscopy
2013 | Journal article
EID:

2-s2.0-84880595396

Contributors: Veleschuk, V.P.; Vlasenko, A.I.; Kisselyuk, M.P.; Lyashenko, O.V.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

Microplasmas avalanche breakdown as a diagnostic tool and reliability appreciating of the INGAN/GAN high-power LEDs

2013 22nd International Conference on Noise and Fluctuations, ICNF 2013
2013 | Conference paper
EID:

2-s2.0-84883684590

Contributors: Vcleschuk, V.P.; Vlasenko, A.I.; Kisselvuk, M.P.; Lyashenko, O.V.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

Surface processing of CdZnTe crystals

Proceedings of SPIE - The International Society for Optical Engineering
2012 | Conference paper
EID:

2-s2.0-84872908303

Contributors: Gnatyuk, V.A.; Vlasenko, O.I.; Levytskyi, S.N.; Dieguez, E.; Crocco, J.; Bensalah, H.; Fiederle, M.; Fauler, A.; Aoki, T.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

CdTe diode detectors with a p-n junction formed by laser-induced doping

IEEE Nuclear Science Symposium Conference Record
2011 | Conference paper
EID:

2-s2.0-84858687748

Contributors: Gnatyuk, V.A.; Aoki, T.; Vlasenko, O.I.; Levytskyi, S.N.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

Correlation of acoustic emission, light fluctuations surface and three-dimensional distribution EL intensity in InGaN/GaN structures

Proceedings of the IEEE 21st International Conference on Noise and Fluctuations, ICNF 2011
2011 | Conference paper
EID:

2-s2.0-80052743134

Contributors: Kisseluk, M.; Vlasenko, O.; Lyashenko, O.V.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

Gas discharge during degradation of indicating light-emitting diodes based on InGaN/GaN heterostructures in a polymer case

Journal of Applied Spectroscopy
2011 | Journal article
EID:

2-s2.0-79953280897

Contributors: Veleshchuk, V.P.; Vlasenko, A.I.; Lyashenko, O.V.; Kiselyuk, M.P.; Myagchenko, Y.A.; Chuprina, R.G.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

High resolution CdTe X- and gamma-ray detectors with a laser-formed p-n junction

Proceedings of SPIE - The International Society for Optical Engineering
2011 | Conference paper
EID:

2-s2.0-80055053044

Contributors: Gnatyuk, V.A.; Aoki, T.; Grushko, E.V.; Kosyachenko, L.A.; Vlasenko, O.I.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

Laser-induced doping of CdTe crystals in different environments

Advanced Materials Research
2011 | Book
EID:

2-s2.0-79955834542

Contributors: Gnatyuk, V.A.; Levytskyi, S.N.; Vlasenko, O.I.; Aoki, T.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

Mechanisms of mass transfer of indium in CdTe under nanosecond laser irradiation

Ukrainian Journal of Physics
2011 | Journal article
EID:

2-s2.0-79952676041

Contributors: Baidullaeva, A.; Veleshchuk, V.P.; Vlasenko, O.I.; Gnatyuk, V.A.; Dauletmuratov, B.K.; Levyts'kyi, S.M.; Aoki, T.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

The COCAE detector: An instrument for localization-identification of radioactive sources

IEEE Transactions on Nuclear Science
2011 | Journal article
EID:

2-s2.0-80054061589

Contributors: Lambropoulos, C.P.; Aoki, T.; Crocco, J.; Dieguez, E.; Disch, C.; Fauler, A.; Fiederle, M.; Hatzistratis, D.; Gnatyuk, V.A.; Karafasoulis, K. et al.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

Formation of CdTe diode detectors by laser irradiation in water

IEEE Nuclear Science Symposium Conference Record
2010 | Conference paper
EID:

2-s2.0-79960336409

Contributors: Aoki, T.; Gnatyuk, V.A.; Vlasenko, O.I.; Levytskyi, S.N.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

Mass transfer of indium in the In-CdTe structure under nanosecond laser irradiation

Physics of the Solid State
2010 | Journal article
EID:

2-s2.0-77950489421

Contributors: Veleshchuk, V.P.; Baĭdullaeva, A.; Vlasenko, A.I.; Gnatyuk, V.A.; Dauletmuratov, B.K.; Levitskii, S.N.; Lyashenko, O.V.; Aoki, T.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

Optical properties of thin GaSe/n-Si(111) films

Semiconductors
2010 | Journal article
EID:

2-s2.0-77955799458

Contributors: Kisselyuk, M.P.; Vlasenko, O.I.; Gentsar, P.O.; Vuychik, M.V.; Zayats, M.S.; Kruglenko, I.V.; Litvin, O.S.; Kryskov, T.A.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

The COCAE detector: An instrument for localization Identification of radioactive sources

IEEE Nuclear Science Symposium Conference Record
2010 | Conference paper
EID:

2-s2.0-79960298026

Contributors: Lambropoulos, C.P.; Aoki, T.; Crocco, J.; Dieguez, E.; Disch, C.; Fauler, A.; Fiederle, M.; Hatzistratis, D.; Gnatyuk, V.A.; Karafasoulis, K. et al.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

Acoustic emission, electroluminescence intensity surface distribution and light fluctuations correlation in GaAsP/GaP and InGaN/GaN structures

AIP Conference Proceedings
2009 | Conference paper
EID:

2-s2.0-67650488509

Contributors: Veleschuk, V.P.; Vlasenko, O.I.; Lyashenko, O.V.; Kysselyuk, M.P.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

Modification of the surface state and doping of CdTe and CdZnTe crystals by pulsed laser irradiation

Applied Surface Science
2009 | Journal article
EID:

2-s2.0-70349573003

Contributors: Gnatyuk, V.A.; Aoki, T.; Vlasenko, O.I.; Levytskyi, S.N.; Dauletmuratov, B.K.; Lambropoulos, C.P.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

Acoustic emission on the relaxation of local thermomechanical stresses in the process of degradation of light-emitting heterostructures on the basis of InGaN and GaAsP

Ukrainian Journal of Physics
2008 | Journal article
EID:

2-s2.0-49349092479

Contributors: Veleshchuk, V.P.; Vlasenko, O.I.; Lyashenko, O.V.; Myagchenko, Y.U.O.; Baidullaeva, A.; Chupryna, R.G.; Kravtsov, M.V.; Budov, O.D.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

CdTe-based Schottky diode X-ray detectors for medical imaging

Proceedings of SPIE - The International Society for Optical Engineering
2008 | Conference paper
EID:

2-s2.0-43949145955

Contributors: Gnatyuk, V.A.; Vlasenko, O.I.; Kosyachenko, L.A.; Maslyanchuk, O.L.; Sklyarchuk, V.M.; Grushko, E.V.; Aoki, T.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

Effect of melting on the acoustic response of CdTe and GaAs subjected to the pulsed laser irradiation

Semiconductors
2008 | Journal article
EID:

2-s2.0-41549095954

Contributors: Baidullaeva, A.; Veleshchuk, V.P.; Vlasenko, A.I.; Dauletmuratov, B.K.; Lyashenko, O.V.; Mozol', P.E.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

Features of characteristics and stability of CdTe nuclear radiation detectors fabricated by laser doping technique

Proceedings of SPIE - The International Society for Optical Engineering
2008 | Conference paper
EID:

2-s2.0-57549085917

Contributors: Gnatyuk, V.A.; Aoki, T.; Vlasenko, O.I.; Levytskyi, S.N.; Hatanaka, Y.; Lambropoulos, C.P.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

Theory of formation of an ensemble of nanoclusters on the surface of CdTe crystals irradiated by a laser pulse

Quantum Electronics
2008 | Journal article
EID:

2-s2.0-48849087239

Contributors: Emel'yanov, V.I.; Baidullaeva, A.; Vlasenko, A.I.; Mozol', P.E.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

Dynamics and time correlation of acoustic emission, electrical noises and quantum yield fluctuations in optoelectronic devices

AIP Conference Proceedings
2007 | Conference paper
EID:

2-s2.0-78650537969

Contributors: Lyashenko, O.V.; Veleshchuk, V.P.; Vlasenko, O.I.; Chuprina, R.G.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

Defect formation in CdTe during laser-induced doping and application to the manufacturing nuclear radiation detectors

Physica Status Solidi C: Conferences
2006 | Conference paper
EID:

2-s2.0-33646172968

Contributors: Gnatyuk, V.A.; Aoki, T.; Hatanaka, Y.; Vlasenko, O.I.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

Generation of dislocations in the CdTe/CdHgTe variband heterosystem at the initial stages of epitaxial growth

Physics of the Solid State
2006 | Journal article
EID:

2-s2.0-33645275703

Contributors: Vlasenko, A.I.; Vlasenko, Z.K.; Kurilo, I.V.; Rudyĭ, I.A.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

Investigation of electron properties of semiconductor surface by modulation spectroscopy of electroreflection

Semiconductors
2006 | Journal article
EID:

2-s2.0-33748757973

Contributors: Gentsar, P.A.; Vlasenko, A.I.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

Laser optimisation of photoelectric properties of variable bandgap CdHgTe layers for multiband IR detection

IRMMW-THz 2006 - 31st International Conference on Infrared and Millimeter Waves and 14th International Conference on Terahertz Electronics
2006 | Conference paper
EID:

2-s2.0-51449091872

Contributors: Gnatyuk, V.A.; Vlasenko, O.I.; Mozol', P.O.; Aoki, T.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

Plasma-deformation mechanism of nanocluster array formation on CdTe crystal surface under the action of a single laser pulse

Technical Physics Letters
2006 | Journal article
EID:

2-s2.0-33747828117

Contributors: Emel'yanov, V.I.; Baidullaeva, A.; Vlasenko, A.I.; Kuzan, L.F.; Lytvyn, O.S.; Mozol', P.E.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

Specific features of photoconductivity spectra of the CdTe/CdHgTe epitaxial graded-gap heterostructures

Semiconductors
2006 | Journal article
EID:

2-s2.0-33644681304

Contributors: Vlasenko, A.I.; Vlasenko, Z.K.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

Acoustic emission, electrical and light fluctuations in optoelectronic devices

AIP Conference Proceedings
2005 | Conference paper
EID:

2-s2.0-33749478519

Contributors: Vlasenko, O.I.; Veleschuk, V.P.; Lyashenko, O.V.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

Formation of electrical contacts on CdTe crystals for X-ray detectors performance

Proceedings of SPIE - The International Society for Optical Engineering
2005 | Conference paper
EID:

2-s2.0-31844436113

Contributors: Gnatyuk, V.A.; Aoki, T.; Hatanaka, Y.; Vlasenko, O.I.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

Metal-semiconductor interfaces in CdTe crystals and modification of their properties by laser pulses

Applied Surface Science
2005 | Journal article
EID:

2-s2.0-15844389534

Contributors: Gnatyuk, V.A.; Aoki, T.; Hatanaka, Y.; Vlasenko, O.I.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

The formation of nanodimensional structures on the surface of p-CdTe crystals exposed to a single radiation pulse from a ruby laser

Semiconductors
2005 | Journal article
EID:

2-s2.0-25144492031

Contributors: Baǐdullaeva, A.; Vlasenko, A.I.; Cuzan, L.F.; Litvin, O.S.; Mozol, P.E.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

The formation of nanodimensional structures on the surface of p-CdTe crystals exposed to a single radiation pulse from a ruby laser

Fizika i Tekhnika Poluprovodnikov
2005 | Journal article
EID:

2-s2.0-26844552074

Contributors: Baidullaeva, A.; Vlasenko, A.I.; Cuzan, L.F.; Litvin, O.S.; Mozol', P.E.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier

Atomic-force microscopy and Raman scattering studies of laser-induced structural disordering on the p-CdTe surface

Physics of the Solid State
2004 | Journal article
EID:

2-s2.0-4544250510

Contributors: Artamonov, V.V.; Baǐdullaeva, A.; Vlasenko, A.I.; Vuǐchik, N.V.; Litvin, O.S.; Mozol, P.E.; Strel'chuk, V.V.
Source: Self-asserted source
Oleksandr Vlasenko via Scopus - Elsevier
Items per page:
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