Personal information

No personal information available

Activities

Collapse all

Works (2)

An Incremental Knowledge Learning Framework for Continuous Defect Detection

IEEE Transactions on Instrumentation and Measurement
2024 | Journal article
DOI: 10.1109/TIM.2023.3343768
Contributors: Chen Sun; Liang Gao; Xinyu Li; Pai Zheng; Yiping Gao
Source: check_circle
Crossref

BiaS: Incorporating Biased Knowledge to Boost Unsupervised Image Anomaly Localization

IEEE Transactions on Systems, Man, and Cybernetics: Systems
2024 | Journal article
DOI: 10.1109/TSMC.2023.3344383
Contributors: Yunkang Cao; Xiaohao Xu; Chen Sun; Liang Gao; Weiming Shen
Source: check_circle
Crossref

Peer review (4 reviews for 1 publication/grant)

Review activity for IEEE transactions on industrial informatics. (4)
How many people are using ORCID?