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Scopus Author ID: 57199489750

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Employment (1)

Fraunhofer ITWM: Kaiserslautern, Deutschland, DE

Employment
Source: Self-asserted source
Stefan Duran

Works (22)

Non-destructive and non-contact: Robot-supported coating thickness measurement in production,Zerstörungsfrei und berührungslos: robotergestützte Schichtdickenmessung in der Fertigung

JOT, Journal fuer Oberflaechentechnik
2021 | Other
DOI: 10.1007/s35144-021-1153-2
EID:

2-s2.0-85104933669

Part of ISSN: 2192869X 09408789
Contributors: Klier, J.; Weber, S.; Molter, D.; von Freymann, G.; Jonuscheit, J.
Source: Self-asserted source
Stefan Duran via Scopus - Elsevier

Online terahertz thickness determination of sub-wavelength layers at kilohertz measurement rates

International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz
2021 | Conference paper
DOI: 10.1109/IRMMW-THz50926.2021.9567404
EID:

2-s2.0-85125297901

Part of ISSN: 21622035 21622027
Contributors: Klier, J.; Weber, S.; Jonuscheit, J.; Ellenberger, K.-S.; von Freymann, G.; Molter, D.; Vieweg, N.; Dutzi, K.; Deninger, A.
Source: Self-asserted source
Stefan Duran via Scopus - Elsevier

Telecom-compatible LTG-GaAs Photoconductive Antenna Modules with more than 85 dB Peak Dynamic Range

International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz
2021 | Conference paper
DOI: 10.1109/IRMMW-THz50926.2021.9567501
EID:

2-s2.0-85125303139

Part of ISSN: 21622035 21622027
Contributors: Weber, S.; Klier, J.; Jonuscheit, J.; von Freymann, G.; Molter, D.
Source: Self-asserted source
Stefan Duran via Scopus - Elsevier

Thickness determination and prediction of wet paint using terahertz time-domain spectroscopy

International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz
2021 | Conference paper
DOI: 10.1109/IRMMW-THz50926.2021.9567577
EID:

2-s2.0-85125320697

Part of ISSN: 21622035 21622027
Contributors: Klier, J.; Weber, S.; Jonuscheit, J.; von Freymann, G.; Molter, D.
Source: Self-asserted source
Stefan Duran via Scopus - Elsevier

Two decades of terahertz cross-correlation spectroscopy

Applied Physics Reviews
2021 | Journal article
DOI: 10.1063/5.0037395
EID:

2-s2.0-85104932182

Part of ISSN: 19319401
Contributors: Molter, D.; Klier, J.; Weber, S.; Kolano, M.; Jonuscheit, J.; von Freymann, G.
Source: Self-asserted source
Stefan Duran via Scopus - Elsevier

Influence of System Performance on Layer Thickness Determination Using Terahertz Time-Domain Spectroscopy

Journal of Infrared, Millimeter, and Terahertz Waves
2020 | Journal article
DOI: 10.1007/s10762-020-00669-3
EID:

2-s2.0-85078454985

Part of ISSN: 18666906 18666892
Contributors: Weber, S.; Liebelt, L.; Klier, J.; Pfeiffer, T.; Molter, D.; Ellrich, F.; Jonuscheit, J.; Freymann, G.V.
Source: Self-asserted source
Stefan Duran via Scopus - Elsevier

Layer-thickness measurements with incoherent terahertz light

International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz
2020 | Conference paper
DOI: 10.1109/IRMMW-THz46771.2020.9370629
EID:

2-s2.0-85103162348

Part of ISSN: 21622035 21622027
Contributors: Molter, D.; Kolano, M.; Klier, J.; Weber, S.; Jonuscheit, J.; Von Freymann, G.
Source: Self-asserted source
Stefan Duran via Scopus - Elsevier

Non-destructive and non-contact: Robot-assisted coating thickness measurement in production,Zerstörungsfrei und berührungslos: robotergestützte Schichtdickenmessung in der Fertigung

JOT, Journal fuer Oberflaechentechnik
2020 | Other
DOI: 10.1007/s35144-020-0648-6
EID:

2-s2.0-85089946803

Part of ISSN: 2192869X 09408789
Contributors: Klier, J.; Weber, S.; Molter, D.; von Freymann, G.; Jonuscheit, J.
Source: Self-asserted source
Stefan Duran via Scopus - Elsevier

Terahertz Quality Inspection for Automotive and Aviation Industries

Journal of Infrared, Millimeter, and Terahertz Waves
2020 | Journal article
DOI: 10.1007/s10762-019-00639-4
EID:

2-s2.0-85076211345

Part of ISSN: 18666906 18666892
Contributors: Ellrich, F.; Bauer, M.; Schreiner, N.; Keil, A.; Pfeiffer, T.; Klier, J.; Weber, S.; Jonuscheit, J.; Friederich, F.; Molter, D.
Source: Self-asserted source
Stefan Duran via Scopus - Elsevier

Influence of bandwidth and dynamic range on thickness determination using terahertz time-domain spectroscopy

International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz
2019 | Conference paper
DOI: 10.1109/IRMMW-THz.2019.8874124
EID:

2-s2.0-85074701126

Part of ISSN: 21622035 21622027
Contributors: Liebelt, L.; Weber, S.; Klier, J.; Pfeiffer, T.; Molter, D.; Ellrich, F.; Von Freymann, G.
Source: Self-asserted source
Stefan Duran via Scopus - Elsevier

Mobile Handheld FMCW Terahertz Multilayer Thickness Inspection

International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz
2019 | Conference paper
DOI: 10.1109/IRMMW-THz.2019.8873942
EID:

2-s2.0-85074720626

Part of ISSN: 21622035 21622027
Contributors: Schreiner, N.; Weber, S.; Keil, A.; Friederich, F.
Source: Self-asserted source
Stefan Duran via Scopus - Elsevier

Non-destructive coating thickness measurement of wet films,Zerstörungsfreie Schichtdickenmessung an Nassfilmen

JOT, Journal fuer Oberflaechentechnik
2019 | Other
DOI: 10.1007/s35144-019-0304-1
EID:

2-s2.0-85072313044

Part of ISSN: 2192869X 09408789
Contributors: Klier, J.; Weber, S.; Molter, D.; Von Freymann, G.; Jonuscheit, J.
Source: Self-asserted source
Stefan Duran via Scopus - Elsevier

Four-channel terahertz time-domain spectroscopy system for industrial pipe inspection

International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz
2018 | Conference paper
DOI: 10.1109/IRMMW-THz.2018.8510403
EID:

2-s2.0-85056891897

Part of ISSN: 21622035 21622027
Contributors: Klier, J.; Kharik, D.; Zwetow, W.; Gundacker, D.; Weber, S.; Molter, D.; Ellrich, F.; Jonuscheit, J.; Von Freymann, G.
Source: Self-asserted source
Stefan Duran via Scopus - Elsevier

Interferometry-aided terahertz time-domain spectroscopy for robust measurements in reflection

International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz
2018 | Conference paper
DOI: 10.1109/IRMMW-THz.2018.8510255
EID:

2-s2.0-85056843713

Part of ISSN: 21622035 21622027
Contributors: Molter, D.; Weber, S.; Pfeiffer, T.; Klier, J.; Bachtler, S.; Ellrich, F.; Jonuscheit, J.; Von Freymann, G.
Source: Self-asserted source
Stefan Duran via Scopus - Elsevier

Single-laser polarization-controlled optical sampling system for THz-TDS

Optics Letters
2018 | Journal article
DOI: 10.1364/OL.43.001351
EID:

2-s2.0-85043998399

Part of ISSN: 15394794 01469592
Contributors: Kolano, M.; Gräf, B.; Weber, S.; Molter, D.; Freymann, G.V.
Source: Self-asserted source
Stefan Duran via Scopus - Elsevier

Single-laser polarization-controlled optical sampling system for THz-TDS

International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz
2018 | Conference paper
DOI: 10.1109/IRMMW-THz.2018.8509880
EID:

2-s2.0-85056873601

Part of ISSN: 21622035 21622027
Contributors: Kolano, M.; Boidol, O.; Weber, S.; Molter, D.; Freymann, G.V.
Source: Self-asserted source
Stefan Duran via Scopus - Elsevier

Terahertz thickness determination with interferometric vibration correction for industrial applications

Optics Express
2018 | Journal article
DOI: 10.1364/OE.26.012558
EID:

2-s2.0-85046971914

Part of ISSN: 10944087
Contributors: Pfeiffer, T.; Weber, S.; Klier, J.; Bachtler, S.; Molter, D.; Jonuscheit, J.; Freymann, G.V.
Source: Self-asserted source
Stefan Duran via Scopus - Elsevier

Thickness determination of wet coatings using self-calibration method

International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz
2017 | Conference paper
DOI: 10.1109/IRMMW-THz.2017.8067107
EID:

2-s2.0-85033725747

Part of ISSN: 21622035 21622027
Contributors: Weber, S.; Klier, J.; Ellrich, F.; Paustian, S.; Guttler, N.; Tiedje, O.; Jonuscheit, J.; Von Freymann, G.
Source: Self-asserted source
Stefan Duran via Scopus - Elsevier

Time-stretched real-Time measurement technique for ultrafast absorption variations with TS/s sampling-rate

Optics Express
2017 | Journal article
DOI: 10.1364/OE.25.014125
EID:

2-s2.0-85021370129

Part of ISSN: 10944087
Contributors: Weber, S.; Waller, E.H.; Kaiser, C.; Von Freymann, G.
Source: Self-asserted source
Stefan Duran via Scopus - Elsevier

Terahertz time-domain technology for thickness determination of industrial relevant multi-layer coatings

International Conference on Infrared, Millimeter, and Terahertz Waves, IRMMW-THz
2016 | Conference paper
DOI: 10.1109/IRMMW-THz.2016.7758614
EID:

2-s2.0-85006173380

Part of ISSN: 21622035 21622027
Contributors: Ellrich, F.; Klier, J.; Weber, S.; Jonuscheit, J.; Von Freymann, G.
Source: Self-asserted source
Stefan Duran via Scopus - Elsevier

Magnification dependent dispersion penalty studied with resonator-based time-stretch oscilloscope

Journal of Lightwave Technology
2014 | Journal article
DOI: 10.1109/JLT.2014.2313184
EID:

2-s2.0-84906862012

Part of ISSN: 07338724
Contributors: Weber, S.; Reinheimer, C.; Von Freymann, G.
Source: Self-asserted source
Stefan Duran via Scopus - Elsevier

Combless broadband Terahertz generation with conventional laser diodes

Optics Express
2011 | Journal article
DOI: 10.1364/OE.19.005290
EID:

2-s2.0-79952603216

Part of ISSN: 10944087
Contributors: Molter, D.; Wagner, A.; Weber, S.; Jonuscheit, J.; Beigang, R.
Source: Self-asserted source
Stefan Duran via Scopus - Elsevier
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