Personal information

PVD, SPS, SEM, coating, powder metallurgy, material durability, thermochemical treatments
France

Biography

Since 2022, I am working on new ways to develop alloys by powder metallurgy from PVD and SPS. In 2019, I studied the nickel-based alloys durability in an oxidizing environment. I studied the high-temperature oxidation behavior of Inconel 625 developed by LBM. From 2011 to 2014, my Ph.D. focused on (Ti, Al)N coatings deposited from reactive magnetron sputtering. I acquired skills in Synchrotron XANES and DANES techniques.

Activities

Works (5)

Effect of Pre-Oxidation on a Ti PVD Coated Ferritic Steel Substrate during High-Temperature Aging

Crystals
2022-12-01 | Journal article
Part of ISSN: 2073-4352
Contributors: Maria-Rosa Ardigo-Besnard; Aurélien Besnard; Galy Nkou Bouala; BOULET P.; Yoann Pinot; Quentin Ostorero
Source: Self-asserted source
yoann PINOT

Influence of film thickness on the structural transition cubic/hexagonal within Ti0.38Al0.62N films

Thin Solid Films
2018-03 | Journal article
Part of ISSN: 0040-6090
Contributors: Y. Pinot; Marie-Helene TUILIER; M.-J. Pac; C. Rousselot; D. Thiaudière; C. Ulhaq-Bouillet
Source: Self-asserted source
yoann PINOT

Investigation of Ti 0.54 Al 0.46 /Ti 0.54 Al 0.46 N multilayer films deposited by reactive gas pulsing process by nano-indentation and electron energy-loss spectroscopy

Thin Solid Films
2017-07 | Journal article
Part of ISSN: 0040-6090
Contributors: M.-J. Pac; Y. Pinot; S. Giljean; C. Rousselot; P. Delobelle; C. Ulhaq-Bouillet; M.-H. Tuilier
Source: Self-asserted source
yoann PINOT

The competitive growth of cubic domains in Ti<sub>1–<i>x</i></sub>Al<sub><i>x</i></sub>N films studied by diffraction anomalous near-edge structure spectroscopy

Journal of Synchrotron Radiation
2015-11-01 | Journal article
Part of ISSN: 1600-5775
Contributors: Y. Pinot; M.-H. Tuilier; M.-J. Pac; C. Rousselot; D. Thiaudière
Source: Self-asserted source
yoann PINOT

Friction behaviour of TiAlN films around cubic/hexagonal transition: A 2D grazing incidence X-ray diffraction and electron energy loss spectroscopy study

Thin Solid Films
2015-02 | Journal article
Part of ISSN: 0040-6090
Contributors: Y. Pinot; M.-J. Pac; P. Henry; C. Rousselot; Ya.I. Odarchenko; D.A. Ivanov; C. Ulhaq-Bouillet; O. Ersen; M.-H. Tuilier
Source: Self-asserted source
yoann PINOT