Personal information
Activities
Employment (1)
1956-09-15
to
present
|
завідувач кафедри
(кафедра АЕД ФАКС)
Employment
Source:
Юліан Туз
Education and qualifications (1)
1952-09-01
to
1958-06-01
|
доктор технічних наук, професор
(кафедра АЕД ФАКС)
Education
Source:
Юліан Туз
Works (14)
Journal of Thermoelectricity
2012
|
Journal article
EID:
2-s2.0-84885703428
Contributors:
Tuz, Y.M.;
Dobrolyubova, M.V.;
Artyukhova, Y.V.;
Strunina, Y.A.;
Bodnaruk, V.I.;
Taschuk, D.D.
Source:
Юліан Туз
via
Scopus - Elsevier
18th IMEKO TC4 Symposium on Measurement of Electrical Quantities 2011, Part of Metrologia 2011
2011
|
Conference paper
EID:
2-s2.0-84921733565
Contributors:
Tuz, U.M.;
Dobrolyubova, M.V.;
Ulianova, A.A.
Source:
Юліан Туз
via
Scopus - Elsevier
CPEM Digest (Conference on Precision Electromagnetic Measurements)
2010
|
Conference paper
EID:
2-s2.0-77956644586
Contributors:
Tuz, Y.M.;
Rakhmailov, A.V.;
Dobrolyubova, M.V.;
Khimichenko, B.P.
Source:
Юліан Туз
via
Scopus - Elsevier
Journal of Superhard Materials
2010
|
Journal article
EID:
2-s2.0-77949969650
Contributors:
Fesenko, I.P.;
Serbenyuk, T.B.;
Chasnyk, V.I.;
Bilovol, V.S.;
Kolodnits'Kyi, V.M.;
Loshak, M.G.;
Marchenko, A.A.;
Tuz, Y.M.;
Strunina, Y.O.;
Tkach, S.V.
et al.
Source:
Юліан Туз
via
Scopus - Elsevier
CPEM Digest (Conference on Precision Electromagnetic Measurements)
2000
|
Conference paper
EID:
2-s2.0-0033712698
Contributors:
Tuz, Yu.;
Litvikh, V.
Source:
Юліан Туз
via
Scopus - Elsevier
CPEM Digest (Conference on Precision Electromagnetic Measurements)
1996
|
Conference paper
EID:
2-s2.0-0029746598
Contributors:
Tuz, Ju.M.;
Kaminskiy, V.Ju;
Litvich, V.V.;
Andreev, S.V.
Source:
Юліан Туз
via
Scopus - Elsevier
CPEM Digest (Conference on Precision Electromagnetic Measurements)
1996
|
Conference paper
EID:
2-s2.0-0029763857
Contributors:
Tuz, Ju.M.;
Litvich, V.V.;
Kaminskiy, V.Ju.;
Lapitskii, S.M.
Source:
Юліан Туз
via
Scopus - Elsevier
Measurement Techniques
1989
|
Journal article
EID:
2-s2.0-0024685035
Contributors:
Tuz, Yu.M.
Source:
Юліан Туз
via
Scopus - Elsevier
Measurement Techniques
1976
|
Journal article
EID:
2-s2.0-34250388619
Contributors:
Tuz, Yu.M.;
Sergeev, I.Yu.
Source:
Юліан Туз
via
Scopus - Elsevier
Measurement Techniques
1974
|
Journal article
EID:
2-s2.0-0016039017
Contributors:
Tuz, Yu.M.;
Gapchenko, L.M.;
Serpilin, K.L.;
Tsidelko, V.D.;
Nikiforova, G.A.
Source:
Юліан Туз
via
Scopus - Elsevier
Measurement Techniques
1973
|
Journal article
EID:
2-s2.0-0015658929
Contributors:
Tuz, Yu.M.;
Esikov, Yu.S.;
Popov, A.S.
Source:
Юліан Туз
via
Scopus - Elsevier
Measurement Techniques
1968
|
Journal article
EID:
2-s2.0-34250487819
Contributors:
Serpilin, K.L.;
Gapchenko, L.M.;
Tuz, Yu.M.
Source:
Юліан Туз
via
Scopus - Elsevier
Measurement Techniques
1963
|
Journal article
EID:
2-s2.0-34250605240
Contributors:
Ornatskii, P.P.;
Tuz, Yu.M.;
Greshchenko, E.V.
Source:
Юліан Туз
via
Scopus - Elsevier
Measurement Techniques
1961
|
Journal article
EID:
2-s2.0-84950363270
Contributors:
Ornatskii, P.P.;
Suvid, N.F.;
Tuz, Yu.M.
Source:
Юліан Туз
via
Scopus - Elsevier