Personal information
AFM, STM, DFT, Molecular Electronics
Czech Republic
Activities
Employment (1)
(Theory of condensed matter)
Employment
Source:
Prokop Hapala
Education and qualifications (4)
2018-06-02
to
2019-07-15
|
post-doc
(Applied physics)
Qualification
Source:
Prokop Hapala
2009-09-30
to
2016-09-12
|
PhD
(Physics of Condensed Matter and Materials Research)
Education
Source:
Prokop Hapala
2007-09-30
to
2009-09-30
|
Ing
(Faculty of Chemical Engineering; Molecular Engineering)
Education
Source:
Prokop Hapala
2004-09-30
to
2007-09-30
|
Bc
(Lasers and Optoelectronics)
Education
Source:
Prokop Hapala
Works (42)
ACS Nano
2025-01-21
|
Journal article
Contributors:
Pavel Galář;
Jakub Kopenec;
Robert Král;
Filip Matějka;
Petra Zemenová;
Milan Dopita;
Prokop Hapala;
Dirk König;
Pavel Vrbka;
Kateřina Kůsová
Source:
check_circle
Crossref
Machine Learning: Science and Technology
2024-06-01
|
Journal article
Contributors:
Jaime Carracedo-Cosme;
Prokop Hapala;
Rubén Pérez
Source:
check_circle
Crossref
ACS Nano
2024-04-09
|
Journal article
Contributors:
Mithun Manikandan;
Paolo Nicolini;
Prokop Hapala
Source:
check_circle
Crossref
ACS Nano
2022-09-27
|
Journal article
Contributors:
Niko Oinonen;
Chen Xu;
Benjamin Alldritt;
Prokop Hapala;
Filippo Federici Canova;
Fedor Urtev;
Shuning Cai;
Ondřej Krejčí;
Juho Kannala;
Peter Liljeroth
et al.
Source:
check_circle
Crossref
ACS Nano
2022-01-25
|
Journal article
Contributors:
Jiří Doležal;
Sofia Canola;
Prokop Hapala;
Rodrigo Cezar de Campos Ferreira;
Pablo Merino;
Martin Švec
Source:
check_circle
Crossref
Scientific Reports
2020-08-24
|
Journal article
Contributors:
Alexander Liebig;
Prokop Hapala;
Alfred J. Weymouth;
Franz J. Giessibl
Source:
check_circle
Crossref
Chemistry of Materials
2020-08-11
|
Journal article
Contributors:
Kateřina Dohnalová;
Prokop Hapala;
Kateřina Kůsová;
Ivan Infante
Source:
check_circle
Crossref
Science Advances
2020-02-28
|
Journal article
Contributors:
Benjamin Alldritt;
Prokop Hapala;
Niko Oinonen;
Fedor Urtev;
Ondrej Krejci;
Filippo Federici Canova;
Juho Kannala;
Fabian Schulz;
Peter Liljeroth;
Adam S. Foster
Source:
check_circle
Crossref
Springer Series in Surface Sciences
2018
|
Book
EID:
2-s2.0-85043786762
Contributors:
Ondráček, M.;
Hapala, P.;
Švec, M.;
Jelínek, P.
Source:
Prokop Hapala
via
Scopus - Elsevier
Nature Communications
2018
|
Journal article
EID:
2-s2.0-85051462108
Contributors:
Krull, C.;
Castelli, M.;
Hapala, P.;
Kumar, D.;
Tadich, A.;
Capsoni, M.;
Edmonds, M.T.;
Hellerstedt, J.;
Burke, S.A.;
Jelinek, P.
et al.
Source:
Prokop Hapala
via
Scopus - Elsevier
Nature Communications
2018
|
Journal article
EID:
2-s2.0-85050598879
Contributors:
de la Torre, B.;
Švec, M.;
Hapala, P.;
Redondo, J.;
Krejčí, O.;
Lo, R.;
Manna, D.;
Sarmah, A.;
Nachtigallová, D.;
Tuček, J.
et al.
Source:
Prokop Hapala
via
Scopus - Elsevier
Nature
2018
|
Journal article
EID:
2-s2.0-85055827016
Contributors:
Peng, J.;
Cao, D.;
He, Z.;
Guo, J.;
Hapala, P.;
Ma, R.;
Cheng, B.;
Chen, J.;
Xie, W.J.;
Li, X.-Z.
et al.
Source:
Prokop Hapala
via
Scopus - Elsevier
Nature Communications
2018-12
|
Journal article
Source:
Prokop Hapala
grade
Preferred source
(of
2)
Nature
2018-05
|
Journal article
Source:
Prokop Hapala
grade
Preferred source
(of
2)
ACS Nano
2017
|
Journal article
EID:
2-s2.0-85028470393
Contributors:
Meier, T.;
Pawlak, R.;
Kawai, S.;
Geng, Y.;
Liu, X.;
Decurtins, S.;
Hapala, P.;
Baratoff, A.;
Liu, S.-X.;
Jelínek, P.
et al.
Source:
Prokop Hapala
via
Scopus - Elsevier
Physical Review B
2017
|
Journal article
EID:
2-s2.0-85010809746
Contributors:
Krejčí, O.;
Hapala, P.;
Ondráček, M.;
Jelínek, P.
Source:
Prokop Hapala
via
Scopus - Elsevier
Physical Review Letters
2017
|
Journal article
EID:
2-s2.0-85031912552
Contributors:
De La Torre, B.;
Švec, M.;
Foti, G.;
Krejčí, O.;
Hapala, P.;
Garcia-Lekue, A.;
Frederiksen, T.;
Zbořil, R.;
Arnau, A.;
Vázquez, H.
et al.
Source:
Prokop Hapala
via
Scopus - Elsevier
Silicon Nanophotonics: Basic Principles, Present Status, and Perspectives: Second Edition
2016
|
Book
EID:
2-s2.0-85009289934
Contributors:
Kůsová, K.;
Hapala, P.;
Jelínek, P.;
Pelant, I.
Source:
Prokop Hapala
via
Scopus - Elsevier
ACS Nano
2016
|
Journal article
EID:
2-s2.0-84989170244
Contributors:
Van Der Heijden, N.J.;
Hapala, P.;
Rombouts, J.A.;
Van Der Lit, J.;
Smith, D.;
Mutombo, P.;
Švec, M.;
Jelinek, P.;
Swart, I.
Source:
Prokop Hapala
via
Scopus - Elsevier
Nanotechnology
2016
|
Journal article
EID:
2-s2.0-84975037766
Contributors:
Ondráček, M.;
Hapala, P.;
Jelínek, P.
Source:
Prokop Hapala
via
Scopus - Elsevier
Physical Review Letters
2016
|
Journal article
EID:
2-s2.0-84962730610
Contributors:
Sforzini, J.;
Hapala, P.;
Franke, M.;
Van Straaten, G.;
Stöhr, A.;
Link, S.;
Soubatch, S.;
Jelínek, P.;
Lee, T.-L.;
Starke, U.
et al.
Source:
Prokop Hapala
via
Scopus - Elsevier
Journal of Physical Chemistry C
2016
|
Journal article
EID:
2-s2.0-84989858108
Contributors:
Berger, J.;
Kośmider, K.;
Stetsovych, O.;
Vondráček, M.;
Hapala, P.;
Spadafora, E.J.;
Švec, M.;
Jelínek, P.
Source:
Prokop Hapala
via
Scopus - Elsevier
Physical Review Letters
2016
|
Journal article
EID:
2-s2.0-84960540887
Contributors:
Van Der Lit, J.;
Di Cicco, F.;
Hapala, P.;
Jelinek, P.;
Swart, I.
Source:
Prokop Hapala
via
Scopus - Elsevier
Organic Electronics
2016
|
Journal article
EID:
2-s2.0-84964878019
Contributors:
Kamiński, W.;
Topolnicki, R.;
Hapala, P.;
Jelínek, P.;
Kucharczyk, R.
Source:
Prokop Hapala
via
Scopus - Elsevier
Source:
Prokop Hapala
grade
Preferred source
(of
2)
Physical Review Letters
2015
|
Journal article
EID:
2-s2.0-84943176311
Contributors:
Corso, M.;
Ondráček, M.;
Lotze, C.;
Hapala, P.;
Franke, K.J.;
Jelínek, P.;
Pascual, J.I.
Source:
Prokop Hapala
via
Scopus - Elsevier
Nature Communications
2015
|
Journal article
EID:
2-s2.0-84937395371
Contributors:
Iwata, K.;
Yamazaki, S.;
Mutombo, P.;
Hapala, P.;
Ondráček, M.;
Jelínek, P.;
Sugimoto, Y.
Source:
Prokop Hapala
via
Scopus - Elsevier
ACS Nano
2015
|
Journal article
EID:
2-s2.0-84942288107
Contributors:
Telychko, M.;
Mutombo, P.;
Merino, P.;
Hapala, P.;
Ondráček, M.;
Bocquet, F.C.;
Sforzini, J.;
Stetsovych, O.;
Vondráček, M.;
Jelínek, P.
et al.
Source:
Prokop Hapala
via
Scopus - Elsevier
Physical Review Letters
2015
|
Journal article
EID:
2-s2.0-84939497277
Contributors:
Hapala, P.;
Temirov, R.;
Tautz, F.S.;
Jelínek, P.
Source:
Prokop Hapala
via
Scopus - Elsevier
Journal of Physics Condensed Matter
2015
|
Journal article
EID:
2-s2.0-84928253940
Contributors:
Zobač, V.;
Lewis, J.P.;
Abad, E.;
Mendieta-Moreno, J.I.;
Hapala, P.;
Jelínek, P.;
Ortega, J.
Source:
Prokop Hapala
via
Scopus - Elsevier
NanoScience and Technology
2015
|
Book
EID:
2-s2.0-84929995465
Contributors:
Hapala, P.;
Ondráček, M.;
Stetsovych, O.;
Švec, M.;
Jelínek, P.
Source:
Prokop Hapala
via
Scopus - Elsevier
ACS Nano
2014
|
Journal article
EID:
2-s2.0-84904765297
Contributors:
Telychko, M.;
Mutombo, P.;
Ondráček, M.;
Hapala, P.;
Bocquet, F.C.;
Kolorenč, J.;
Vondráček, M.;
Jelínek, P.;
Švec, M.
Source:
Prokop Hapala
via
Scopus - Elsevier
Advanced Materials Interfaces
2014
|
Journal article
EID:
2-s2.0-84925085893
Contributors:
Kůsová, K.;
Hapala, P.;
Valenta, J.;
Jelínek, P.;
Cibulka, O.;
Ondič, L.;
Pelant, I.
Source:
Prokop Hapala
via
Scopus - Elsevier
Physical Review B - Condensed Matter and Materials Physics
2014
|
Journal article
EID:
2-s2.0-84902149665
Contributors:
Švec, M.;
Hapala, P.;
OndráAek, M.;
Merino, P.;
Blanco-Rey, M.;
Mutombo, P.;
VondráAek, M.;
Polyak, Y.;
Cháb, V.;
Martín Gago, J.A.
et al.
Source:
Prokop Hapala
via
Scopus - Elsevier
Physical Review Letters
2014-11-25
|
Journal article
Source:
Prokop Hapala
grade
Preferred source
(of
2)
Physical Review B
2014-08-19
|
Journal article
Source:
Prokop Hapala
grade
Preferred source
(of
2)
Journal of Chemical Physics
2013
|
Journal article
EID:
2-s2.0-84887385855
Contributors:
Abad, E.;
Lewis, J.P.;
Zobač, V.;
Hapala, P.;
Jelínek, P.;
Ortega, J.
Source:
Prokop Hapala
via
Scopus - Elsevier
Journal of Physics Condensed Matter
2013
|
Journal article
EID:
2-s2.0-84878070997
Contributors:
Majzik, Z.;
Rachid Tchalala, M.;
Švec, M.;
Hapala, P.;
Enriquez, H.;
Kara, A.;
Mayne, A.J.;
Dujardin, G.;
Jelínek, P.;
Oughaddou, H.
Source:
Prokop Hapala
via
Scopus - Elsevier
Physical Review B
2013-05-10
|
Journal article
Source:
Prokop Hapala
grade
Preferred source
(of
2)
Physical Review Letters
2011
|
Journal article
EID:
2-s2.0-78650977195
Contributors:
Ternes, M.;
González, C.;
Lutz, C.P.;
Hapala, P.;
Giessibl, F.J.;
Jelínek, P.;
Heinrich, A.J.
Source:
Prokop Hapala
via
Scopus - Elsevier
Journal of Catalysis
2011
|
Journal article
EID:
2-s2.0-79958146732
Contributors:
Wang, L.;
Wang, H.;
Hapala, P.;
Zhu, L.;
Ren, L.;
Meng, X.;
Lewis, J.P.;
Xiao, F.-S.
Source:
Prokop Hapala
via
Scopus - Elsevier
Nanotechnology
2010
|
Journal article
EID:
2-s2.0-77953490385
Contributors:
Lindsay, S.;
He, J.;
Sankey, O.;
Hapala, P.;
Jelinek, P.;
Zhang, P.;
Chang, S.;
Huang, S.
Source:
Prokop Hapala
via
Scopus - Elsevier