Personal information
Optics, X-Ray, EUV lithography, Ultra-fast Optics, Computational imaging, Optical metrology
United States, France
Activities
Employment (2)
2017-01-11
to
present
|
Advanced X-ray Optics Project Scientist
(ALS)
Employment
Source:
Antoine Islegen-Wojdyla
2012
to
2016
|
Postdoctoral fellow
(MSD/CXRO)
Employment
Source:
Antoine Islegen-Wojdyla
Education and qualifications (3)
2008-09
to
2011-11
|
Ph.D.
(Physical sciences)
Education
Source:
Antoine Islegen-Wojdyla
2007-09
to
2008-09
|
Master in Optics and signal processing
(Optics)
Education
Source:
Antoine Islegen-Wojdyla
2005-09
to
2008-08
|
Ingenieur
Education
Source:
Antoine Islegen-Wojdyla
Works (38)
Advances in Computational Methods for X-Ray Optics VI
2023-10-05
|
Conference paper
Contributors:
Paola Luna;
Antoine Wojdyla
Source:
Antoine Islegen-Wojdyla
Advances in Computational Methods for X-Ray Optics VI
2023-10-05
|
Conference paper
Contributors:
Thomas W. Morris;
Yonghua Du;
Mikhail Fedurin;
Abigail C. Giles;
Paul Moeller;
Boaz Nash;
Max . Rakitin;
Brianna Romasky;
Andrew L. Walter;
Noah Wilson
et al.
Source:
Antoine Islegen-Wojdyla
Advances in Metrology for X-Ray and EUV Optics X
2023-10-03
|
Conference paper
Contributors:
Kenneth A. Goldberg;
Antoine Wojdyla;
Diane Bryant;
Xianbo Shi;
Luca Rebuffi;
Matthew Frith;
Matthew Highland;
Lahsen Assoufid;
Yoshio Ichii;
Takato Inoue
et al.
Source:
Antoine Islegen-Wojdyla
Synchrotron Radiation News
2023-09-03
|
Journal article
Contributors:
Antoine Wojdyla;
Lucia Alianelli
Source:
check_circle
Crossref
Optics Express
2023-06-19
|
Journal article
Contributors:
Luca Rebuffi;
Xianbo Shi;
Zhi Qiao;
Matthew J. Highland;
Matthew G. Frith;
Antoine Wojdyla;
Kenneth A. Goldberg;
Lahsen Assoufid
Source:
check_circle
Crossref
Journal of Synchrotron Radiation
2023-01-01
|
Journal article
|
Investigation
Contributors:
Gautam Gunjala;
Antoine Wojdyla;
Kenneth Goldberg;
Zhi Qiao;
Xianbo Shi;
Lahsen Assoufid;
Laura Waller;
Antoine Islegen-Wojdyla
Source:
Antoine Islegen-Wojdyla
Advances in X-Ray/EUV Optics and Components XVII
2022-10-04
|
Conference paper
Contributors:
Sooyeon Park;
Dmitriy L. Voronov;
Antoine Wojdyla;
Eric M. Gullikson;
Fahard Salmassi;
Howard A. Padmore
Source:
Antoine Islegen-Wojdyla
Synchrotron Radiation News
2021-11-02
|
Magazine article
Contributors:
Antoine Wojdyla;
Kenneth A. Goldberg
Source:
Antoine Islegen-Wojdyla
Sensors
2021-01-13
|
Journal article
Contributors:
Kenneth A. Goldberg;
Antoine Wojdyla;
Diane Bryant
Source:
check_circle
Crossref
Optics Letters
2020-09-01
|
Journal article
Contributors:
Kenneth A. Goldberg;
Diane Bryant;
Antoine Wojdyla;
Michael Helmbrecht;
Eric Gullikson
Source:
check_circle
Crossref
Scientific Reports
2020-07-15
|
Journal article
Source:
Antoine Islegen-Wojdyla
Source:
Antoine Islegen-Wojdyla
Image Sensing Technologies: Materials, Devices, Systems, and Applications V
2018-05-29
|
Conference paper
Contributors:
Antoine Wojdyla;
Markus P. Benk;
Patrick P. Naulleau;
Kenneth A. Goldberg
Source:
Antoine Islegen-Wojdyla
Applied Optics
2017
|
Journal article
EID:
2-s2.0-85018505318
Contributors:
Naulleau, P.P.;
Benk, M.;
Goldberg, K.A.;
Gullikson, E.M.;
Wojdyla, A.;
Wang, Y.-G.;
Neureuther, A.
Source:
Antoine Islegen-Wojdyla
via
Scopus - Elsevier
Proceedings of SPIE - The International Society for Optical Engineering
2016
|
Conference paper
EID:
2-s2.0-84981328137
Contributors:
Wojdyla, A.;
Donoghue, A.;
Benk, M.P.;
Naulleau, P.P.;
Goldberg, K.A.
Source:
Antoine Islegen-Wojdyla
via
Scopus - Elsevier
Proceedings of SPIE - The International Society for Optical Engineering
2016
|
Conference paper
EID:
2-s2.0-84981306414
Contributors:
Benk, M.P.;
Wojdyla, A.;
Chao, W.;
Salmassi, F.;
Oh, S.;
Wang, Y.-G.;
Miyakawa, R.H.;
Naulleau, P.P.
Source:
Antoine Islegen-Wojdyla
via
Scopus - Elsevier
Journal of Micro/ Nanolithography, MEMS, and MOEMS
2016
|
Journal article
EID:
2-s2.0-84978732279
Contributors:
Benk, M.P.;
Wojdyla, A.;
Chao, W.;
Salmassi, F.;
Oh, S.;
Wang, Y.-G.;
Miyakawa, R.H.;
Naulleau, P.P.;
Goldberg, K.A.
Source:
Antoine Islegen-Wojdyla
via
Scopus - Elsevier
Proceedings of SPIE - The International Society for Optical Engineering
2016
|
Conference paper
EID:
2-s2.0-84981297884
Contributors:
Levinson, Z.;
Burbine, A.;
Verduijn, E.;
Wood, O.;
Mangat, P.;
Goldberg, K.A.;
Benk, M.P.;
Wojdyla, A.;
Smith, B.W.
Source:
Antoine Islegen-Wojdyla
via
Scopus - Elsevier
Journal of Micro/ Nanolithography, MEMS, and MOEMS
2016
|
Journal article
EID:
2-s2.0-84976636625
Contributors:
Levinson, Z.;
Verduijn, E.;
Wood, O.R.;
Mangat, P.;
Goldberg, K.A.;
Benk, M.P.;
Wojdyla, A.;
Smith, B.W.
Source:
Antoine Islegen-Wojdyla
via
Scopus - Elsevier
Optics InfoBase Conference Papers
2016
|
Conference paper
EID:
2-s2.0-85019529242
Contributors:
Shanker, A.;
Wojdyla, A.;
Gunjala, G.;
Dong, J.;
Benk, M.;
Neureuther, A.;
Goldberg, K.;
Waller, L.
Source:
Antoine Islegen-Wojdyla
via
Scopus - Elsevier
Proceedings of SPIE - The International Society for Optical Engineering
2016
|
Conference paper
EID:
2-s2.0-84989323181
Contributors:
Naulleau, P.;
Anderson, C.N.;
Chao, W.;
Goldberg, K.A.;
Gullikson, E.;
Salmassi, F.;
Wojdyla, A.
Source:
Antoine Islegen-Wojdyla
via
Scopus - Elsevier
Proceedings of SPIE - The International Society for Optical Engineering
2015
|
Conference paper
EID:
2-s2.0-84931362613
Contributors:
Levinson, Z.;
Raghunathan, S.;
Verduijn, E.;
Wood, O.;
Mangat, P.;
Goldberg, K.;
Benk, M.;
Wojdyla, A.;
Philipsen, V.;
Hendrickx, E.
et al.
Source:
Antoine Islegen-Wojdyla
via
Scopus - Elsevier
Proceedings of SPIE - The International Society for Optical Engineering
2015
|
Conference paper
EID:
2-s2.0-84931384632
Contributors:
Claus, R.A.;
Wojdyla, A.;
Benk, M.P.;
Goldberg, K.A.;
Neureuther, A.R.;
Naulleau, P.P.;
Waller, L.
Source:
Antoine Islegen-Wojdyla
via
Scopus - Elsevier
Journal of Micro/ Nanolithography, MEMS, and MOEMS
2015
|
Journal article
EID:
2-s2.0-84923087109
Contributors:
Benk, M.P.;
Miyakawa, R.H.;
Chao, W.;
Wang, Y.-G.;
Wojdyla, A.;
Johnson, D.G.;
Donoghue, A.P.;
Goldberg, K.A.
Source:
Antoine Islegen-Wojdyla
via
Scopus - Elsevier
Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics
2015
|
Journal article
EID:
2-s2.0-84940571085
Contributors:
Benk, M.P.;
Goldberg, K.A.;
Wojdyla, A.;
Anderson, C.N.;
Salmassi, F.;
Naulleau, P.P.;
Kocsis, M.
Source:
Antoine Islegen-Wojdyla
via
Scopus - Elsevier
Journal of Photopolymer Science and Technology
2015
|
Journal article
EID:
2-s2.0-84947289821
Contributors:
Naulleau, P.;
Anderson, C.;
Chau, W.;
Goldberg, K.;
Wojdyla, A.;
Bhattarai, S.;
Neureuther, A.;
Goodwin, F.;
Neisser, M.
Source:
Antoine Islegen-Wojdyla
via
Scopus - Elsevier
Journal of Photopolymer Science and Technology
2015
|
Journal article
EID:
2-s2.0-84981215161
Contributors:
Naulleau, P.;
Anderson, C.;
Chao, W.;
Goldberg, K.;
Wojdyla, A.;
Bhattarai, S.;
Neureuther, A.;
Goodwin, F.;
Neisser, M.
Source:
Antoine Islegen-Wojdyla
via
Scopus - Elsevier
Proceedings of SPIE - The International Society for Optical Engineering
2015
|
Conference paper
EID:
2-s2.0-84931458007
Contributors:
Wang, Y.-G.;
Miyakawa, R.;
Chao, W.;
Benk, M.;
Wojdyla, A.;
Donoghue, A.;
Johnson, D.;
Goldberg, K.;
Neureuther, A.;
Liang, T.
et al.
Source:
Antoine Islegen-Wojdyla
via
Scopus - Elsevier
Proceedings of SPIE - The International Society for Optical Engineering
2015
|
Conference paper
EID:
2-s2.0-84957927598
Contributors:
Goldberg, K.;
Benk, M.P.;
Wojdyla, A.;
Verduijn, E.;
Wood, O.R.;
Mangat, P.
Source:
Antoine Islegen-Wojdyla
via
Scopus - Elsevier
Proceedings of SPIE - The International Society for Optical Engineering
2015
|
Conference paper
EID:
2-s2.0-84957868275
Contributors:
Claus, R.A.;
Wang, Y.-G.;
Wojdyla, A.;
Benk, M.P.;
Goldberg, K.A.;
Neureuther, A.R.;
Naulleau, P.P.
Source:
Antoine Islegen-Wojdyla
via
Scopus - Elsevier
Proceedings of SPIE - The International Society for Optical Engineering
2015
|
Conference paper
EID:
2-s2.0-84939242048
Contributors:
Mangat, P.;
Verduijn, E.;
Wood, O.R.;
Benk, M.P.;
Wojdyla, A.;
Goldberg, K.A.
Source:
Antoine Islegen-Wojdyla
via
Scopus - Elsevier
Proceedings of SPIE - The International Society for Optical Engineering
2015
|
Conference paper
EID:
2-s2.0-84931478096
Contributors:
Goldberg, K.A.;
Benk, M.P.;
Wojdyla, A.;
Johnson, D.G.;
Donoghue, A.P.
Source:
Antoine Islegen-Wojdyla
via
Scopus - Elsevier
Proceedings of SPIE - The International Society for Optical Engineering
2015
|
Conference paper
EID:
2-s2.0-84931406329
Contributors:
Claus, R.A.;
Wang, Y.-G.;
Wojdyla, A.;
Benk, M.P.;
Goldberg, K.A.;
Neureuther, A.R.;
Naulleau, P.P.;
Waller, L.
Source:
Antoine Islegen-Wojdyla
via
Scopus - Elsevier
Proceedings of SPIE - The International Society for Optical Engineering
2014
|
Conference paper
EID:
2-s2.0-84923012147
Contributors:
Benk, M.P.;
Miyakawa, R.H.;
Chao, W.;
Wang, Y.-G.;
Wojdyla, A.;
Johnson, D.G.;
Donoghue, A.P.;
Goldberg, K.A.
Source:
Antoine Islegen-Wojdyla
via
Scopus - Elsevier
Proceedings of SPIE - The International Society for Optical Engineering
2014
|
Conference paper
EID:
2-s2.0-84902131585
Contributors:
Goldberg, K.A.;
Benk, M.P.;
Wojdyla, A.;
Mochi, I.;
Rekawa, S.B.;
Allezy, A.P.;
Dickinson, M.R.;
Cork, C.W.;
Chao, W.;
Zehm, D.J.
et al.
Source:
Antoine Islegen-Wojdyla
via
Scopus - Elsevier
Optics Express
2014
|
Journal article
EID:
2-s2.0-84906088498
Contributors:
Miyakawa, R.;
Mayer, R.;
Wojdyla, A.;
Vannier, N.;
Lesser, I.;
Aron-Dine, S.;
Naulleau, P.
Source:
Antoine Islegen-Wojdyla
via
Scopus - Elsevier
Proceedings of SPIE - The International Society for Optical Engineering
2014
|
Conference paper
EID:
2-s2.0-84902140269
Contributors:
Wojdyla, A.;
Miyakawa, R.;
Naulleau, P.
Source:
Antoine Islegen-Wojdyla
via
Scopus - Elsevier
Proceedings of SPIE - The International Society for Optical Engineering
2008
|
Conference paper
EID:
2-s2.0-45149085234
Contributors:
Tuominen, J.;
Hiltunen, J.;
Wojdyla, A.;
Karppinen, M.;
Suutala, A.;
Jantunen, H.;
Bouffaron, R.;
Escoubas, L.
Source:
Antoine Islegen-Wojdyla
via
Scopus - Elsevier