Personal information

Activities

Works (8)

Application of Taylor models to the worst-case analysis of stripline interconnects

2016 IEEE 20th Workshop on Signal and Power Integrity, SPI 2016 - Proceedings
2016 | Conference paper
EID:

2-s2.0-84980359266

Contributors: Manfredi, P.; Trinchero, R.; Canavero, F.G.; Stievano, I.S.
Source: Self-asserted source
Riccardo Trinchero via Scopus - Elsevier

Combined parametric and worst case circuit analysis via taylor models

IEEE Transactions on Circuits and Systems I: Regular Papers
2016 | Journal article
EID:

2-s2.0-84982784013

Contributors: Trinchero, R.; Manfredi, P.; Ding, T.; Stievano, I.S.
Source: Self-asserted source
Riccardo Trinchero via Scopus - Elsevier

EMI modeling of switching circuits via augmented equivalents and measured data

IEEE International Symposium on Electromagnetic Compatibility
2015 | Conference paper
EID:

2-s2.0-84953878947

Contributors: Trinchero, R.; Stievano, I.S.; Canavero, F.G.
Source: Self-asserted source
Riccardo Trinchero via Scopus - Elsevier

EMI Prediction of Switching Converters

IEEE Transactions on Electromagnetic Compatibility
2015 | Journal article
EID:

2-s2.0-84944722837

Contributors: Trinchero, R.; Stievano, I.S.; Canavero, F.G.
Source: Self-asserted source
Riccardo Trinchero via Scopus - Elsevier

How Affine Arithmetic Helps Beat Uncertainties in Electrical Systems

IEEE Circuits and Systems Magazine
2015 | Journal article
EID:

2-s2.0-84969772301

Contributors: Ding, T.; Trinchero, R.; Manfredi, P.; Stievano, I.S.; Canavero, F.G.
Source: Self-asserted source
Riccardo Trinchero via Scopus - Elsevier

Steady-state analysis of switching power converters via augmented time-invariant equivalents

IEEE Transactions on Power Electronics
2014 | Journal article
EID:

2-s2.0-84904440375

Contributors: Trinchero, R.; Stievano, I.S.; Canavero, F.G.
Source: Self-asserted source
Riccardo Trinchero via Scopus - Elsevier

Steady-State Response of Periodically Switched Linear Circuits via Augmented Time-Invariant Nodal Analysis

Journal of Electrical and Computer Engineering
2014 | Journal article
EID:

2-s2.0-84937010511

Contributors: Trinchero, R.; Stievano, I.S.; Canavero, F.G.
Source: Self-asserted source
Riccardo Trinchero via Scopus - Elsevier

EMI modeling of switching circuits via augmented equivalents and measured data

Conference paper
Source: Self-asserted source
Riccardo Trinchero