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Employment
Source:
Wei Feng
Works (48)
Chinese Journal of Mechanical Engineering (English Edition)
2024
|
Journal article
EID:
2-s2.0-85205942466
Contributors:
Feng, W.;
Wu, L.;
Liu, Y.;
Liu, B.;
Liu, Z.;
Zhang, K.
Source:
Wei Feng
via
Scopus - Elsevier
Measurement Science and Technology
2024
|
Journal article
EID:
2-s2.0-85204216753
Contributors:
Feng, W.;
Shang, L.;
Liu, B.;
Zhang, Y.;
Zhang, Y.;
Yang, H.;
Li, D.
Source:
Wei Feng
via
Scopus - Elsevier
Archive of Applied Mechanics
2024
|
Journal article
EID:
2-s2.0-85179714859
Contributors:
Wu, L.;
Feng, W.;
Yang, L.;
Yang, H.;
Yang, S.;
Liu, B.
Source:
Wei Feng
via
Scopus - Elsevier
Jixie Qiangdu/Journal of Mechanical Strength
2024
|
Journal article
EID:
2-s2.0-85191839291
Contributors:
Wu, L.;
Yang, S.;
Feng, W.;
Yang, L.
Source:
Wei Feng
via
Scopus - Elsevier
SSRN
2024
|
Other
EID:
2-s2.0-85209259929
Contributors:
Li, W.;
Hu, X.;
Feng, W.;
Huang, Q.;
Liu, P.;
Huang, X.;
Ibrahim, A.M.M.
Source:
Wei Feng
via
Scopus - Elsevier
SSRN
2024
|
Other
EID:
2-s2.0-85211932198
Contributors:
Li, W.;
Hu, X.;
Feng, W.;
Huang, Q.;
Liu, P.;
Huang, X.;
Ibrahim, A.M.M.
Source:
Wei Feng
via
Scopus - Elsevier
ICSMD 2023 - International Conference on Sensing, Measurement and Data Analytics in the Era of Artificial Intelligence, Proceedings
2023
|
Conference paper
EID:
2-s2.0-85191492813
Contributors:
Zhang, K.;
Liang, J.;
Feng, W.;
Liu, B.;
Liu, Z.;
Ding, H.
Source:
Wei Feng
via
Scopus - Elsevier
Journal of Manufacturing Processes
2023
|
Journal article
EID:
2-s2.0-85168314639
Contributors:
Feng, W.;
Qin, P.;
Cao, L.;
Sun, C.;
Li, W.;
Cao, X.
Source:
Wei Feng
via
Scopus - Elsevier
Hangkong Dongli Xuebao/Journal of Aerospace Power
2023
|
Journal article
EID:
2-s2.0-85161479152
Contributors:
Zhang, Z.;
Liu, B.;
Zhou, W.;
Feng, W.
Source:
Wei Feng
via
Scopus - Elsevier
Sensors and Materials
2023
|
Journal article
EID:
2-s2.0-85148460885
Contributors:
Zhang, K.;
Zhang, B.;
Feng, W.;
Liu, Z.;
Shen, H.;
Liu, B.
Source:
Wei Feng
via
Scopus - Elsevier
Journal of the European Ceramic Society
2023
|
Journal article
EID:
2-s2.0-85151443457
Contributors:
Li, W.;
Long, C.;
Ma, W.;
Ke, F.;
Feng, W.
Source:
Wei Feng
via
Scopus - Elsevier
Jixie Qiangdu/Journal of Mechanical Strength
2023
|
Journal article
EID:
2-s2.0-85175838836
Contributors:
Zhang, R.;
Liu, B.;
Liu, Y.;
Feng, W.
Source:
Wei Feng
via
Scopus - Elsevier
Hangkong Dongli Xuebao/Journal of Aerospace Power
2023
|
Journal article
EID:
2-s2.0-85173016982
Contributors:
Liu, Y.;
Liu, B.;
Zhang, Z.;
Feng, W.;
Zhang, R.
Source:
Wei Feng
via
Scopus - Elsevier
International Journal of Applied Electromagnetics and Mechanics
2023
|
Journal article
EID:
2-s2.0-85148086377
Contributors:
Zhang, K.;
Zhao, H.;
Feng, W.;
Wu, Z.;
Liu, B.
Source:
Wei Feng
via
Scopus - Elsevier
Tribology International
2023
|
Journal article
EID:
2-s2.0-85156212151
Contributors:
Sun, C.;
Hong, Y.;
Xiu, S.;
Ma, L.;
Wang, D.;
Xu, C.;
Feng, W.
Source:
Wei Feng
via
Scopus - Elsevier
Mechanical Systems and Signal Processing
2023-03
|
Journal article
Contributors:
Wei Feng;
Zongyao Liu;
Yadong Wang;
Yutong Wang;
Wei Feng;
Kun Zhang
Source:
Wei Feng
grade
Preferred source
(of
2)
IEEE Access
2022
|
Journal article
EID:
2-s2.0-85135751590
Contributors:
Zhang, Z.;
Liu, B.;
Du, W.;
Feng, W.
Source:
Wei Feng
via
Scopus - Elsevier
International Journal of Applied Electromagnetics and Mechanics
2022
|
Journal article
EID:
2-s2.0-85142700341
Contributors:
Feng, W.;
Zhang, K.;
Liu, Z.;
Liu, B.;
Zhang, H.;
Mei, J.;
Wu, L.
Source:
Wei Feng
via
Scopus - Elsevier
Applied Sciences (Switzerland)
2022
|
Journal article
EID:
2-s2.0-85144836518
Contributors:
Wu, H.;
Liu, B.;
Liu, Y.;
Feng, W.
Source:
Wei Feng
via
Scopus - Elsevier
grade
Preferred source
(of
2)
Machines
2022
|
Journal article
EID:
2-s2.0-85138604273
Contributors:
Chen, P.;
Zhang, X.;
Feng, M.;
Li, S.;
Pan, X.;
Feng, W.
Source:
Wei Feng
via
Scopus - Elsevier
Archive of Applied Mechanics
2022-08
|
Journal article
Contributors:
Wei Feng;
Yanxu Liu;
YanXu Liu;
Min Cheng;
Wei Feng
Source:
Wei Feng
grade
Preferred source
(of
2)
Mechanism and Machine Theory
2022-05
|
Journal article
Contributors:
Wei Feng;
Huipeng Shen;
Hao Ding;
Wei Feng;
Delun Wang
Source:
Wei Feng
grade
Preferred source
(of
2)
IEEE Sensors Journal
2022-04-01
|
Journal article
|
Author
Contributors:
Huijuan Zhang;
Ruipu Zhu;
Hang Yuan;
Jinjin Xie;
Jianjuan Liu;
Wei Feng;
Zhenfang Xu
Source:
Wei Feng
grade
Preferred source
(of
2)
Smart Structures and Systems
2022-03-25
|
Journal article
Contributors:
Wei Feng;
Weifang Sun;
Yuqing Zhou;
Jiawei Xiang;
Binqiang Chen;
Wei Feng
Source:
Wei Feng
grade
Preferred source
(of
2)
Jingangshi yu Moliao Moju Gongcheng/Diamond and Abrasives Engineering
2021
|
Journal article
EID:
2-s2.0-85118391433
Contributors:
Yang, H.;
Feng, W.;
Zhu, J.;
Shi, C.;
Liu, B.;
Wu, X.;
Ding, H.
Source:
Wei Feng
via
Scopus - Elsevier
IEEE Transactions on Instrumentation and Measurement
2021
|
Journal article
Source:
Wei Feng
grade
Preferred source
(of
3)
Research Square
2021
|
Other
EID:
2-s2.0-85168036007
Contributors:
Feng, W.;
Zhang, K.;
Liu, Z.;
Liu, B.;
Zhang, H.;
Mei, J.;
Wu, L.
Source:
Wei Feng
via
Scopus - Elsevier
Hangkong Dongli Xuebao/Journal of Aerospace Power
2021
|
Journal article
EID:
2-s2.0-85104491356
Contributors:
Liu, Y.;
Liu, B.;
Feng, W.;
Cheng, M.
Source:
Wei Feng
via
Scopus - Elsevier
Journal of Vibration and Control
2021-06-01
|
Journal article
Source:
Wei Feng
grade
Preferred source
(of
2)
The International Journal of Advanced Manufacturing Technology
2021-04
|
Journal article
Source:
Wei Feng
grade
Preferred source
(of
2)
Measurement: Journal of the International Measurement Confederation
2020
|
Journal article
EID:
2-s2.0-85087283820
Contributors:
Sun, W.;
Zhou, Y.;
Cao, X.;
Chen, B.;
Feng, W.;
Chen, L.
Source:
Wei Feng
via
Scopus - Elsevier
International Journal of Advanced Manufacturing Technology
2020
|
Journal article
EID:
2-s2.0-85085919098
Contributors:
Ji, Y.;
Wang, X.;
Liu, Z.;
Wang, H.;
Feng, W.;
Wang, Y.;
Liu, S.
Source:
Wei Feng
via
Scopus - Elsevier
International Journal of Advanced Manufacturing Technology
2020
|
Journal article
EID:
2-s2.0-85077593438
Contributors:
Cai, S.;
Yao, B.;
Feng, W.;
Cai, Z.;
Chen, B.;
He, Z.
Source:
Wei Feng
via
Scopus - Elsevier
Zhendong yu Chongji/Journal of Vibration and Shock
2020
|
Journal article
EID:
2-s2.0-85083576186
Contributors:
Feng, W.;
Liu, B.;
Ding, H.;
Shen, H.
Source:
Wei Feng
via
Scopus - Elsevier
Journal of Manufacturing Processes
2020-10
|
Journal article
Source:
Wei Feng
grade
Preferred source
(of
2)
The International Journal of Advanced Manufacturing Technology
2020-06
|
Journal article
Source:
Wei Feng
grade
Preferred source
(of
2)
The International Journal of Advanced Manufacturing Technology
2019-10
|
Journal article
Source:
Wei Feng
grade
Preferred source
(of
2)
Machining Science and Technology
2018-11-02
|
Journal article
Source:
Wei Feng
grade
Preferred source
(of
2)
The International Journal of Advanced Manufacturing Technology
2017-03
|
Journal article
Source:
Wei Feng
grade
Preferred source
(of
2)
Source:
Wei Feng
grade
Preferred source
(of
2)
Journal of Mechanical Science and Technology
2017-02
|
Journal article
Source:
Wei Feng
grade
Preferred source
(of
2)
Jilin Daxue Xuebao (Gongxueban)/Journal of Jilin University (Engineering and Technology Edition)
2016
|
Journal article
EID:
2-s2.0-84967224338
Contributors:
Shen, Z.-H.;
Yao, B.;
Lu, R.-S.;
Feng, W.;
Zhang, X.-L.;
Wang, M.-M.
Source:
Wei Feng
via
Scopus - Elsevier
Zhendong yu Chongji/Journal of Vibration and Shock
2016
|
Journal article
EID:
2-s2.0-84961626152
Contributors:
Feng, W.;
Chen, B.-Q.;
Cai, S.-J.;
Yao, B.;
Luo, Q.;
Zhang, D.-S.
Source:
Wei Feng
via
Scopus - Elsevier
International Journal of Precision Engineering and Manufacturing
2016-01
|
Journal article
Source:
Wei Feng
grade
Preferred source
(of
2)
Shock and Vibration
2015
|
Journal article
Source:
Wei Feng
grade
Preferred source
(of
2)
Shock and Vibration
2015
|
Journal article
Source:
Wei Feng
grade
Preferred source
(of
2)
Journal of Zhejiang University: Science A
2015
|
Journal article
EID:
2-s2.0-84946406577
Contributors:
Zhang, X.-L.;
Yao, B.;
Feng, W.;
Shen, Z.-H.;
Wang, M.-M.
Source:
Wei Feng
via
Scopus - Elsevier
Hangkong Xuebao/Acta Aeronautica et Astronautica Sinica
2014
|
Journal article
EID:
2-s2.0-84920869182
Contributors:
Zhang, X.;
Yao, B.;
Feng, W.;
Shen, Z.
Source:
Wei Feng
via
Scopus - Elsevier