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Scopus Author ID: 57202608169

Countries

France

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Employment (2)

ESRF: Grenoble, FR

2024-06 to present | Software Engineer (Data Automation Unit)
Employment
Source: Self-asserted source
Pierre-Olivier Autran

ESRF: Grenoble, FR

2021-06 to 2024-06 | Postdoctoral Researcher (Structure of Materials)
Employment
Source: Self-asserted source
Pierre-Olivier Autran

Works (10)

EWOKS: An Extensible WOrKflow System

Synchrotron Radiation News
2024-11 | Journal article
DOI: 10.1080/08940886.2024.2432305
Contributors: Wout De Nolf; Loïc Huder; Olof Svensson; Henri Payno; Pierre-Olivier Autran; Ludovic Broche; Giannis Koumoutsos; Andrew Götz
Source: check_circle
Crossref

A compact-rigid multi-analyser for energy and angle filtering of high-resolution X-ray experiments. Part 2. Efficiency of a single-crystal-comb

Journal of Synchrotron Radiation
2023 | Journal article
DOI: 10.1107/S1600577522011250
EID:

2-s2.0-85145509924

Part of ISSN: 16005775 09090495
Contributors: Hodeau, J.-L.; Prat, A.; Boudet, N.; Blanc, N.; Arnaud, S.; Hazemann, J.-L.; Lahéra, E.; Proux, O.; Jacquet, M.; Autran, P.-O. et al.
Source: Self-asserted source
Pierre-Olivier Autran via Scopus - Elsevier
grade
Preferred source (of 2)‎

Illustrating papyrus in Ancient Egypt

Scientific Reports
2023 | Journal article
DOI: 10.1038/s41598-023-27761-7
EID:

2-s2.0-85146106418

Part of ISSN: 20452322
Contributors: Autran, P.-O.; Dejoie, C.; Dugand, C.; Gervason, M.; Bordet, P.; Hodeau, J.-L.; Anne, M.; Martinetto, P.
Source: Self-asserted source
Pierre-Olivier Autran via Scopus - Elsevier

On mesoscale modeling of concrete: Role of heterogeneities on local stresses, strains, and representative volume element

Cement and Concrete Research
2023 | Journal article
DOI: 10.1016/j.cemconres.2022.107031
EID:

2-s2.0-85142306548

Part of ISSN: 00088846
Contributors: Thakur, M.M.; Henningsson, N.A.; Engqvist, J.; Autran, P.-O.; Wright, J.P.; Hurley, R.C.
Source: Self-asserted source
Pierre-Olivier Autran via Scopus - Elsevier
grade
Preferred source (of 2)‎

Revealing the Elusive Structure and Reactivity of Iron Boride α-FeB

Inorganic Chemistry
2022 | Journal article
DOI: 10.1021/acs.inorgchem.2c03709
EID:

2-s2.0-85147173451

Part of ISSN: 1520510X 00201669
Contributors: Igoa Saldaña, F.; Defoy, E.; Janisch, D.; Rousse, G.; Autran, P.-O.; Ghoridi, A.; Séné, A.; Baron, M.; Suescun, L.; Le Godec, Y. et al.
Source: Self-asserted source
Pierre-Olivier Autran via Scopus - Elsevier

Revealing the Nature of Black Pigments Used on Ancient Egyptian Papyri from Champollion Collection

Analytical Chemistry
2021 | Journal article
DOI: 10.1021/acs.analchem.0c04178
EID:

2-s2.0-85098990240

Part of ISSN: 15206882 00032700
Contributors: Autran, P.-O.; Dejoie, C.; Bordet, P.; Hodeau, J.-L.; Dugand, C.; Gervason, M.; Anne, M.; Martinetto, P.
Source: Self-asserted source
Pierre-Olivier Autran via Scopus - Elsevier
grade
Preferred source (of 2)‎

Cultural and Natural Heritage at the ESRF: Looking Back and to the Future

Synchrotron Radiation News
2019 | Journal article
DOI: 10.1080/08940886.2019.1680213
EID:

2-s2.0-85075508723

Part of ISSN: 19317344 08940886
Contributors: Cotte, M.; Autran, P.-O.; Berruyer, C.; Dejoie, C.; Susini, J.; Tafforeau, P.
Source: Self-asserted source
Pierre-Olivier Autran via Scopus - Elsevier

Combining a nine-crystal multi-analyser stage with a two-dimensional detector for high-resolution powder X-ray diffraction

Journal of Applied Crystallography
2018 | Journal article
DOI: 10.1107/S1600576718014589
EID:

2-s2.0-85053142952

Part of ISSN: 16005767 00218898
Contributors: Dejoie, C.; Coduri, M.; Petitdemange, S.; Giacobbe, C.; Covacci, E.; Grimaldi, O.; Autran, P.-O.; Mogodi, M.W.; Jung, D.Š.; Fitch, A.N.
Source: Self-asserted source
Pierre-Olivier Autran via Scopus - Elsevier

X-ray diffraction and heterogeneous materials: An adaptive crystallography approach,Diffraction des rayons X et matériaux hétérogènes: une approche cristallographique adaptative

Comptes Rendus Physique
2018 | Journal article
DOI: 10.1016/j.crhy.2018.09.001
EID:

2-s2.0-85053103997

Part of ISSN: 16310705
Contributors: Dejoie, C.; Autran, P.-O.; Bordet, P.; Fitch, A.N.; Martinetto, P.; Sciau, P.; Tamura, N.; Wright, J.
Source: Self-asserted source
Pierre-Olivier Autran via Scopus - Elsevier

Making synchrotron tomography a routine tool for 3D integration failure analysis through a limited number of projections, an adapted sample preparation scheme, and a fully-automated post-processing

Conference Proceedings from the International Symposium for Testing and Failure Analysis
2017 | Conference paper
EID:

2-s2.0-85048887489

Part of ISBN: 9781627081504
Contributors: Fraczklewicz, A.; Moreau, S.; Mourier, T.; Bleuet, P.; Autran, P.-O.; Capria, E.; Cloetens, P.; Da Silva, J.; Lhostis, S.; Lorut, F.
Source: Self-asserted source
Pierre-Olivier Autran via Scopus - Elsevier
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