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Defect Detection Method of Aluminum Profile Surface Using Deep Self-Attention Mechanism Under Hybrid Noise Conditions

IEEE Transactions on Instrumentation and Measurement
2021 | Journal article
DOI: 10.1109/TIM.2021.3109723
Contributors: Renxiang Chen; Dongyin Cai; Xiaolin Hu; Zan Zhan; Shuai Wang
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